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公开(公告)号:US10026488B2
公开(公告)日:2018-07-17
申请号:US15240188
申请日:2016-08-18
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Phil Reusswig , Joanna Lai , Deepak Raghu , Grishma Shah , Nian Niles Yang
Abstract: A non-volatile memory system includes technology for detecting read disturb in open blocks. In one embodiment, the system determines whether a particular block of non-volatile memory cells has been subjected to a minimum number of open block read operations and performs sensing operations for memory cells connected to an open word line of the particular block. The number of errors in the sensed data is determined. If the number of errors is greater than a limit, then the system takes an action to mitigate the read disturb.
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公开(公告)号:US11211132B2
公开(公告)日:2021-12-28
申请号:US16803366
申请日:2020-02-27
Applicant: SanDisk Technologies LLC
Inventor: Piyush A. Dhotre , Sahil Sharma , Niles Yang , Phil Reusswig
Abstract: A memory apparatus and method of operation is provided. The apparatus includes a plurality of memory cells coupled to a control circuit. The control circuit is configured to receive data indicating a data state for each memory cell of a set of memory cells of the plurality of memory cells and program, in multiple programming loops, the set of memory cells according to the data indicating the data state for each memory cell of the set of memory cells. The control circuit is further configured to determine that the programming of the set of memory cells is in a last programming loop of the multiple programming loops and in response to the determination, receive data indicating a data state for each memory cell of another set of memory cells of the plurality of memory cells.
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公开(公告)号:US09672940B1
公开(公告)日:2017-06-06
申请号:US15240370
申请日:2016-08-18
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Phil Reusswig , Nian Niles Yang , Grishma Shah
CPC classification number: G11C16/10 , G11C7/04 , G11C11/5628 , G11C11/5642 , G11C16/26 , G11C16/32 , G11C16/3459 , G11C2029/0411 , G11C2211/5621
Abstract: In response to a request to read data, the non-volatile memory system identifies the physical block that is storing the requested data. Read parameters associated with the physical block are also identified. The read parameters include bit error rate information. The memory system chooses whether to use a read process with a faster sense time or a read process with a slower sense time based on the bit error rate information and temperature data. The requested data is read from the identified physical block using the chosen read process configured by at least a subset of the read parameters.
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公开(公告)号:US20210183450A1
公开(公告)日:2021-06-17
申请号:US16710526
申请日:2019-12-11
Applicant: SanDisk Technologies LLC
Inventor: Sahil Sharma , Phil Reusswig , Rohit Sehgal , Piyush A. Dhotre , Niles Yang
Abstract: A method of operating a storage device, including; performing, by a non-volatile memory, an erase operation on a block of memory in the non-volatile memory, where the non-volatile memory is coupled to a controller; receiving, by the non-volatile memory, a host-transaction within a first time period, where, the non-volatile memory is coupled to a host device; and suspending, by the non-volatile memory, an erase operation in response to receiving the host-transaction by: determining the erase operation has completed a charge phase; and suspending the erase operation during a pulse phase of the erase operation. The method additionally includes the non-volatile memory maintaining a loop counter and a pulse counter, where: the loop counter increments in response to completion of an erase loop, and the pulse counter increments in response to completion of an erase pulse, where the erase pulse is applied during a pulse phase of the erase operation.
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公开(公告)号:US20210272639A1
公开(公告)日:2021-09-02
申请号:US16803366
申请日:2020-02-27
Applicant: SanDisk Technologies LLC
Inventor: Piyush A. Dhotre , Sahil Sharma , Niles Yang , Phil Reusswig
Abstract: A memory apparatus and method of operation is provided. The apparatus includes a plurality of memory cells coupled to a control circuit. The control circuit is configured to receive data indicating a data state for each memory cell of a set of memory cells of the plurality of memory cells and program, in multiple programming loops, the set of memory cells according to the data indicating the data state for each memory cell of the set of memory cells. The control circuit is further configured to determine that the programming of the set of memory cells is in a last programming loop of the multiple programming loops and in response to the determination, receive data indicating a data state for each memory cell of another set of memory cells of the plurality of memory cells.
