SUPPORT STRUCTURE, LITHOGRAPHIC APPARATUS AND METHOD
    4.
    发明申请
    SUPPORT STRUCTURE, LITHOGRAPHIC APPARATUS AND METHOD 有权
    支撑结构,平面设备和方法

    公开(公告)号:US20090290137A1

    公开(公告)日:2009-11-26

    申请号:US12466119

    申请日:2009-05-14

    IPC分类号: G03B27/53

    摘要: A support structure for supporting an exchangeable object in a lithographic exposure apparatus includes a first support structure part and a second support structure part, the first support structure part being arranged to support the object, and the second support structure part being arranged to, at least in part, support the first support structure part. At least one of the first support structure part and the second support structure part has an open-box structure. The first support structure part and the second support structure part are configured to be attached to one another in such a way that the first support structure part and the second support structure together form a closed-box structure.

    摘要翻译: 用于在光刻曝光设备中支撑可交换物体的支撑结构包括第一支撑结构部分和第二支撑结构部分,第一支撑结构部分被布置成支撑物体,第二支撑结构部分至少布置成 部分地支撑第一支撑结构部分。 第一支撑结构部分和第二支撑结构部分中的至少一个具有开放式框架结构。 第一支撑结构部分和第二支撑结构部分被构造成彼此附接,使得第一支撑结构部分和第二支撑结构一起形成闭合箱结构。

    LITHOGRAPHIC APPARATUS AND HUMIDITY MEASUREMENT SYSTEM
    10.
    发明申请
    LITHOGRAPHIC APPARATUS AND HUMIDITY MEASUREMENT SYSTEM 审中-公开
    LITHOGRAPHIC装置和湿度测量系统

    公开(公告)号:US20100085546A1

    公开(公告)日:2010-04-08

    申请号:US12572433

    申请日:2009-10-02

    IPC分类号: G03B27/52 G01N21/00

    摘要: A humidity measurement system for use in, for example, a lithographic apparatus. The humidity measurement system includes a tunable laser diode configured to emit a measurement radiation beam having a wavelength in a wavelength range. The wavelength range includes a first wavelength associated with an absorption peak of water molecules. A signal processing unit is connected to a radiation detector. The signal processing unit is configured to measure an intensity of the measurement radiation beam of the tunable laser diode subjected to absorption. The signal processing unit is also connected to the tunable laser diode for obtaining wavelength information. The signal processing unit is arranged to detect an extreme value in a measured intensity as function of the wavelength and to calculate a humidity value from the detected extreme value.

    摘要翻译: 用于例如光刻设备的湿度测量系统。 湿度测量系统包括被配置为发射波长范围内的波长的测量辐射束的可调激光二极管。 波长范围包括与水分子的吸收峰相关联的第一波长。 信号处理单元连接到放射线检测器。 信号处理单元被配置为测量经受吸收的可调谐激光二极管的测量辐射束的强度。 信号处理单元也连接到可调激光二极管以获得波长信息。 信号处理单元被配置为检测作为波长的函数的测量强度中的极值,并根据检测到的极值计算湿度值。