摘要:
Techniques are provided for optimizing the programming of memory cells by obtaining a metric which indicates a program or erase rate of the memory cells. In one approach, a count of pulses used to program the cells to different verify levels of respective data states is stored. A slope of a straight line fit of data points is then obtained. Each data point can include one of the verify levels and a corresponding one of the counts. An optimal step size is determined based on the slope. The counts may exclude one or more initial program voltages while the cells are programmed sufficiently to allow faster and slower cells to be distinguished, e.g., in a natural threshold voltage distribution. An erase depth can also be adjusted. The cells can be programmed in a separate evaluation or during programming of user data.
摘要:
In a nonvolatile memory, hybrid blocks are initially written with only lower page data. The hybrid blocks later have middle and upper page data written. For high speed writes, data is written to a hybrid block and two or more Single Level Cell (SLC) blocks. The data from the SLC blocks are copied to the hybrid block at a later time in a folding operation.
摘要:
A sense amplifier provides a state-dependent lockout to limit sensing to those bit lines that target a currently selected state for sensing. A sense amplifier scans program data prior to sensing at the verify levels corresponding to a plurality of states. When program data matches a currently selected state, the sense amplifier senses the bit line voltage during verification and writes the result to a data latch. The sense amplifier may write the result to a data latch for storing quick pass write data, in response to sensing at a low verify level for the selected state for example. When program data does not match the currently selected state, the sense amplifier skips sensing for the bit line. The sense amplifier locks out the bit line prior to sensing based on the program data.
摘要:
Techniques are provided for efficiently performing programming operations in a memory device. In particular, power consumption is reduced in sensing circuitry by avoiding pre-charging of bit lines for certain memory cells at certain times during a programming operation. One approach uses knowledge of the different phases of a programming operation to reduce the number of unnecessary bit line pre-charges. For example, during the lower program loop numbers of a programming operation, bit line pre-charging may occur for lower data states but not for higher data states. Similarly, during the higher program loop numbers, bit line pre-charging may occur for higher data states but not for lower data states. In another approach, which may or may not incorporate knowledge of the different phases of a programming operation, the setting of the bit line pre-charge can be updated at least once after it is initially set in the verify portion.
摘要:
In a programming operation of a 3D stacked non-volatile memory device, an initial set of memory cells on a selected word line layer, involving fewer than all memory cells on a selected word line layer, are programmed first as a test case to determine optimal conditions for programming the remaining memory cells on the selected word line layer. For example, a number of program-verify iterations or loops which are needed to program the initial set of memory cells an initial amount is determined. This loop count is then stored, e.g., within the initial set of memory cells, within the remaining memory cells, within memory cells on a remaining word line layer, or in a data register, and programming of the initial set of memory cells continues to completion. Subsequently, the loop count is retrieved and used to determine an optimal starting program voltage for programming the remaining memory cells.
摘要:
A storage module and method for scheduling memory operations for peak-power management and balancing are provided. In one embodiment, a storage module maintains a count of time slots over a period of time. The period of time corresponds to an amount of time between periodic power peaks of a memory operation. For each time slot, the storage module determines whether to commence a memory operation on one or more of the plurality of memory dies based on whether a power peak generated in the time slot by the memory operation would exceed a power threshold allowed for the time slot. Other embodiments are provided.
摘要:
A non-volatile memory system mitigates the effects of open block reading by analyzing the un-programmed region of a block before programming to determine a potential for read disturbance. The system may determine a read count value associated with open block reading of the memory block and/or perform partial block erase verification. To mitigate the effects of open block read disturbance, the system performs partial block erase for the un-programmed region of the memory block and/or limits programming in the un-programmed region.
摘要:
A non-volatile memory includes an data latch structure for programming bit lines using at least three programming levels. A sense amplifier includes a first data latch for controlling the voltage of a corresponding bit line, and a second static data latch with scan circuitry for performing logic operations on the program data and sense results. The sense amplifier scans low verify sense results with program data to generate reduced programming data. The reduced programming data is transferred out of the first data latch after sensing for all states and the program data is scanned to generate program enable/inhibit data which is stored in the first data latch. After setting the bit line to a program inhibit or program enable level, the reduced programming data is transferred back to the first data latch. The bit lines for reduced programming are then adjusted to the reduced programming level.
摘要:
A group of memory cells of a nonvolatile memory is programmed in parallel in a programming pass with a minimum of verify steps from an erased state to respective target states by a staircase waveform. The memory states are demarcated by a set of increasing demarcation threshold values (V1, . . . , VN). Initially in the programming pass, the memory cells are verified relative to a test reference threshold value. This test reference threshold has a value offset past a designate demarcation threshold value Vi among the set by a predetermined margin. The overshoot of each memory cell when programmed past Vi, to be more or less than the margin can be determined. Accordingly, memory cells found to have an overshoot more than the margin are counteracted by having their programming rate slowed down in a subsequent portion of the programming pass so as to maintain a tighter threshold distribution.
摘要:
In a nonvolatile memory, hybrid blocks are initially written with only lower page data. The hybrid blocks later have middle and upper page data written. For high speed writes, data is written to a hybrid block and two or more Single Level Cell (SLC) blocks. The data from the SLC blocks are copied to the hybrid block at a later time in a folding operation.