公开(公告)号：US08298652B2

公开(公告)日：2012-10-30

申请号：US12327126

申请日：2008-12-03

Applicant: Hideyuki Aoki

Inventor： Hideyuki Aoki

IPC: B32B1/00 ,  B32B3/00 ,  B32B3/10

CPC classification number: B29C45/73 ,  B29C2045/7393 ,  B29L2031/3475 ,  Y10T428/24273 ,  Y10T428/24628 ,  Y10T428/24736 ,  Y10T428/24802

Abstract: An injection molding die for producing a molded product having an appearance surface, an injection molding method for producing a molded product having an appearance surface, and a resin molded product molded by the injection molding method which is free from occurrence of appearance deficiency such as a flow mark or the like that is a drawback in appearance. A molten thermoplastic resin material is injected into a cavity defined by a molded product's appearance surface forming portion (4a) and a molded product's rear surface forming portion (6a) through one or more direct gates and one or more hot runners to fill the cavity with the molten resin material, thereby performing injection molding.

Abstract translation: 一种用于制造具有外观表面的模制产品的注射模具，用于制造具有外观表面的模制产品的注射成型方法，以及通过注射成型方法模制的树脂模制品，该模制产品不会发生外观不足，例如 流痕等是外观上的缺点。 将熔融的热塑性树脂材料通过一个或多个直接浇口和一个或多个热流道注入到由模制产品的外观表面形成部分（4a）和模制产品的后表面形成部分（6a）限定的空腔中，以用 熔融树脂材料，从而进行注射成型。

公开(公告)号：US07341133B2

公开(公告)日：2008-03-11

申请号：US11200232

申请日：2005-08-10

Applicant: Masahiko Ando ,  Hideyuki Aoki ,  Hiroyuki Tsukamoto ,  Akira Fukatsu ,  Atsushi Mori ,  Akira Matsuo ,  Hideaki Furuta

Inventor： Masahiko Ando ,  Hideyuki Aoki ,  Hiroyuki Tsukamoto ,  Akira Fukatsu ,  Atsushi Mori ,  Akira Matsuo ,  Hideaki Furuta

IPC: F16H61/14

CPC classification number: F16H61/143

Abstract: A hydraulic power transmission is provided with a frictional engagement element as a lock-up clutch between a hydraulic power transmission chamber, housing a pump impeller and a turbine runner, and a servo oil chamber of the lock-up clutch. A lock-up oil passage that supplies lock-up hydraulic pressure to the servo oil chamber is connected to a hydraulic pressure supply circuit that is used in common with a circulation oil passage that supplies hydraulic pressure for circulation to the hydraulic power transmission chamber. An orifice is disposed in the circulation oil passage. It is thus possible to perform lock-up with different supply pressures. A common oil supply for the lock-up oil passage and the circulation oil passage is provided, for example, by disposing a converting circuit that adapts an oil passage connection to hydraulic transmissions with different types of lock-up clutches.

Abstract translation: 液压动力传动装置设置有作为锁定离合器的摩擦接合元件，在液压动力传递室，容纳泵叶轮和涡轮转轮之间以及锁止离合器的伺服油室之间。 向伺服油室供给锁定液压的锁止油路连接到与向液压动力传递室供给循环用的液压的循环油路共同使用的液压供给回路。 在循环油通道中设置孔口。 因此可以在不同的供应压力下执行锁定。 提供了用于锁止油路和循环油通道的常见供油装置，例如通过设置一个转换回路，该转换回路使用不同类型的锁止离合器将油路连接件适配到液压变速器。

公开(公告)号：US06222406B1

公开(公告)日：2001-04-24

申请号：US09109181

申请日：1998-07-02

Applicant: Hiromasa Noda ,  Masakazu Aoki ,  Hitoshi Tanaka ,  Hideyuki Aoki

Inventor： Hiromasa Noda ,  Masakazu Aoki ,  Hitoshi Tanaka ,  Hideyuki Aoki

IPC: H03K513

CPC classification number: G11C7/1084 ,  G11C7/1078 ,  G11C7/22 ,  G11C7/222 ,  H03K5/133 ,  H03K5/135 ,  H03K5/1504

Abstract: A lattice-like delay circuit is configured wherein a plurality of logic gate circuits which are respectively provided with impedance elements for respectively coupling two input signals inputted to first and second input terminals and respectively form output signals obtained by inverting the input signals inputted to the first and second signals, are used so as to be disposed in lattice form in a first signal transfer direction and a second signal transfer direction. In the lattice-like delay circuit, input clock signals are successively delayed in the first signal transfer direction and thereafter inputted to the respective logic gate circuits extending from the first to the last as seen in the first signal transfer direction. Output signals are obtained from output terminals of a plurality of logic gate circuits placed in at least a plural-numbered stage as seen in the second signal transfer direction and arranged in the first signal transfer direction.

