Implantless dopant segregation for silicide contacts
    6.
    发明授权
    Implantless dopant segregation for silicide contacts 有权
    用于硅化物接触的无植入物掺杂剂分离

    公开(公告)号:US08889537B2

    公开(公告)日:2014-11-18

    申请号:US12833272

    申请日:2010-07-09

    摘要: A method for formation of a segregated interfacial dopant layer at a junction between a semiconductor material and a silicide layer includes depositing a doped metal layer over the semiconductor material; annealing the doped metal layer and the semiconductor material, wherein the anneal causes a portion of the doped metal layer and a portion of the semiconductor material to react to form the silicide layer on the semiconductor material, and wherein the anneal further causes the segregated interfacial dopant layer to form between the semiconductor material and the silicide layer, the segregated interfacial dopant layer comprising dopants from the doped metal layer; and removing an unreacted portion of the doped metal layer from the silicide layer.

    摘要翻译: 在半导体材料和硅化物层之间的结处形成分离的界面掺杂剂层的方法包括在半导体材料上沉积掺杂的金属层; 退火所述掺杂金属层和所述半导体材料,其中所述退火使所述掺杂金属层的一部分和所述半导体材料的一部分反应以在所述半导体材料上形成所述硅化物层,并且其中所述退火还导致所述分离的界面掺杂剂 层,以形成在半导体材料和硅化物层之间,分离的界面掺杂剂层包含来自掺杂金属层的掺杂剂; 以及从所述硅化物层去除所述掺杂金属层的未反应部分。

    Use of band edge gate metals as source drain contacts
    8.
    发明授权
    Use of band edge gate metals as source drain contacts 有权
    使用带边栅极金属作为源极漏极触点

    公开(公告)号:US08741753B2

    公开(公告)日:2014-06-03

    申请号:US13611736

    申请日:2012-09-12

    摘要: A device includes a gate stack formed over a channel in a semiconductor substrate. The gate stack includes a layer of gate insulator material, a layer of gate metal overlying the layer of gate insulator material, and a layer of contact metal overlying the layer band edge gate metal. The device further includes source and drain contacts adjacent to the channel. The source and drain contacts each include a layer of the gate metal that overlies and is in direct electrical contact with a doped region of the semiconductor substrate, and a layer of contact metal that overlies the layer of gate metal.

    摘要翻译: 一种器件包括形成在半导体衬底中的沟道上方的栅叠层。 栅极堆叠包括栅极绝缘体材料层,覆盖栅极绝缘体材料层的栅极金属层和覆盖层带边缘栅极金属的接触金属层。 该装置还包括邻近通道的源极和漏极接触。 源极和漏极触点各自包括覆盖并与半导体衬底的掺杂区域直接电接触的栅极金属层以及覆盖在栅极金属层上的接触金属层。

    Metal-semiconductor intermixed regions
    10.
    发明授权
    Metal-semiconductor intermixed regions 有权
    金属半导体混合区域

    公开(公告)号:US08278200B2

    公开(公告)日:2012-10-02

    申请号:US13012043

    申请日:2011-01-24

    IPC分类号: H01L21/20

    CPC分类号: H01L21/28518

    摘要: In one exemplary embodiment, a program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine for performing operations, said operations including: depositing a first layer having a first metal on a surface of a semiconductor structure, where depositing the first layer creates a first intermix region at an interface of the first layer and the semiconductor structure; removing a portion of the deposited first layer to expose the first intermix region; depositing a second layer having a second metal on the first intermix region, where depositing the second layer creates a second intermix region at an interface of the second layer and the first intermix region; removing a portion of the deposited second layer to expose the second intermix region; and performing at least one anneal on the semiconductor structure.

    摘要翻译: 在一个示例性实施例中,一种可由机器读取的程序存储设备,其有形地体现了可由机器执行的用于执行操作的指令程序,所述操作包括:在半导体结构的表面上沉积具有第一金属的第一层, 第一层在第一层和半导体结构的界面处形成第一混合区; 去除沉积的第一层的一部分以暴露第一混合区; 在所述第一混合区域上沉积具有第二金属的第二层,其中沉积所述第二层在所述第二层和所述第一混合区的界面处产生第二混合区; 去除沉积的第二层的一部分以暴露第二混合区; 以及在所述半导体结构上执行至少一个退火。