DUAL FLIP-FLOP CIRCUIT
    1.
    发明申请
    DUAL FLIP-FLOP CIRCUIT 有权
    双浮点电路

    公开(公告)号:US20140125377A1

    公开(公告)日:2014-05-08

    申请号:US13668110

    申请日:2012-11-02

    CPC classification number: H03K3/356156 G01R31/318541 H03K3/356121

    Abstract: A dual flip-flop circuit combines two or more flip-flip sub-circuits into a single circuit. The flip-flop circuit comprises a first flip-flop sub-circuit and a second flip-flop sub-circuit. The first flip-flop sub-circuit comprises a first storage sub-circuit configured to store a first selected input signal and transfer the first selected input signal to a first output signal when a buffered clock signal transitions between two different logic levels and a dock driver configured to receive a clock input signal, generate an inverted clock signal, and generate the buffered clock signal. The second flip-flop sub-circuit is coupled to the clock driver and configured to receive the inverted clock signal and the buffered clock signal. The second flip-flop sub-circuit comprises a second storage sub-circuit configured to store a second selected input signal and transfer the second selected input signal to a second output signal when the buffered clock signal transitions.

    Abstract translation: 双触发器电路将两个或更多个触发器子电路组合成单个电路。 触发器电路包括第一触发器子电路和第二触发器子电路。 第一触发器子电路包括第一存储子电路,其被配置为存储第一选择的输入信号,并且当缓冲的时钟信号在两个不同逻辑电平之间转换时,将第一选定的输入信号传送到第一输出信号, 被配置为接收时钟输入信号,产生反相时钟信号,并产生缓冲的时钟信号。 第二触发器子电路耦合到时钟驱动器并且被配置为接收反相时钟信号和经缓冲的时钟信号。 第二触发器子电路包括第二存储子电路,其被配置为存储第二选择的输入信号,并且在缓冲的时钟信号转换时将第二选定的输入信号传送到第二输出信号。

    SRAM core cell design with write assist
    2.
    发明授权
    SRAM core cell design with write assist 有权
    SRAM核心单元设计具有写入辅助功能

    公开(公告)号:US09542992B2

    公开(公告)日:2017-01-10

    申请号:US13865281

    申请日:2013-04-18

    CPC classification number: G11C11/412

    Abstract: A static random access memory (SRAM) cell includes a storage unit configured to store a data bit in a storage node. The SRAM cell further includes an access unit coupled to the storage unit. The access unit is configured to transfer current to the storage node when a word line is asserted. The SRAM cell further includes a row header configured to provide current from a power supply when the word line is not asserted, and to not provide current from the power supply when the word line is asserted. The SRAM cell further includes a column header configured to provide current from a power supply when a write column line is not asserted, and to not provide current from the power supply when the write column line is asserted.

    Abstract translation: 静态随机存取存储器(SRAM)单元包括被配置为在存储节点中存储数据位的存储单元。 SRAM单元还包括耦合到存储单元的存取单元。 访问单元被配置为当字线被断言时将电流传送到存储节点。 SRAM单元进一步包括行标头,其被配置为当字线未被断言时提供来自电源的电流,并且当字线被断言时不提供来自电源的电流。 SRAM单元进一步包括列头,其配置成当写入列线未被置位时提供来自电源的电流,并且当写入列线被断言时不提供来自电源的电流。

    Flip-flop circuit having a reduced hold time requirement for a scan input
    3.
    发明授权
    Flip-flop circuit having a reduced hold time requirement for a scan input 有权
    对于扫描输入,具有减小的保持时间要求的触发器电路

    公开(公告)号:US09110141B2

    公开(公告)日:2015-08-18

    申请号:US13668143

    申请日:2012-11-02

    Abstract: A scan flip-flop circuit comprises a scan input sub-circuit and a selection sub-circuit. The scan input sub-circuit is configured to receive a scan input signal and a scan enable signal and, when the scan enable signal is activated, generate complementary scan input signals representing the scan input signal that are delayed relative to a transition of a clock input signal between two different logic levels. The selection sub-circuit is coupled to the scan input sub-circuit and configured to receive the complementary scan input signals and, based on the scan enable signal, output an inverted version of either the scan input signal or a data signal as a first selected input signal.

