公开(公告)号：US06249242B1

公开(公告)日：2001-06-19

申请号：US09369400

申请日：1999-08-06

申请人： Kenji Sekine ,  Hiroshi Kondoh ,  Keigo Kamozaki ,  Hideyuki Nagaishi ,  Kazuo Matsuura ,  Terumi Nakazawa ,  Michio Tanimoto ,  Hideaki Sasaki ,  Yuzo Taniguchi

发明人： Kenji Sekine ,  Hiroshi Kondoh ,  Keigo Kamozaki ,  Hideyuki Nagaishi ,  Kazuo Matsuura ,  Terumi Nakazawa ,  Michio Tanimoto ,  Hideaki Sasaki ,  Yuzo Taniguchi

IPC分类号： G01S1393

CPC分类号： H01L23/66 ,  G01S7/03 ,  G01S7/032 ,  G01S2013/9325 ,  H01L24/48 ,  H01L2223/6627 ,  H01L2223/6677 ,  H01L2224/05599 ,  H01L2224/48091 ,  H01L2224/85399 ,  H01L2924/00014 ,  H01L2924/0102 ,  H01L2924/01078 ,  H01L2924/09701 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/1423 ,  H01L2924/15153 ,  H01L2924/1517 ,  H01L2924/16152 ,  H01L2924/1903 ,  H01Q1/3233 ,  H01Q21/0087 ,  H01Q23/00 ,  H01L2924/00 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： A high-frequency transmitter-receiver apparatus includes a transceiver circuit realized in a planar structure by a dielectric substrate and a semiconductor chip and a planar antenna formed on a dielectric substrate are provided on front and rear surfaces, respectively, of a single electrically conductive base plate. Signal lines of the planar circuit and the planar antenna are electrically interconnected by a coaxial line which extends through said base plate.

摘要翻译： 一种高频发射机 - 接收机设备包括分别由介质基片和半导体芯片实现的平面结构的收发器电路以及形成在电介质基片上的平面天线分别设置在单个导电基底 盘子。 平面电路和平面天线的信号线通过延伸穿过所述基板的同轴线电互连。

公开(公告)号：US4019669A

公开(公告)日：1977-04-26

申请号：US613542

申请日：1975-09-15

申请人： Michio Tanimoto ,  Yuzo Taniguchi

发明人： Michio Tanimoto ,  Yuzo Taniguchi

IPC分类号： B23K20/00 ,  H01L21/60 ,  H01L21/603 ,  H05K13/06 ,  B65H59/16

CPC分类号： H01L24/85 ,  H01L24/78 ,  H01L2224/451 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/78268 ,  H01L2224/78301 ,  H01L2224/786 ,  H01L2224/85045 ,  H01L2224/851 ,  H01L2224/85201 ,  H01L24/45 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01019 ,  H01L2924/01027 ,  H01L2924/01033 ,  H01L2924/01075 ,  H01L2924/01082

摘要： A wire bonder which includes a spool from which wire is drawn out, a capillary bonding head adapted to hold the wire and to extend the wire downwardly from the spool, and a tensioning mechanism. The tensioning mechanism includes a nozzle for directing a jet of gas against the wire with the nozzle being disposed in opposition to two guide plates disposed along the flow path of the gas ejected from the nozzle. The guide plates are spaced apart from each other to provide a space through which wire is passed from the spool to the capillary bonding head.

摘要翻译： 一种引线接合器，其包括从其引出线的线轴，用于保持线并将线从线轴向下延伸的毛细管接合头和张紧机构。 张紧机构包括用于将喷射气体引导到导线上的喷嘴，其中喷嘴被设置成与沿着从喷嘴喷出的气体的流动路径设置的两个引导板相对。 引导板彼此间隔开，以提供线从线轴通过毛细结合头的空间。

公开(公告)号：US06346772B1

公开(公告)日：2002-02-12

申请号：US09903495

申请日：2001-07-13

申请人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

发明人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

IPC分类号： H01J1749

CPC分类号： H05K3/062 ,  H01J9/02 ,  H01J11/12 ,  H01J11/22 ,  H01J11/24 ,  H01J2211/225 ,  H05K3/04 ,  H05K3/388 ,  H05K2201/0175 ,  H05K2201/0326 ,  H05K2203/025 ,  H05K2203/107

摘要： A gas discharge display device comprising a front side substrate having a plurality of first electrodes and a back side substrate having a plurality of second electrodes, wherein at least said first electrodes or second electrodes are formed by wet etching using a resist made of an inorganic material, is excellent in the ability to suppress the breakage of wiring in electrodes.

