公开(公告)号：US11935808B2

公开(公告)日：2024-03-19

申请号：US16831078

申请日：2020-03-26

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Je-Young Chang ,  Ram Viswanath ,  Elah Bozorg-Grayeli ,  Ahmad Al Mohammad

IPC: H01L23/367 ,  H01L23/373 ,  H01L23/495

CPC classification number: H01L23/3672 ,  H01L23/373 ,  H01L23/49568

Abstract: Thermal heat spreaders and/or an IC die with solderable thermal structures may be assembled together with a solder array thermal interconnects. A thermal heat spreader may include a non-metallic material and one or more metallized surfaces suitable for bonding to a solder alloy employed as thermal interface material between the heat spreader and an IC die. An IC die may include a metallized back-side surface similarly suitable for bonding to a thermal interconnect comprising a solder alloy. Metallization on the IC die and/or heat spreader may comprise a plurality of solderable structures. A multi-chip package may include multiple IC die having different die thickness that are accommodated by a z-height thickness variation in the thermal interconnects and/or the solderable structures of the IC die or heat spreader.

公开(公告)号：US11935799B2

公开(公告)日：2024-03-19

申请号：US16451973

申请日：2019-06-25

Applicant: Intel Corporation

Inventor： Elah Bozorg-Grayeli ,  Taylor William Gaines ,  Frederick W. Atadana ,  Sergio Antonio Chan Arguedas ,  Robert F. Cheney

IPC: H01L23/06 ,  H01L23/053 ,  H01L23/498 ,  H01L23/367 ,  H01L23/42 ,  H01L25/065

CPC classification number: H01L23/06 ,  H01L23/053 ,  H01L23/49816 ,  H01L23/3672 ,  H01L23/42 ,  H01L25/0655

Abstract: Disclosed herein are integrated circuit (IC) package lids with polymer features, as well as related methods and devices. For example, in some embodiments, an IC package may include a package substrate, a lid, and a die between the package substrate and the lid. A foot or rib of the lid may include a polymer material.

公开(公告)号：US20210305120A1

公开(公告)日：2021-09-30

申请号：US16831078

申请日：2020-03-26

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Je-Young Chang ,  Ram Viswanath ,  Elah Bozorg-Grayeli ,  Ahmad Al Mohammad

IPC: H01L23/367 ,  H01L23/495 ,  H01L23/373

Abstract: Thermal heat spreaders and/or an IC die with solderable thermal structures may be assembled together with a solder array thermal interconnects. A thermal heat spreader may include a non-metallic material and one or more metallized surfaces suitable for bonding to a solder alloy employed as thermal interface material between the heat spreader and an IC die. An IC die may include a metallized back-side surface similarly suitable for bonding to a thermal interconnect comprising a solder alloy. Metallization on the IC die and/or heat spreader may comprise a plurality of solderable structures. A multi-chip package may include multiple IC die having different die thickness that are accommodated by a z-height thickness variation in the thermal interconnects and/or the solderable structures of the IC die or heat spreader.

公开(公告)号：US20210305119A1

公开(公告)日：2021-09-30

申请号：US16831076

申请日：2020-03-26

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Je-Young Chang ,  Ram Viswanath ,  Elah Bozorg-Grayeli ,  Ahmad Al Mohammad

IPC: H01L23/367 ,  H01L23/373 ,  H01L23/495

Abstract: Thermal heat spreaders and/or an IC die with solderable thermal structures may be assembled together with a solder array thermal interconnects. A thermal heat spreader may include a non-metallic material and one or more metallized surfaces suitable for bonding to a solder alloy employed as thermal interface material between the heat spreader and an IC die. An IC die may include a metallized back-side surface similarly suitable for bonding to a thermal interconnect comprising a solder alloy. Metallization on the IC die and/or heat spreader may comprise a plurality of solderable structures. A multi-chip package may include multiple IC die having different die thickness that are accommodated by a z-height thickness variation in the thermal interconnects and/or the solderable structures of the IC die or heat spreader.

公开(公告)号：US20210035886A1

公开(公告)日：2021-02-04

申请号：US16529639

申请日：2019-08-01

Applicant: Intel Corporation

Inventor： Muhammad S. Islam ,  Enisa Harris ,  Suzana Prstic ,  Sergio Chan Arguedas ,  Sachin Deshmukh ,  Aravindha Antoniswamy ,  Elah Bozorg-Grayeli

IPC: H01L23/42 ,  H01L23/367 ,  H01L23/10 ,  H05K7/20 ,  H01L23/00 ,  H01L25/065

Abstract: A multi-chip package includes multiple IC die interconnected to a package substrate. An integrated heat spreader (IHS) is located over one or more primary IC die, but is absent from over one or more secondary IC die. Thermal cross-talk between IC dies and/or thermal performance of individual IC dies may be improved by constraining the dimensions of the IHS to be over less than all IC die of the package. A first thermal interface material (TIM) may be between the IHS and the primary IC die, but absent from over the secondary IC die. A second TIM may be between a heat sink and the IHS and also between the heat sink and the secondary IC die. The heat sink may be segmented, or have a non-planarity to accommodate differences in z-height across the IC die and/or as a result of constraining the dimensions of the IHS to be over less than all IC die.

