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    Scanning probe microscope and scanning method
    2.
    发明授权
    Scanning probe microscope and scanning method 有权
    扫描探针显微镜和扫描方法

    公开(公告)号：US07456400B2

    公开(公告)日：2008-11-25

    申请号：US11235458

    申请日：2005-09-26

    申请人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    发明人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    IPC分类号： G12B21/00

    CPC分类号： G01Q60/32 ,  G01Q10/06 ,  Y10S977/849 ,  Y10S977/851 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/872

    摘要： A scanning probe microscope has a probe needle and a control section that controls relative scanning movement between the probe needle and a surface of a sample in at least one direction parallel to the sample surface and controls relative movement between the probe needle and the sample surface in a direction perpendicular to the sample surface. A vibration source vibrates the probe needle at a vibrating frequency relative to the sample surface. An approach/separation drive section causes the probe needle to relatively approach to and separate from the sample surface at a predetermined distance while the probe needle is vibrated at the vibrating frequency relative to the sample surface by the vibration source. A detection section detects a rate of change in a vibration state of the probe needle in accordance with a distance between the probe needle and the sample surface. An observation section gathers observation data from the sample surface when the rate of change in the vibration state of the probe needle detected by the detection section has exceeded a preselected threshold value.

    摘要翻译： 扫描探针显微镜具有探针和控制部，其控制探针和样品表面之间的平行于样品表面的至少一个方向上的相对扫描运动，并且控制探针与样品表面之间的相对运动 垂直于样品表面的方向。 振动源以相对于样品表面的振动频率振动探针。 接近/分离驱动部分使得探针相对于样品表面以预定距离相对接近和分离，同时探针以振动源相对于样品表面的振动频率振动。 检测部根据探针与样本面的距离来检测探针的振动状态的变化率。 当由检测部检测到的探针的振动状态的变化率超过预选阈值时，观察部分从样本表面收集观察数据。

    Cell detachment method
    3.
    发明授权
    Cell detachment method 有权
    细胞分离法

    公开(公告)号：US08859279B2

    公开(公告)日：2014-10-14

    申请号：US11810768

    申请日：2007-06-07

    申请人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    发明人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    IPC分类号： C12N5/00 ,  C12M1/00

    CPC分类号： C12M47/04 ,  C12M33/00

    摘要： A cell detachment method for detaching only a desired cell from a plurality of cells cultured on a substrate under predetermined culture environment conditions by using a scanning probe microscope having a probe, comprising: observing the plural cells; specifying the cell to be detached; moving the probe onto the specified cell; and pressing the prove against the specified cell with a predetermined force so as to detach the cell from the substrate.

    摘要翻译： 一种细胞分离方法，其通过使用具有探针的扫描探针显微镜，在预定的培养环境条件下从仅在基质上培养的多个细胞中仅去除所需细胞，包括：观察所述多个细胞; 指定要分离的单元格; 将探针移动到指定的细胞上; 并用预定的力将证明压在指定的电池上，以将电池与基板分离。

    Cell detachment method
    4.
    发明申请
    Cell detachment method 有权
    细胞分离法

    公开(公告)号：US20070292946A1

    公开(公告)日：2007-12-20

    申请号：US11810768

    申请日：2007-06-07

    申请人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    发明人： Amiko Nihei ,  Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Akira Inoue ,  Osamu Matsuzawa ,  Naoya Watanabe

    IPC分类号： C12M3/00 ,  C12N5/06

    CPC分类号： C12M47/04 ,  C12M33/00

    摘要： A cell detachment method for detaching only a desired cell from a plurality of cells cultured on a substrate under predetermined culture environment conditions by using a scanning probe microscope having a probe, comprising: observing the plural cells; specifying the cell to be detached; moving the probe onto the specified cell; and pressing the prove against the specified cell with a predetermined force so as to detach the cell from the substrate.

