Abstract:
A buffer circuit configured to receive first and second input signals through first and second input transistors coupled to a first power voltage node, output a first output signal through a first output node and a second output signal through a second output node based on the first and second input signals. A load circuit is coupled among the first output node, the second output node, and a second power voltage node and a resistance value is adjusted based on at least one of the first and second output signals.
Abstract:
A receiving circuit may include an amplifier. The amplifier may include a first amplification circuit and a second amplification circuit. The first amplification circuit may be configured to differentially amplify a first input signal and a reference signal and configured to generate output signals. The second amplification circuit may be configured to differentially amplify a second input signal and the reference signal and configured to generate the output signals.
Abstract:
A buffer circuit configured to receive first and second input signals through first and second input transistors coupled to a first power voltage node, output a first output signal through a first output node and a second output signal through a second output node based on the first and second input signals. A load circuit is coupled among the first output node, the second output node, and a second power voltage node and a resistance value is adjusted based on at least one of the first and second output signals.
Abstract:
Provided is a method for reducing output data noise of a semiconductor apparatus which includes a plurality of output buffers to output data. The method includes the steps of: driving low data to a specific output buffer among the plurality of output buffers, and driving data transiting from a high level to a low level to the other output buffers; and measuring the magnitude of data noise occurring in output data of the specific output buffer, and deciding slew rates of the plurality of output buffers based on the measurement result.
Abstract:
A transmission circuit may be provided. The transmission circuit may include a strobe control circuit and an output driver. The strobe control circuit may generate strobe driving signals based on information and a clock signal. The output driver may generate a strobe signal by driving a signal transmission line. The transmission circuit may drive the signal transmission line to a specified level for a predetermined time after transmission of the strobe signal is completed.
Abstract:
A semiconductor device may be provided. The semiconductor device may be configured to adjust a level of a first strobe signal to a predetermined level during a first time period. The semiconductor device may be configured to adjust a swing width of the first strobe signal during a second time period.
Abstract:
Provided is a semiconductor apparatus which includes a plurality of output buffers configured to connect a plurality of power sources, and a data noise measuring unit configured to fix an output data of a selected output buffer among the plurality of output buffers to have a specific level, measure a noise of the output data using a capacitance and control a slew rate of the plurality of output buffers based on the noise.
Abstract:
An oscillating signal generating circuit drives an oscillating signal to a first logic level based on a first control signal, which is generated by delaying the oscillating signal through a clock delaying circuit, and drives the oscillating signal to a second logic level based on a second control signal, which is generated by delaying the oscillating signal by a fixed delay amount.
Abstract:
An amplification circuit is provided. The amplification circuit may include an amplification stage configured to amplify a first signal and a second signal, and generate third and fourth signals while in a first operation period. The amplification circuit may include a latch stage configured to latch the third and fourth signals while in a in a second operation period. The amplification circuit may supply a low voltage to the amplification stage during the first operation period, the low voltage to the latch stage during the second operation period, a high voltage to the amplification stage during the first operation period, and the high voltage to the latch stage during the second operation period.
Abstract:
A semiconductor apparatus may include a transmission circuit, a reception circuit, and a pad commonly coupled to the transmission circuit and the reception circuit. When either the transmission circuit or the reception circuit is activated, parasitic capacitance of a line coupled to the transmission circuit, the reception circuit, and the pad is varied.