Abstract translation: 格子状延迟电路被配置为其中分别设置有用于分别耦合输入到第一和第二输入端子的两个输入信号的阻抗元件的多个逻辑门电路，并且分别形成通过将输入到第一和第二输入端的输入信号反相而获得的输出信号 和第二信号被使用以在第一信号传送方向和第二信号传送方向上以格子形式布置。 在格子状延迟电路中，输入时钟信号在第一信号传送方向上连续延迟，然后输入到从第一信号传送方向观察的从第一到最后延伸的各个逻辑门电路。 输出信号从放置在至少多个级的多个逻辑门电路的输出端获得，如在第二信号传送方向上看到的，并且以第一信号传送方向布置。

公开(公告)号：US06826720B2

公开(公告)日：2004-11-30

申请号：US09994638

申请日：2001-11-28

Applicant: Iwao Suzuki ,  Shuji Kikuchi ,  Fumie Kobayashi ,  Hideyuki Aoki

Inventor： Iwao Suzuki ,  Shuji Kikuchi ,  Fumie Kobayashi ,  Hideyuki Aoki

IPC: G11C2900

CPC classification number: G11C29/56 ,  G11C29/10

Abstract: A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.

Abstract translation: 使用ALPG的测试电路安装在测试板中，其中安装半导体存储器的插座作为板中要测试的器件，并且在测试电路中提供用于存储用于产生随机模式的数据表的易失性存储器，使得 除了使用由ALPG生成的规则性的测试图案的测试之外，还使用数据表来执行使用不规则的测试图案的测试。

公开(公告)号：US06507204B1

公开(公告)日：2003-01-14

申请号：US09522477

申请日：2000-03-09

Applicant: Masatoshi Kanamaru ,  Yoshishige Endo ,  Atsushi Hosogane ,  Tatsuya Nagata ,  Ryuji Kohno ,  Hideyuki Aoki ,  Akihiko Ariga

Inventor： Masatoshi Kanamaru ,  Yoshishige Endo ,  Atsushi Hosogane ,  Tatsuya Nagata ,  Ryuji Kohno ,  Hideyuki Aoki ,  Akihiko Ariga

IPC: G01R3102

CPC classification number: G01R1/06733 ,  G01R1/06727 ,  G01R1/06738 ,  G01R1/06761 ,  G01R1/06772 ,  G01R1/07342 ,  G01R3/00

Abstract: The conventional semiconductor element testing equipment is arranged to position each probe accurately and need a burdensome operation for fixing, and includes only a limited number of electrode pads and chips to be tested at a batch. An equipment for testing a semiconductor element is arranged to keep each of electrode pads formed on a semiconductor element to be tested in direct contact with each of probes formed on a first substrate composed of silicon, one of electric connecting substrates disposed in the equipment. On the first substrate, each probe is formed on a cantilever and a wire is routed from a tip of each probe along a tip of the cantilever to the electrode pad formed on an opposite surface to the probe forming surface through an insulating layer.

Abstract translation: 常规的半导体元件测试设备被布置成准确地定位每个探针，并且需要用于固定的繁重的操作，并且仅包括有限数量的待批测试的电极焊盘和芯片。 布置了用于测试半导体元件的设备，以使每个形成在要测试的半导体元件上的电极焊盘与形成在由设置在设备中的电连接基板之一的硅构成的第一基板上形成的每个探针直接接触。 在第一基板上，每个探针形成在悬臂上，并且从每个探针的尖端沿着悬臂的尖端布线到通过绝缘层与探针形成表面相对的表面上形成的电极焊盘。

公开(公告)号：US5232418A

公开(公告)日：1993-08-03

申请号：US808849

申请日：1991-12-17

Applicant: Hideyuki Aoki ,  Kozo Kato ,  Yoichi Hayakawa

Inventor： Hideyuki Aoki ,  Kozo Kato ,  Yoichi Hayakawa

IPC: F16D25/063 ,  F16D25/0638 ,  F16D25/10 ,  F16H37/04 ,  F16H57/08 ,  F16H63/30

CPC classification number: F16D25/0638 ,  F16D21/06 ,  F16H57/08 ,  F16H63/3026 ,  F16H2200/0043 ,  F16H2200/2007 ,  F16H2200/2023 ,  F16H2200/2056 ,  F16H37/042