    Abstract translation: 扫描触发电路包括扫描输入子电路和选择子电路。 扫描输入子电路被配置为接收扫描输入信号和扫描使能信号,并且当扫描使能信号被激活时,产生表示相对于时钟输入的转变而被延迟的扫描输入信号的互补扫描输入信号 信号在两个不同的逻辑电平之间。 选择子电路耦合到扫描输入子电路并且被配置为接收互补扫描输入信号,并且基于扫描使能信号,将扫描输入信号或数据信号的反相版本输出为第一选择 输入信号。

    Mixed threshold flip-flop element to mitigate hold time penalty due to clock distortion

    公开(公告)号:US10181842B2

    公开(公告)日:2019-01-15

    申请号:US14945377

    申请日:2015-11-18

    Abstract: A flip-flop element is configured to include FinFET technology transistors with a mix of threshold voltage levels. The data input path includes FinFET transistors configured with high voltage thresholds (HVT). The clock input path includes transistors configured with standard voltage thresholds (SVT). By including FinFET transistors with SVT thresholds in the clock signal path, the Miller capacitance of the clock signal path is reduced relative to HVT FinFET transistors, leading to lower rise time and correspondingly lower hold time. By including HVT threshold devices in the data input path, the flip-flop element attains high speed and low power operation. By including SVT threshold devices in the clock signal path, the flip-flop element achieves faster switching times in the clock signal path.

    Mitigating external influences on long signal lines

    公开(公告)号:US09842631B2

    公开(公告)日:2017-12-12

    申请号:US13715991

    申请日:2012-12-14

    CPC classification number: G11C7/12 G11C11/4091

    Abstract: Mitigating external influences on long signal lines. In accordance with an embodiment of the present invention, a column of a memory array includes first and second transistors configured to pull up the bit line of the column. The column includes a third transistor configured to selectively pull up the bit line of the column responsive to a level of the inverted bit line of the column and a fourth transistor configured to selectively pull up the inverted bit line of the column responsive to a level of the bit line of the column. The column further includes fifth and sixth transistors configured to selectively pull up the bit line and inverted bit line of the column responsive to the clamp signal and a seventh transistor configured to selectively couple the bit line of the column and the inverted bit line of the column responsive to the clamp signal.

    LOW TAU SYNCHRONIZER FLIP-FLOP WITH DUAL LOOP FEEDBACK APPROACH TO IMPROVE MEAN TIME BETWEEN FAILURE
    6.
    发明申请
    LOW TAU SYNCHRONIZER FLIP-FLOP WITH DUAL LOOP FEEDBACK APPROACH TO IMPROVE MEAN TIME BETWEEN FAILURE 有权
    低双向同步旋转双向反馈方法提高故障时间之间的平均时间

    公开(公告)号:US20150222266A1

    公开(公告)日:2015-08-06

    申请号:US14170342

    申请日:2014-01-31

    CPC classification number: H03K19/003 G06F1/10 H03K3/0372

    Abstract: A flip-flop and a method of receiving a digital signal from an asynchronous domain. In one embodiment, the flip-flop includes: (1) a first loop coupled to a flip-flop input and having first and second stable states and (2) a second loop coupled to the first loop and having the first and second stable states, properties of cross-coupled inverters in the first and second loops creating a metastable state skewed toward the first stable state in the first loop and skewed toward the second stable state in the second loop. Certain embodiments of the flip-flop have lower time constant and thus a higher Mean Time Between Failure (MTBF).

    Abstract translation: 触发器和从异步域接收数字信号的方法。 在一个实施例中,触发器包括:(1)耦合到触发器输入并具有第一和第二稳定状态的第一环路和(2)耦合到第一环路并具有第一和第二稳定状态的第二环路 在第一和第二回路中的交叉耦合的反相器的特性产生亚稳态,其在第一回路中朝向第一稳定状态倾斜,并且朝向第二回路中的第二稳定状态倾斜。 触发器的某些实施例具有较低的时间常数,因此具有较高的平均故障间隔时间(MTBF)。

    MITIGATING EXTERNAL INFLUENCES ON LONG SIGNAL LINES
    7.
    发明申请
    MITIGATING EXTERNAL INFLUENCES ON LONG SIGNAL LINES 有权
    减轻对长信号线的外部影响

    公开(公告)号:US20140169108A1

    公开(公告)日:2014-06-19

    申请号:US13715991

    申请日:2012-12-14

    CPC classification number: G11C7/12 G11C11/4091

    Abstract: Mitigating external influences on long signal lines. In accordance with an embodiment of the present invention, a column of a memory array includes first and second transistors configured to pull up the bit line of the column. The column includes a third transistor configured to selectively pull up the bit line of the column responsive to a level of the inverted bit line of the column and a fourth transistor configured to selectively pull up the inverted bit line of the column responsive to a level of the bit line of the column. The column further includes fifth and sixth transistors configured to selectively pull up the bit line and inverted bit line of the column responsive to the clamp signal and a seventh transistor configured to selectively couple the bit line of the column and the inverted bit line of the column responsive to the clamp signal.