摘要翻译： 一种气体放电显示装置，包括具有多个第一电极的前侧基板和具有多个第二电极的背面基板，其中至少所述第一电极或第二电极通过使用由无机材料制成的抗蚀剂的湿蚀刻形成 能够抑制电极中的配线断裂的能力优异。

公开(公告)号：US06339653B1

公开(公告)日：2002-01-15

申请号：US09523380

申请日：2000-03-10

申请人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

发明人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

IPC分类号： G06K900

CPC分类号： G01N21/88 ,  G01N21/956 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

摘要翻译： 本发明分别提供用于探测器和自动粒子检测机的数据分析台。 并且，在数据分析站中，以产品为基础描述芯片的配置的坐标与描述缺陷的位置的坐标相同。 此外，该站提供确定每个缺陷属于哪个芯片的功能。 这些数据分析站通过通信线连接。 本发明能够基于芯片分析数据，从而能够掌握每个芯片上的缺陷引起的芯片与芯片的产品特性之间的关系。

公开(公告)号：US06621217B2

公开(公告)日：2003-09-16

申请号：US10068939

申请日：2002-02-11

申请人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

发明人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

IPC分类号： H01J1749

CPC分类号： H05K3/062 ,  H01J9/02 ,  H01J11/12 ,  H01J11/22 ,  H01J11/24 ,  H01J2211/225 ,  H05K3/04 ,  H05K3/388 ,  H05K2201/0175 ,  H05K2201/0326 ,  H05K2203/025 ,  H05K2203/107

摘要： A gas discharge display device comprising a front side substrate having a plurality of first electrodes and a back side substrate having a plurality of second electrodes, wherein at least said first electrodes or second electrodes are formed by wet etching using a resist made of an inorganic material, is excellent in the ability to suppress the breakage of wiring in electrodes.

公开(公告)号：US06429586B1

公开(公告)日：2002-08-06

申请号：US09225552

申请日：1999-01-05

申请人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Tomohiro Murase

发明人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Tomohiro Murase

IPC分类号： H01J1749

CPC分类号： H01J9/241 ,  H01J9/02

摘要： A method of making a gas discharge display panel and a gas discharge display device using laser processing so that the manufacturing time to form wiring on a substrate thereof is significantly reduced. In order to achieve this, the gas discharge display panel is provided with a first substrate having a plurality of first electrodes and a plurality of second electrodes, and the first electrodes are laser processed to have a substantially rectangular shape. The second electrodes are formed on the first electrodes, and a second substrate having a plurality of third electrodes which is opposed to the first substrate is provided.

摘要翻译： 一种制造气体放电显示面板的方法和使用激光加工的气体放电显示装置，使得在其基板上形成布线的制造时间显着降低。 为了实现这一点，气体放电显示面板设置有具有多个第一电极和多个第二电极的第一基板，并且第一电极被激光处理以具有基本上矩形的形状。 第二电极形成在第一电极上，并且具有与第一基板相对的多个第三电极的第二基板。

公开(公告)号：US06261144B1

公开(公告)日：2001-07-17

申请号：US09164272

申请日：1998-10-01

申请人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

发明人： Masashi Nishiki ,  Ryohei Satoh ,  Yuzo Taniguchi ,  Shigeaki Suzuki ,  Michifumi Kawai ,  Masahito Ijuin ,  Akira Yabushita ,  Makoto Fukushima ,  Tomohiko Murase

IPC分类号： H01J900

CPC分类号： H05K3/062 ,  H01J9/02 ,  H01J11/12 ,  H01J11/22 ,  H01J11/24 ,  H01J2211/225 ,  H05K3/04 ,  H05K3/388 ,  H05K2201/0175 ,  H05K2201/0326 ,  H05K2203/025 ,  H05K2203/107

摘要： A gas discharge display device comprising a front side substrate having a plurality of first electrodes and a back side substrate having a plurality of second electrodes, wherein at least said first electrodes or second electrodes are formed by wet etching using a resist made of an inorganic material, is excellent in the ability to suppress the breakage of wiring in electrodes.

摘要翻译： 一种气体放电显示装置，包括具有多个第一电极的前侧基板和具有多个第二电极的背面基板，其中至少所述第一电极或第二电极通过使用由无机材料制成的抗蚀剂的湿蚀刻形成 能够抑制电极中的配线断裂的能力优异。

公开(公告)号：US5841893A

公开(公告)日：1998-11-24

申请号：US908550

申请日：1992-06-30

申请人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

发明人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

IPC分类号： H01L21/66 ,  G01N21/88 ,  G01N21/956 ,  G06K9/00

CPC分类号： G01N21/88 ,  G01N21/956 ,  H01L22/20 ,  H01L2924/0002

摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

公开(公告)号：US06628817B2

公开(公告)日：2003-09-30

申请号：US09752674

申请日：2001-01-03

申请人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

发明人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

IPC分类号： G06K900

CPC分类号： G01N21/88 ,  G01N21/956 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

公开(公告)号：US06330352B1

公开(公告)日：2001-12-11

申请号：US09525527

申请日：2000-03-15

申请人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

发明人： Seiji Ishikawa ,  Masao Sakata ,  Jun Nakazato ,  Sadao Shimoyashiro ,  Hiroto Nagatomo ,  Yuzo Taniguchi ,  Osamu Satou ,  Tsutomu Okabe ,  Yuzaburo Sakamoto ,  Kimio Muramatsu ,  Kazuhiko Matsuoka ,  Taizo Hashimoto ,  Yuichi Ohyama ,  Yutaka Ebara ,  Isao Miyazaki ,  Shuichi Hanashima

IPC分类号： G06K900

CPC分类号： G01N21/88 ,  G01N21/956 ,  H01L22/20 ,  H01L2924/0002 ,  H01L2924/00

摘要： The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.