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    Device and system including adaptive repair circuit
    1.
    发明授权
    Device and system including adaptive repair circuit 有权

    公开(公告)号：US10678631B2

    公开(公告)日：2020-06-09

    申请号：US16032368

    申请日：2018-07-11

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sang-Hoon Shin ,  Hae-Suk Lee ,  Han-Vit Jung ,  Kyo-Min Sohn

    IPC: G06F11/00 ,  G06F11/07 ,  G06F11/14 ,  G06F11/16 ,  G06F11/18 ,  G06F11/20

    Abstract: A device, system, and/or method includes an internal circuit configured to perform at least one function, an input-output terminal set and a repair circuit. The input-output terminal set includes a plurality of normal input-output terminals connected to an external device via a plurality of normal signal paths and at least one repair input-output terminal selectively connected to the external device via at least one repair signal path. The repair circuit repairs at least one failed signal path included in the normal signal paths based on a mode signal and fail information signal, where the mode signal represents whether to use the repair signal path and the fail information signal represents fail information on the normal signal paths. Using the repair circuit, various systems adopting different repair schemes may be repaired and cost of designing and manufacturing the various systems may be reduced.

    Memory device, and memory system including the same
    6.
    发明授权
    Memory device, and memory system including the same 有权
    内存设备和包含相同的内存系统

    公开(公告)号：US09460766B2

    公开(公告)日：2016-10-04

    申请号：US14801707

    申请日：2015-07-16

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Tae-Yoon Lee ,  Myeong-O Kim ,  Kyo-Min Sohn ,  Sang-Joon Hwang

    IPC: G11C7/00 ,  G11C7/12 ,  G11C11/4076 ,  G11C11/4094

    CPC classification number: G11C7/12 ,  G11C11/4076 ,  G11C11/4094

    Abstract: A memory device may include a pre-charge control circuit, an active control circuit, and a driver circuit. The pre-charge control circuit may be configured to receive an active command after receiving a pre-charge command for a first bank, determine whether or not a pre-charge operation for the first bank has ended when receiving the active command, and generate an active instruction signal according to a result of the determination. The active control circuit may be configured to generate an active control signal for an active operation according to the active instruction signal. The driver circuit may be configured to control an active operation according to the active control signal.

    Abstract translation: 存储器件可以包括预充电控制电路，有源控制电路和驱动器电路。 预充电控制电路可以被配置为在接收到用于第一组的预充电命令之后接收有效命令，在接收到活动命令时确定第一组的预充电操作是否已经结束，并且生成 根据确定的结果激活指令信号。 有源控制电路可以被配置为根据有效指令信号产生用于有效操作的有效控制信号。 驱动器电路可以被配置为根据主动控制信号来控制有效操作。

    Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices
    9.
    发明授权
    Semiconductor memory devices, memory systems and methods of operating semiconductor memory devices 有权

    公开(公告)号：US10818375B2

    公开(公告)日：2020-10-27

    申请号：US16028783

    申请日：2018-07-06

    Applicant: SAMSUNG ELECTRONICS CO., LTD.

    Inventor： Jong-Pil Son ,  Kyo-Min Sohn

    IPC: G06F11/00 ,  G11C29/42 ,  G06F11/22 ,  G06F11/10 ,  G11C29/02

    Abstract: A semiconductor memory device which includes a memory cell array, an error injection register set, a data input buffer, a write data generator, and control logic. The error injection register set stores an error bit set, including at least one error bit, based on a first command. The error bit set is associated with a data set to be written in the memory cell array. The data input buffer stores the data set to be written in the memory cell array based on a second command. The write data generator generates a write data set to be written in the memory cell array based on the data set and the error bit set. The control logic controls the error injection register set and the data input buffer.

    Device and system including adaptive repair circuit
    10.
    发明授权
    Device and system including adaptive repair circuit 有权

    公开(公告)号：US10296414B2

    公开(公告)日：2019-05-21

    申请号：US15650096

    申请日：2017-07-14

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Sang-Hoon Shin ,  Hae-Suk Lee ,  Han-Vit Jung ,  Kyo-Min Sohn

    IPC: G06F11/00 ,  G06F11/07 ,  G06F11/14 ,  G06F11/16 ,  G06F11/18 ,  G06F11/20

    Abstract: A device, system, and/or method includes an internal circuit configured to perform at least one function, an input-output terminal set and a repair circuit. The input-output terminal set includes a plurality of normal input-output terminals connected to an external device via a plurality of normal signal paths and at least one repair input-output terminal selectively connected to the external device via at least one repair signal path. The repair circuit repairs at least one failed signal path included in the normal signal paths based on a mode signal and fail information signal, where the mode signal represents whether to use the repair signal path and the fail information signal represents fail information on the normal signal paths. Using the repair circuit, various systems adopting different repair schemes may be repaired and cost of designing and manufacturing the various systems may be reduced.

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