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公开(公告)号:US11081187B2
公开(公告)日:2021-08-03
申请号:US16710526
申请日:2019-12-11
Applicant: SanDisk Technologies LLC
Inventor: Sahil Sharma , Phil Reusswig , Rohit Sehgal , Piyush A. Dhotre , Niles Yang
Abstract: A method of operating a storage device, including; performing, by a non-volatile memory, an erase operation on a block of memory in the non-volatile memory, where the non-volatile memory is coupled to a controller; receiving, by the non-volatile memory, a host-transaction within a first time period, where, the non-volatile memory is coupled to a host device; and suspending, by the non-volatile memory, an erase operation in response to receiving the host-transaction by: determining the erase operation has completed a charge phase; and suspending the erase operation during a pulse phase of the erase operation. The method additionally includes the non-volatile memory maintaining a loop counter and a pulse counter, where: the loop counter increments in response to completion of an erase loop, and the pulse counter increments in response to completion of an erase pulse, where the erase pulse is applied during a pulse phase of the erase operation.
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公开(公告)号:US10714169B1
公开(公告)日:2020-07-14
申请号:US16437355
申请日:2019-06-11
Applicant: SanDisk Technologies LLC
Inventor: Phil Reusswig , Pitamber Shukla , Sarath Puthenthermadam , Mohan Dunga , Sahil Sharma , Rohit Sehgal , Niles Yang
Abstract: A non-volatile memory system and corresponding method of operation are provided. The system includes non-volatile memory cells, each retaining a threshold voltage within a threshold window. The non-volatile memory cells include multi-bit cells each configured to store a plurality of bits of data with the threshold window partitioned into bands each having a band width. The bands include a lowest band denoting an erased state and increasing bands. A control circuit programs a first set of the data into the multi-bit cells in a single-bit mode using first target states being one of the erased state and a tight intermediate state having a distribution of the threshold voltage no wider than the band width of one of the increasing bands. The control circuit also programs a second set of the data into the multi-bit cells in a multi-bit mode with each of the multi-bit cells storing the plurality of bits.
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公开(公告)号:US20180053562A1
公开(公告)日:2018-02-22
申请号:US15240188
申请日:2016-08-18
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Phil Reusswig , Joanna Lai , Deepak Raghu , Grishma Shah , Nian Niles Yang
CPC classification number: G11C16/3431 , G06F11/1068 , G11C11/5642 , G11C16/0483 , G11C16/26 , G11C16/3427 , G11C29/021 , G11C29/028 , G11C29/50004 , G11C29/52 , G11C2029/0409
Abstract: A non-volatile memory system includes technology for detecting read disturb in open blocks. In one embodiment, the system determines whether a particular block of non-volatile memory cells has been subjected to a minimum number of open block read operations and performs sensing operations for memory cells connected to an open word line of the particular block. The number of errors in the sensed data is determined. If the number of errors is greater than a limit, then the system takes an action to mitigate the read disturb.
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公开(公告)号:US09811267B1
公开(公告)日:2017-11-07
申请号:US15294313
申请日:2016-10-14
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Nian Niles Yang , Grishma Shah , Phil Reusswig , Dmitry Vaysman
IPC: G06F3/06
CPC classification number: G06F3/061 , G06F1/206 , G06F3/0655 , G06F3/0688 , G11C7/04 , G11C16/0483 , G11C16/10 , G11C16/26 , G11C16/3418 , G11C16/3459 , H01L27/11582
Abstract: A non-volatile storage apparatus comprises a controller, one or more memory packages, a system temperature sensor, and one or more memory temperature sensors. The system temperature sensor is located at or on the controller. Each of the one or more memory temperature sensors are positioned at one of the one or more memory packages. The controller monitors system temperature using the system temperature sensor. If the system temperature is above a first threshold, then temperature is sensed at the memory packages using the one or more memory temperature sensors. Individual memory packages have their performance throttled if their temperature exceeds a second threshold.
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