Dual beam system
    1.
    发明申请
    Dual beam system 有权
    双光束系统

    公开(公告)号:US20050035291A1

    公开(公告)日:2005-02-17

    申请号:US10889967

    申请日:2004-07-13

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual beam system
    2.
    发明申请
    Dual beam system 有权
    双光束系统

    公开(公告)号:US20080035860A1

    公开(公告)日:2008-02-14

    申请号:US11641540

    申请日:2006-12-18

    IPC分类号: H01J37/00

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual Beam System
    3.
    发明申请
    Dual Beam System 有权
    双梁系统

    公开(公告)号:US20110309263A1

    公开(公告)日:2011-12-22

    申请号:US13222536

    申请日:2011-08-31

    IPC分类号: H01J37/30

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual Beam System
    4.
    发明申请
    Dual Beam System 有权
    双梁系统

    公开(公告)号:US20100025578A1

    公开(公告)日:2010-02-04

    申请号:US12576914

    申请日:2009-10-09

    IPC分类号: G01N23/22 H01J1/50 H01J3/20

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual beam system
    5.
    发明授权
    Dual beam system 有权
    双光束系统

    公开(公告)号:US07161159B2

    公开(公告)日:2007-01-09

    申请号:US10889967

    申请日:2004-07-13

    IPC分类号: H01J37/244

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual beam system
    7.
    发明授权
    Dual beam system 有权
    双光束系统

    公开(公告)号:US08013311B2

    公开(公告)日:2011-09-06

    申请号:US12576914

    申请日:2009-10-09

    IPC分类号: H01J37/30 H01J37/26 H01J37/10

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。

    Dual beam system
    8.
    发明授权
    Dual beam system 有权
    双光束系统

    公开(公告)号:US07601976B2

    公开(公告)日:2009-10-13

    申请号:US11641540

    申请日:2006-12-18

    摘要: A dual beam system includes an ion beam system and a scanning electron microscope with a magnetic objective lens. The ion beam system is adapted to operate optimally in the presence of the magnetic field from the SEM objective lens, so that the objective lens is not turned off during operation of the ion beam. An optional secondary particle detector and an optional charge neutralization flood gun are adapted to operate in the presence of the magnetic field. The magnetic objective lens is designed to have a constant heat signature, regardless of the strength of magnetic field being produced, so that the system does not need time to stabilize when the magnetic field is changed.

    摘要翻译: 双光束系统包括离子束系统和具有磁性物镜的扫描电子显微镜。 离子束系统适于在存在来自SEM物镜的磁场的情况下最佳地操作,使得物镜在离子束操作期间不被关闭。 可选的二次粒子检测器和可选的电荷中和泛喷枪适于在存在磁场的情况下操作。 磁性物镜被设计成具有恒定的热信号,不管产生的磁场的强度如何,使得当磁场改变时,系统不需要时间稳定。