    摘要翻译： 一种细胞分离方法，其通过使用具有探针的扫描探针显微镜，在预定的培养环境条件下从仅在基质上培养的多个细胞中仅去除所需细胞，包括：观察所述多个细胞; 指定要分离的单元格; 将探针移动到指定的细胞上; 并用预定的力将证明压在指定的电池上，以将电池与基板分离。

    Scanning probe microscope and scanning method
    6.
    发明申请
    Scanning probe microscope and scanning method 有权
    扫描探针显微镜和扫描方法

    公开(公告)号：US20060113472A1

    公开(公告)日：2006-06-01

    申请号：US11235458

    申请日：2005-09-26

    申请人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    发明人： Masatsugu Shigeno ,  Yoshiharu Shirakawabe ,  Amiko Nihei ,  Osamu Matsuzawa ,  Naoya Watanabe ,  Akira Inoue

    IPC分类号： G21K7/00

    CPC分类号： G01Q60/32 ,  G01Q10/06 ,  Y10S977/849 ,  Y10S977/851 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/872

    摘要： In order to provide a scanning probe microscope and a scanning method which are capable of accurately approaching or contacting a probe needle and a sample surface irrespective of an irregularities shape of the sample surface, it comprises a probe needle 2 for relatively performing, with respect to a sample surface S, scans in two directions parallel to the sample surface S and a movement in a perpendicular direction of the sample surface S, a detection means 4 for detecting a measurement amount changing in compliance with a distance between the probe needle 2 and the sample surface S, an observation means 6 for gathering an observation data in a point of time at which the probe needle 2 has approached to or contacted with the sample surface S, a control means 5 for controlling the sans in the two directions and the movement in the perpendicular direction and an approach/separation drive section 24 for causing the probe needle 2 to relatively approach to and separate from the sample surface S at a predetermined distance, wherein the detection means 4 detects a change rate of the measurement amount at an approach time and a separation time by the approach/separation drive section 24, and the observation means 6 gathers the observation data when the change rate of the observation amount exceeds a previously set threshold value.

    摘要翻译： 为了提供能够精确地接近或接触探针和样品表面的扫描探针显微镜和扫描方法，而与样品表面的不规则形状无关，其包括用于相对于相对于 样品表面S在平行于样品表面S的两个方向上扫描并沿着样品表面S的垂直方向移动;检测装置4，用于检测测量量根据探针2和 样本表面S，用于在探针2接近或接触样本表面S的时间点收集观察数据的观察装置6，用于控制两个方向上的无效的控制装置5和运动 以及用于使探针2相对于样品su相对接近和分离的接近/分离驱动部24 表面S在预定距离处，其中检测装置4通过接近/分离驱动部分24检测接近时间的测量量和分离时间的变化率，并且观察装置6在变化率 的观察量超过预先设定的阈值。

    Method for preparing Ag-ZnO electric contact material and electric contact material produced thereby
    7.
    发明授权
    Method for preparing Ag-ZnO electric contact material and electric contact material produced thereby 有权
    制备Ag-ZnO电接触材料的方法和由此制备的电接触材料

    公开(公告)号：US06432157B1

    公开(公告)日：2002-08-13

    申请号：US09701380

    申请日：2000-11-30

    申请人： Tetsuya Nakamura ,  Osamu Sakaguchi ,  Hiroyuki Kusamori ,  Osamu Matsuzawa ,  Masahiro Takahashi ,  Toshiya Yamamoto

    发明人： Tetsuya Nakamura ,  Osamu Sakaguchi ,  Hiroyuki Kusamori ,  Osamu Matsuzawa ,  Masahiro Takahashi ,  Toshiya Yamamoto

    IPC分类号： C22C506

    CPC分类号： C22C5/06 ,  B22F2009/046 ,  B22F2998/10 ,  C22C32/0021 ,  H01H1/02372 ,  B22F9/04 ,  C22C1/1078 ,  B22F3/16 ,  B22F3/20

    摘要： An object of the present invention is to provide a method of producing an Ag—ZnO electric contact material which can uniformly disperse ZnO micrograms in Ag; which maintains low contact resistance; which exhibits enhanced welding resistance and wear resistance; and which is suitable in view of production costs. The method of producing an Ag—ZnO electrical contact material comprises casting Ag and Zn at predetermined proportions and subjecting the resultant Ag—ZnO alloy to internal oxidation so as to disperse ZnO in Ag, the method being characterized in that an Ag—Zn alloy comprising 5-10 wt. % (as reduced to weight of metal) Zn, the balance being Ag, is formed into chips; the chips are subjected to internal oxidation; the internally oxidized chips are compacted to thereby form billets; the billets are pressed and sintered; and subsequently, the sintered billets are extruded, to thereby yield uniform dispersion, in Ag, of ZnO micrograms.