    Abstract translation: 减轻对长信号线的外部影响。 根据本发明的实施例,存储阵列的列包括被配置为上拉列的位线的第一和第二晶体管。 该列包括第三晶体管,其被配置为响应于该列的反相位线的电平有选择地上拉该列的位线;以及第四晶体管,其被配置为响应于该列的反相位线选择性地上拉该反相位线 列的位线。 该列还包括第五和第六晶体管,其被配置为响应钳位信号选择性地上拉该列的位线和反相位线;以及第七晶体管,被配置为选择性地耦合该列的位线和该列的反相位线 响应钳位信号。

    Low power flip-flop element with gated clock

    公开(公告)号:US10931266B2

    公开(公告)日:2021-02-23

    申请号:US14456805

    申请日:2014-08-11

    Abstract: A flip-flop element is configured to gate the clock inversions within a master-slave flip-flop element. The flip-flop element reduces the number of circuit elements within the flip-flop element by collapsing elements with common functionality into a single circuit element. Further, by making the actions of judiciously selected circuit elements conditional upon the state of the input data, the flip-flop element circuit reduces the number of internal transitions. In this manner, by reducing the number of circuit elements as well as the number of transitions, the flip-flop element achieves substantial reduction in overall system power consumption, resulting in a more efficient system.

    LOW CLOCKING POWER FLIP-FLOP
    9.
    发明申请
    LOW CLOCKING POWER FLIP-FLOP 有权
    低时钟功率FLIP-FLOP

    公开(公告)号:US20160269002A1

    公开(公告)日:2016-09-15

    申请号:US14644637

    申请日:2015-03-11

    CPC classification number: H03K3/012 G01R31/318541 H03K3/0372 H03K19/21

    Abstract: Low clocking power flip-flop. In accordance with a first embodiment of the present invention, a flip-flop electronic circuit includes a master latch coupled to a slave latch in a flip-flop configuration. The flip-flop electronic circuit also includes a clock control circuit for comparing an input to the master latch with an output of the slave latch, and responsive to the comparing, blocking a clock signal to the master latch and the slave latch when the flip-flop electronic circuit is in a quiescent condition.

    Abstract translation: 低时钟电源触发器。 根据本发明的第一实施例,触发器电子电路包括以触发器配置耦合到从锁存器的主锁存器。 触发器电子电路还包括用于将输入与主锁存器的输入与从锁存器的输出进行比较的时钟控制电路,并且响应于比较,当触发器电路电路将时钟信号阻塞到主锁存器和从锁存器时, 触发器电子电路处于静止状态。

    Low tau synchronizer flip-flop with dual loop feedback approach to improve mean time between failure
    10.
    发明授权
    Low tau synchronizer flip-flop with dual loop feedback approach to improve mean time between failure 有权
    低同步触发器采用双回路反馈方式,提高故障间的平均时间

    公开(公告)号:US09219480B2

    公开(公告)日:2015-12-22

    申请号:US14170342

    申请日:2014-01-31

    CPC classification number: H03K19/003 G06F1/10 H03K3/0372

    Abstract: A flip-flop and a method of receiving a digital signal from an asynchronous domain. In one embodiment, the flip-flop includes: (1) a first loop coupled to a flip-flop input and having first and second stable states and (2) a second loop coupled to the first loop and having the first and second stable states, properties of cross-coupled inverters in the first and second loops creating a metastable state skewed toward the first stable state in the first loop and skewed toward the second stable state in the second loop. Certain embodiments of the flip-flop have lower time constant and thus a higher Mean Time Between Failure (MTBF).

    Abstract translation: 触发器和从异步域接收数字信号的方法。 在一个实施例中,触发器包括:(1)耦合到触发器输入并具有第一和第二稳定状态的第一环路和(2)耦合到第一环路并具有第一和第二稳定状态的第二环路 在第一和第二回路中的交叉耦合的反相器的特性产生亚稳态,其在第一回路中朝向第一稳定状态倾斜,并且朝向第二回路中的第二稳定状态倾斜。 触发器的某些实施例具有较低的时间常数,因此具有较高的平均故障间隔时间(MTBF)。

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