Abstract: A double-acting hydraulic actuator structure for use in an automatic transmission has a two-layered structure which includes first and second frictional engagement element hydraulic actuators. The first hydraulic actuator includes a drum member and a first piston fitted hermetically and slidably in the drum member. The second hydraulic actuator is formed by the interior of the first piston and a second piston fitted hermetically and slidably mounted within the first piston. The first and second pistons are both urged toward their disengaged positions by the action of a common return spring. A second spring is provided for urging the second piston alone against the force of the return spring.

Abstract translation: 用于自动变速器的双作用液压致动器结构具有包括第一和第二摩擦接合元件液压致动器的两层结构。 第一液压致动器包括鼓构件和气密地可滑动地安装在鼓构件中的第一活塞。 第二液压致动器由第一活塞的内部和安装在第一活塞内的气密和可滑动地安装的第二活塞形成。 第一和第二活塞通过共同的复位弹簧的作用被推向其脱离位置。 提供第二弹簧，用于仅抵抗复位弹簧的力推动第二活塞。

公开(公告)号：US20060032720A1

公开(公告)日：2006-02-16

申请号：US11200232

申请日：2005-08-10

Applicant: Masahiko Ando ,  Hideyuki Aoki ,  Hiroyuki Tsukamoto ,  Akira Fukatsu ,  Atsushi Mori ,  Akira Matsuo ,  Hideaki Furuta

Inventor： Masahiko Ando ,  Hideyuki Aoki ,  Hiroyuki Tsukamoto ,  Akira Fukatsu ,  Atsushi Mori ,  Akira Matsuo ,  Hideaki Furuta

IPC: F16H61/14

CPC classification number: F16H61/143

Abstract: A hydraulic power transmission is provided with a frictional engagement element as a lock-up clutch between a hydraulic power transmission chamber, housing a pump impeller and a turbine runner, and a servo oil chamber of the lock-up clutch. A lock-up oil passage that supplies lock-up hydraulic pressure to the servo oil chamber is connected to a hydraulic pressure supply circuit that is used in common with a circulation oil passage that supplies hydraulic pressure for circulation to the hydraulic power transmission chamber. An orifice is disposed in the circulation oil passage. It is thus possible to perform lock-up with different supply pressures. A common oil supply for the lock-up oil passage and the circulation oil passage is provided, for example, by disposing a converting circuit that adapts an oil passage connection to hydraulic transmissions with different types of lock-up clutches.

Abstract translation: 液压动力传动装置设置有作为锁定离合器的摩擦接合元件，在液压动力传递室，容纳泵叶轮和涡轮转轮之间以及锁止离合器的伺服油室之间。 向伺服油室供给锁定液压的锁止油路连接到与向液压动力传递室供给循环用的液压的循环油路共同使用的液压供给回路。 在循环油通道中设置孔口。 因此可以在不同的供应压力下执行锁定。 提供了用于锁止油路和循环油通道的常见供油装置，例如通过设置一个转换回路，该转换回路使用不同类型的锁止离合器将油路连接件适配到液压变速器。

公开(公告)号：US06774654B2

公开(公告)日：2004-08-10

申请号：US10316828

申请日：2002-12-12

Applicant: Masatoshi Kanamaru ,  Yoshishige Endo ,  Takanorr Aono ,  Ryuji Kohno ,  Toshio Miyatake ,  Hideyuki Aoki ,  Naoto Ban

Inventor： Masatoshi Kanamaru ,  Yoshishige Endo ,  Takanorr Aono ,  Ryuji Kohno ,  Toshio Miyatake ,  Hideyuki Aoki ,  Naoto Ban

IPC: G01R3102

CPC classification number: G01R1/07357 ,  Y10S977/874

Abstract: A semiconductor inspecting apparatus having a plurality of electrical connection boards arranged in the inspecting apparatus and a plurality of probes respectively provided on a plurality of beams formed on a first board of said plurality of electrical connection boards, the probes being adapted to be individually brought into contact with a plurality of electrode pads of a semiconductor device for inspection, so as to inspect the semiconductor device while establishing electrical connection therebetween. A one-end supported beam is used as each of the beams, and each of the probes is formed at a portion shifted in a rectangular direction to a center line of a longitudinal direction of the one-end supported beam.