    摘要翻译： 本发明的目的是提供一种能够均匀分散Ag中的ZnO微克的Ag-ZnO电接触材料的制造方法。 其保持低接触电阻; 表现出增强的耐焊接性和耐磨性; 并且鉴于生产成本是合适的。 制造Ag-ZnO电接触材料的方法包括以预定比例浇铸Ag和Zn，并对所得Ag-ZnO合金进行内部氧化，以将ZnO分散在Ag中，其特征在于包含Ag-Zn合金 5-10重量％ ％（以金属重量计），余量为Ag的Zn形成芯片; 芯片经受内部氧化; 内部氧化的芯片被压实从而形成坯料; 坯料被压制和烧结; 随后将烧结的坯料挤出，从而在Ag中产生ZnO微米的均匀分散。

    Process of preparing clad contact material
    8.
    发明授权
    Process of preparing clad contact material 失效
    制备包层接触材料的工艺

    公开(公告)号：US5531371A

    公开(公告)日：1996-07-02

    申请号：US355554

    申请日：1994-12-14

    申请人： Osamu Matsuzawa

    发明人： Osamu Matsuzawa

    IPC分类号： B23K20/00 ,  B23K20/04 ,  B23K31/02 ,  C23C10/28 ,  H01H11/04 ,  B23K103/08

    CPC分类号： B23K31/02 ,  Y10T29/4921

    摘要： A process of preparing clad contact material comprises forming a contact belt-like member by bonding an Au or Au alloy tape to the surface of an Ag or Ag alloy tape, thermally treating that contact member for forming an Au diffusion layer, and cladding that contact member having the Au diffusion layer to a base belt-like member made of Cu or a Cu alloy. Since, according to the process, the thermal diffusion treatment is carried out before the contact belt-like member is set in the base belt-like member, the thermal diffusion treatment of the contact belt-like member can be performed in the most suitable conditions for obtaining an Au diffusion layer with excellent characteristics, and no dissolution may occur at the interface between the two belt-like members.

    摘要翻译： 制备包层接触材料的方法包括通过将Au或Au合金带粘合到Ag或Ag合金带的表面上来形成接触带状构件，热处理用于形成Au扩散层的接触构件，并包覆该接触 具有Au扩散层的构件到由Cu或Cu合金制成的基带状构件。 由于根据该方法，在将接触带状部件设置在基带状部件中之前进行热扩散处理，所以可以在最合适的条件下进行接触带状部件的热扩散处理 用于获得具有优异特性的Au扩散层，并且在两个带状构件之间的界面处不会发生溶解。

    Inductively coupled plasma mass spectrometric and spectrochemical analyzer
    10.
    发明授权
    Inductively coupled plasma mass spectrometric and spectrochemical analyzer 失效
    电感耦合等离子体质谱仪和光谱化学分析仪

    公开(公告)号：US6002129A

    公开(公告)日：1999-12-14

    申请号：US78470

    申请日：1998-05-14

    申请人： Tetsumasa Ito ,  Yoshitomo Nakagawa ,  Osamu Matsuzawa

    发明人： Tetsumasa Ito ,  Yoshitomo Nakagawa ,  Osamu Matsuzawa

    IPC分类号： H01J49/10 ,  H01J49/36

    CPC分类号： H01J49/105

    摘要： A sample introducing apparatus for an inductively coupled plasma mass spectrometric and spectrochemical analyzer is provided to have a branch pipe at a sample pipe of a plasma torch for introducing an oxygen gas controllable in flow rate. The sample, after mixed with a sufficient amount of oxygen, is burnt by a plasma to oxidize and vaporize carbon.

    摘要翻译： 提供了一种用于电感耦合等离子体质谱和光谱分析仪的样品引入装置，在等离子体焰炬的样品管上具有用于引入以流量可控的氧气的分支管。 样品与足够量的氧气混合后，被等离子体燃烧以氧化和蒸发碳。