Resistive random access memory and method of manufacturing the same
    3.
    发明申请
    Resistive random access memory and method of manufacturing the same 有权
    电阻式随机存取存储器及其制造方法

    公开(公告)号:US20080121864A1

    公开(公告)日:2008-05-29

    申请号:US11987150

    申请日:2007-11-28

    IPC分类号: H01L45/00

    摘要: Example embodiments relate to a resistive random access memory (RRAM) and a method of manufacturing the RRAM. A RRAM according to example embodiments may include a lower electrode, which may be formed on a lower structure (e.g., substrate). A resistive layer may be formed on the lower electrode, wherein the resistive layer may include a transition metal dopant. An upper electrode may be formed on the resistive layer. Accordingly, the transition metal dopant may form a filament in the resistive layer that operates as a current path.

    摘要翻译: 示例实施例涉及电阻随机存取存储器(RRAM)和制造RRAM的方法。 根据示例性实施例的RRAM可以包括下电极,其可以形成在下结构(例如,衬底)上。 电阻层可以形成在下电极上,其中电阻层可以包括过渡金属掺杂剂。 上电极可以形成在电阻层上。 因此,过渡金属掺杂剂可以在作为电流路径工作的电阻层中形成丝。

    Memory devices and methods of manufacturing the same
    9.
    发明申请
    Memory devices and methods of manufacturing the same 有权
    存储器件及其制造方法

    公开(公告)号:US20080308783A1

    公开(公告)日:2008-12-18

    申请号:US12213062

    申请日:2008-06-13

    IPC分类号: H01L47/00 H01L29/76 H01L21/00

    摘要: Memory devices and methods of manufacturing the same are provided. In a memory device, a memory-switch structure is formed between a first and second electrode. The memory-switch structure includes a memory resistor and a switch structure. The switch structure controls current supplied to the memory resistor. A memory region of the memory resistor and a switch region of the switch structure are different from each other.

    摘要翻译: 提供了存储器件及其制造方法。 在存储器件中,在第一和第二电极之间形成存储器开关结构。 存储器开关结构包括存储器电阻器和开关结构。 开关结构控制提供给存储电阻的电流。 存储电阻的存储区域和开关结构的开关区域彼此不同。

    Memory devices and methods of manufacturing the same
    10.
    发明授权
    Memory devices and methods of manufacturing the same 有权
    存储器件及其制造方法

    公开(公告)号:US08274067B2

    公开(公告)日:2012-09-25

    申请号:US12213062

    申请日:2008-06-13

    IPC分类号: H01L29/06

    摘要: Memory devices and methods of manufacturing the same are provided. In a memory device, a memory-switch structure is formed between a first and second electrode. The memory-switch structure includes a memory resistor and a switch structure. The switch structure controls current supplied to the memory resistor. A memory region of the memory resistor and a switch region of the switch structure are different from each other.

    摘要翻译: 提供了存储器件及其制造方法。 在存储器件中,在第一和第二电极之间形成存储器开关结构。 存储器开关结构包括存储器电阻器和开关结构。 开关结构控制提供给存储电阻的电流。 存储电阻的存储区域和开关结构的开关区域彼此不同。