Abstract translation: 一种具有布置在检查装置中的多个电连接板和分别设置在形成在所述多个电连接板的第一板上的多个梁上的多个探针的半导体检查装置，所述探针适于单独地进入 与用于检查的半导体器件的多个电极焊盘接触，以便在其间建立电连接的同时检查半导体器件。 使用一端支撑梁作为每个梁，并且每个探针形成在沿着矩形方向偏移到一端支撑梁的纵向方向的中心线的部分。

公开(公告)号：US06714030B2

公开(公告)日：2004-03-30

申请号：US10390412

申请日：2003-03-18

Applicant: Ryuji Kohno ,  Hideo Miura ,  Yoshishige Endo ,  Masatoshi Kanamaru ,  Atsushi Hosogane ,  Hideyuki Aoki ,  Naoto Ban

Inventor： Ryuji Kohno ,  Hideo Miura ,  Yoshishige Endo ,  Masatoshi Kanamaru ,  Atsushi Hosogane ,  Hideyuki Aoki ,  Naoto Ban

IPC: G01R3102

CPC classification number: H01L22/32 ,  G01R1/06711 ,  G01R1/06738 ,  G01R1/07314 ,  G01R3/00 ,  H01L23/13 ,  H01L2924/0002 ,  H01L2924/13091 ,  H01L2924/00

Abstract: A semiconductor inspection apparatus which is possible to inspect a plurality of semiconductor devices collectively at one time, which has conventionally been difficult because of precision or the like of probes. A method of manufacturing the semiconductor inspection apparatus comprises the steps of forming a cover film on a surface of the silicon substrate and forming a plurality of probes of a polygonal cone shape or a circular cone shape through etching after patterning by photolithography, after the cover film is removed, again forming a cover film on the surface of the silicon substrate and forming a beam or a diaphragm for each probe through etching after patterning by photolithography, after the cover film is removed, again forming a cover film on the surface of the silicon substrate and forming a through hole corresponding to the probe through etching after patterning by photolithography, and after the cover film is removed, forming an insulating film on the surface of the silicon substrate, forming a metal film on a surface of the insulating film, and forming a wiring lead through etching after patterning by photolithography.

Abstract translation: 可以一次共同地检查多个半导体器件的半导体检查装置，由于探针的精度等，以前难以进行。 一种制造半导体检查装置的方法包括以下步骤：在硅衬底的表面上形成覆盖膜，并通过光刻图案化之后通过蚀刻形成多个锥形或圆锥形的多个探针， 被去除，再次在硅衬底的表面上形成覆盖膜，并且通过光刻在图案化之后通过蚀刻形成用于每个探针的光束或隔膜，在除去覆盖膜之后，再次在硅表面上形成覆盖膜 在通过光刻图案化之后通过蚀刻形成与探针对应的通孔，并且在除去覆盖膜之后，在硅衬底的表面上形成绝缘膜，在绝缘膜的表面上形成金属膜，以及 通过光刻在图案化之后通过蚀刻形成布线引线。

公开(公告)号：US06573112B2

公开(公告)日：2003-06-03

申请号：US10238690

申请日：2002-09-11

Applicant: Ryuji Kono ,  Akihiko Ariga ,  Hideyuki Aoki ,  Hiroyuki Ohta ,  Yoshishige Endo ,  Masatoshi Kanamaru ,  Atsushi Hosogane ,  Shinji Tanaka ,  Naoto Ban ,  Hideo Miura

Inventor： Ryuji Kono ,  Akihiko Ariga ,  Hideyuki Aoki ,  Hiroyuki Ohta ,  Yoshishige Endo ,  Masatoshi Kanamaru ,  Atsushi Hosogane ,  Shinji Tanaka ,  Naoto Ban ,  Hideo Miura

IPC: H01L2166

CPC classification number: H01L21/6836 ,  H01L22/20 ,  H01L2221/68327 ,  H01L2924/0002 ,  H01L2924/014 ,  H01L2924/00

Abstract: Semiconductor device chips manufacturing and inspecting method is disclosed in which a semiconductor wafer is cut into individual LSI chips. The LSI chips are rearranged and integrated into a predetermined number. The cut LSI chips are integrated in a jig having openings with a size commensurate with the dimensions of the LSI chip. At least one part of the jig having such openings has a coefficient of thermal expansion that is approximately equal to that of the LSI chips. The integrated predetermined number of chips are subjected to an inspection process in a subsequent inspection step thereby improving efficiency and reducing cost.