摘要:
A random access memory comprises a semiconductor body of one conductivity type, at least one first well region of an opposite conductivity type formed in the surface area of the semiconductor body, and a memory cell array having a plurality of memory cells formed in the first well region. A peripheral circuit for driving the memory cell array is formed in at least one second well region of the opposite conductivity type formed separately from the first well region in the surface area of the semiconductor body. The second well region is set at a bias level deeper than the first well region.
摘要:
A semiconductor integrated circuit having a memory and an adjacent peripheral circuit generating minority carriers which can destroy data in a portion of the memory at low temperatures. The load resistance in the portion is made lower or the storage capacity is made higher in the portion than in the remainder of the memory so that at low temperatures data is not lost and the energy consumption of the circuit is not unduly increased.
摘要:
An MOS transistor circuit contains at least one "zero" threshold mode transistor to provide a power-down function for the circuit. The "zero" threshold mode transistor is connected between an enhancement-mode MOS driver transistor and a depletion-mode MOS load transistor.
摘要:
An integrated circuit serving as an E/D type inverter circuit and provided with a gate-protection circuit. The inverter circuit is constructed of an E type MOSFET having a gate coupled to an input signal and a D type MOSFET which operates as load, and the gate-protective circuit is constructed by a MOSFET which is connected between a power supply and the D type MOSFET and whose gate is connected to the power supply. The gate of the D type MOSFET is protected by the gate-protection circuit even if noise exists on the power supply line.
摘要:
A semiconductor circuit has a static bootstrap circuit, which includes a first MOS transistor with an input signal supplied to the gate and having the current path connected between a voltage source terminal and a node, a second MOS transistor having the gate connected to receive an inverted form of the input signal after a delay time and having the current path connected between the node and a reference potential terminal and a capacitor connected between the gate of the first MOS transistor and the node. The semiconductor circuit also has a short pulse generator. The bootstrap circuit further includes a third MOS transistor having the current path connected between the output terminal of the short pulse generator and the node and with the input signal supplied to the gate and fourth and fifth MOS transistors having the respective gates connected to the gates of the first and second MOS transistors and the respective current paths connected in series between the voltage source terminal and reference potential terminal.
摘要:
A semiconductor device having a semiconductor substrate, wherein first and second insulating gate FET transistor connected respectively in series with first and second polycrystalline silicon layers acting as loads of first and second inverters are formed. The first polycrystalline silicon layer is provided above the drain of the first insulation gate FET transistor, and the second polycrystalline silicon layer is provided above the drain of the second insulation gate FET transistor.
摘要:
A semiconductor device having a pair of wiring layers connected in parallel with each other in which a first wiring layer is formed over a semiconductor substrate through a insulation layer. The first wiring layer is made of poly-Si and has relatively high resistivity. Therefore a second wiring layer is formed over the first wiring layer through an insulation layer. A portion of the second wiring layer has low conductivity and is parallel connected to the first wiring layer in order to reduce the resistivity of the wiring layer. Another portion of the second wiring layer has low conductivity and is used as resistive means.
摘要:
A redundancy circuit for a semiconductor memory device of the byte configuration type, in which data is read out for each bit, is comprised of a main memory having a plurality of main memory cells arrayed in a matrix fashion, the matrix array being divided into memory sections in the column direction; a spare memory for saving defective memory cells contained in the main memory, the spare memory comprising spare rows of a plurality of spare memory cells arranged in the row direction, the spare row being provided for each of the main memory sections; programmable spare row decoders provided for each row of spare memory cells and for independently selecting each row of the spare memory cell; and main-decoder-disable signal-generating circuits provided for each of the memory sections and for placing all of the row main decoders of the corresponding memory section in non-select state in response to a signal derived from the programmed spare row decoder of the corresponding memory section.
摘要:
A semiconductor device having a semiconductor substrate, wherein first and second insulating gate FET transistor connected, respectively, in series with first and second polycrystalline silicon layers acting as loads of first and second inverters are formed. The first polycrystalline silicon layer is provided above a gate electrode of the second insulation gate FET transistor, and the second polycrystalline silicon layer is provided above a gate electrode of the first insulation gate FET transistor.
摘要:
A semiconductor circuit has first and second MOS transistors which are connected between an output terminal and a positive and a reference power source terminal, respectively, a bootstrap capacitor connected between the output terminal and the gate of the first MOS transistor, an inverter which inverts the input signal and which supplies the inverted signal to the gate of the second MOS transistor after a predetermined delay timne, and a switching MOS transistor having a current path connected between the input terminal and the gate of the first MOS transistor. The switching MOS transistor has a threshold voltage greater than that of the second MOS transistor.