公开(公告)号：US20190091722A1

公开(公告)日：2019-03-28

申请号：US15717582

申请日：2017-09-27

Applicant: Intel Corporation

Inventor： Michael Greenley ,  Elah Bozorg-Grayeli

IPC: B05D3/06 ,  C09J163/00 ,  C09J5/04 ,  G02B7/02

Abstract: Embodiments herein relate to curing of an epoxy using an ultraviolet (UV) laser. A volume of epoxy may be coupled to an area of a surface, and the volume of epoxy is cured and surrounded by material other than cured epoxy, where the area of the surface is substantially equal to a diameter of the UV laser beam used to cure the epoxy. Other embodiments may be described and/or claimed.

公开(公告)号：US20240136244A1

公开(公告)日：2024-04-25

申请号：US18395351

申请日：2023-12-22

Applicant: Intel Corporation

Inventor： Debendra Mallik ,  Je-Young Chang ,  Ram Viswanath ,  Elah Bozorg-Grayeli ,  Ahmad Al Mohammad

IPC: H01L23/367 ,  H01L23/373 ,  H01L23/495

CPC classification number: H01L23/3672 ,  H01L23/373 ,  H01L23/49568

Abstract: Thermal heat spreaders and/or an IC die with solderable thermal structures may be assembled together with a solder array thermal interconnects. A thermal heat spreader may include a non-metallic material and one or more metallized surfaces suitable for bonding to a solder alloy employed as thermal interface material between the heat spreader and an IC die. An IC die may include a metallized back-side surface similarly suitable for bonding to a thermal interconnect comprising a solder alloy. Metallization on the IC die and/or heat spreader may comprise a plurality of solderable structures. A multi-chip package may include multiple IC die having different die thickness that are accommodated by a z-height thickness variation in the thermal interconnects and/or the solderable structures of the IC die or heat spreader.

公开(公告)号：US11869824B2

公开(公告)日：2024-01-09

申请号：US16672858

申请日：2019-11-04

Applicant: Intel Corporation

Inventor： Kyle J. Arrington ,  Aaron McCann ,  Kelly Lofgreen ,  Elah Bozorg-Grayeli ,  Aravindha Antoniswamy ,  Joseph B. Petrini

IPC: H01L23/373 ,  H01L23/00 ,  H01L25/00

CPC classification number: H01L23/3735 ,  H01L23/3733 ,  H01L24/16 ,  H01L24/32 ,  H01L24/73 ,  H01L25/00 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/32506 ,  H01L2224/73253

Abstract: A thermal interface structure may be formed comprising a thermally conductive substrate having a first surface and an opposing second surface, a first liquid metal layer on the first surface of the thermally conductive substrate, and a second liquid metal layer on the second surface of the thermally conductive substrate. The thermal interface structure may be used in an integrated circuit assembly or package between at least one integrated circuit device and a heat dissipation device.

公开(公告)号：US11710677B2

公开(公告)日：2023-07-25

申请号：US16505052

申请日：2019-07-08

Applicant: Intel Corporation

Inventor： Taylor William Gaines ,  Ken Hackenberg ,  Elah Bozorg-Grayeli

IPC: H01L23/40 ,  H01L23/367 ,  H01L21/48 ,  F28F3/10

CPC classification number: H01L23/40 ,  F28F3/10 ,  H01L21/4882 ,  H01L23/3675 ,  F28F2230/00

Abstract: Embodiments may relate to a microelectronic package that includes an integrated heat spreader (IHS) coupled with a package substrate. The microelectronic package may further include a sealant material between the package substrate and the IHS. The sealant material may be formed of a material that cures when exposed to ultraviolet (UV) wavelengths. Other embodiments may be described or claimed.

公开(公告)号：US11004768B2

公开(公告)日：2021-05-11

申请号：US16529639

申请日：2019-08-01

Applicant: Intel Corporation

Inventor： Muhammad S. Islam ,  Enisa Harris ,  Suzana Prstic ,  Sergio Chan Arguedas ,  Sachin Deshmukh ,  Aravindha Antoniswamy ,  Elah Bozorg-Grayeli

IPC: H01L23/42 ,  H01L23/367 ,  H01L23/10 ,  H05K7/20 ,  H01L23/00 ,  H01L25/065 ,  H01L23/40

Abstract: A multi-chip package includes multiple IC die interconnected to a package substrate. An integrated heat spreader (IHS) is located over one or more primary IC die, but is absent from over one or more secondary IC die. Thermal cross-talk between IC dies and/or thermal performance of individual IC dies may be improved by constraining the dimensions of the IHS to be over less than all IC die of the package. A first thermal interface material (TIM) may be between the IHS and the primary IC die, but absent from over the secondary IC die. A second TIM may be between a heat sink and the IHS and also between the heat sink and the secondary IC die. The heat sink may be segmented, or have a non-planarity to accommodate differences in z-height across the IC die and/or as a result of constraining the dimensions of the IHS to be over less than all IC die.