公开(公告)号：US20130026385A1

公开(公告)日：2013-01-31

申请号：US13196778

申请日：2011-08-02

申请人： Dieter WINKLER ,  Stefan LANIO

发明人： Dieter WINKLER ,  Stefan LANIO

IPC分类号： H01J3/14 ,  H01S4/00

CPC分类号： H01J37/09 ,  H01J2237/0206 ,  H01J2237/026 ,  H01J2237/28

摘要： A shielding member for a charged particle beam apparatus includes a conductive substrate; and a through hole extending through the conductive substrate. The conductive substrate is comprised of a material having a specific electrical resistivity in a range from about 106 Ωcm to about 1012 Ωcm.

摘要翻译： 带电粒子束装置的屏蔽构件包括导电基板; 以及延伸穿过导电基板的通孔。 导电衬底由具有约106Ω-cm至约1012Ω-cm范围内的特定电阻率的材料组成。

公开(公告)号：US20110089322A1

公开(公告)日：2011-04-21

申请号：US12579869

申请日：2009-10-15

申请人： Gerald SCHOENECKER ,  Stefan LANIO

发明人： Gerald SCHOENECKER ,  Stefan LANIO

IPC分类号： G01N23/00 ,  H01J1/50 ,  H01J37/28

CPC分类号： H01J37/1472 ,  H01J2237/1508 ,  H01J2237/153

摘要： An achromatic beam separator device for separating a primary charged particle beam from another charged particle beam and providing the primary charged particle beam on an optical axis (142) is provided, including a primary charged particle beam inlet (134), a primary charged particle beam outlet (132) encompassing the optical axis, a magnetic deflection element (163) adapted to generate a magnetic field, and an electrostatic deflection element (165) adapted to generate an electric field overlapping the magnetic field, wherein at least one element chosen from the electrostatic deflection element and the magnetic deflection element is positioned and/or positionable to compensate an octopole influence.

摘要翻译： 提供了一种消色差束分离器装置，用于将初级带电粒子束与另一带电粒子束分离并在光轴（142）上提供初级带电粒子束，包括初级带电粒子束入口（134），初级带电粒子束 包括光轴的出口（132），适于产生磁场的磁偏转元件（163）和适于产生与磁场重叠的电场的静电偏转元件（165），其中，从 静电偏转元件和磁偏转元件被定位和/或定位以补偿八极杆的影响。

公开(公告)号：US20120091359A1

公开(公告)日：2012-04-19

申请号：US12910240

申请日：2010-10-22

申请人： Stefan LANIO ,  Jürgen FROSIEN

发明人： Stefan LANIO ,  Jürgen FROSIEN

IPC分类号： H01J3/14

CPC分类号： H01J37/063 ,  H01J37/06 ,  H01J37/08 ,  H01J37/09 ,  H01J37/16 ,  H01J2237/06375

摘要： An emitter assembly for emitting a charged particle beam along an optical axis is described. The emitter assembly being housed in a gun chamber and includes an emitter having an emitter tip, wherein the emitter tip is positioned at a first plane perpendicular to the optical axis and wherein the emitter is configured to be biased to a first potential, an extractor having an opening, wherein the opening is positioned at a second plane perpendicular to the optical axis and wherein the extractor is configured to be biased to a second potential, wherein the second plane has a first distance from the first plane of 2.25 mm and above.

摘要翻译： 描述了用于沿光轴发射带电粒子束的发射器组件。 发射器组件被容纳在枪室中并且包括具有发射极尖端的发射器，其中发射极尖端位于垂直于光轴的第一平面处，并且其中发射器被配置为偏置到第一电位，提取器具有 开口，其中所述开口定位在垂直于所述光轴的第二平面处，并且其中所述提取器构造成被偏置到第二电位，其中所述第二平面具有距离所述第一平面2.25mm及以上的第一距离。

公开(公告)号：US20120037813A1

公开(公告)日：2012-02-16

申请号：US12856152

申请日：2010-08-13

申请人： Stefan LANIO

发明人： Stefan LANIO

IPC分类号： H01J3/22

CPC分类号： H01J37/141 ,  H01J2237/0453 ,  H01J2237/04922 ,  H01J2237/141

摘要： A lens system for a plurality of charged particle beams comprises a lens body with a first pole piece, a second pole piece and a plurality of lens openings for the respective charged particle beams; a common excitation coil arranged around the plurality of lens openings for providing a respective first magnetic flux to the lens openings; and a compensation coil arranged between the lens openings for providing a respective second magnetic flux to at least some of the lens openings so as to compensate for an asymmetry of the first magnetic flux.

摘要翻译： 用于多个带电粒子束的透镜系统包括具有第一极靴，第二极靴和用于各个带电粒子束的多个透镜开口的透镜体; 布置在所述多个透镜开口周围的公共激励线圈，用于向所述透镜开口提供相应的第一磁通量; 以及补偿线圈，布置在透镜开口之间，用于向至少一些透镜开口提供相应的第二磁通量，以便补偿第一磁通量的不对称性。

公开(公告)号：US20150021474A1

公开(公告)日：2015-01-22

申请号：US13960393

申请日：2013-08-06

申请人： Matthias FIRNKES ,  Stefan LANIO ,  Gerald SCHÖNECKER ,  Dieter WINKLER

发明人： Matthias FIRNKES ,  Stefan LANIO ,  Gerald SCHÖNECKER ,  Dieter WINKLER

IPC分类号： H01J37/21 ,  H01J37/147 ,  H01J37/10

CPC分类号： H01J37/21 ,  H01J37/10 ,  H01J37/147 ,  H01J37/244 ,  H01J2237/24592

摘要： A secondary charged particle detection device for detection of a signal beam is described. The device includes a detector arrangement having at least two detection elements with active detection areas, wherein the active detection areas are separated by a gap (G), a particle optics configured for separating the signal beam into a first portion of the signal beam and into at least one second portion of the signal beam, and configured for focusing the first portion of the signal beam and the at least one second portion of the signal beam. The particle optics includes an aperture plate and at least a first inner aperture openings in the aperture plate, and at least one second radially outer aperture opening in the aperture plate, wherein the first aperture opening has a concave shaped portion, particularly wherein the first aperture opening has a pincushion shape.

摘要翻译： 描述了用于检测信号光束的二次带电粒子检测装置。 该装置包括具有至少两个具有主动检测区域的检测元件的检测器装置，其中主动检测区域由间隙（G）分开，粒子光学器件被配置用于将信号光束分离成信号光束的第一部分并进入 信号光束的至少一个第二部分，并且被配置为聚焦信号光束的第一部分和信号光束的至少一个第二部分。 颗粒光学器件包括孔板和孔板中的至少第一内孔开口和孔板中的至少一个第二径向外孔开口，其中第一孔口具有凹形部分，特别地其中第一孔 开口有枕形。

公开(公告)号：US20130270438A1

公开(公告)日：2013-10-17

申请号：US13543593

申请日：2012-07-06

申请人： Stefan LANIO ,  Gerald Schönecker ,  Dieter Winkler

发明人： Stefan LANIO ,  Gerald Schönecker ,  Dieter Winkler

IPC分类号： H01J37/244 ,  H01J37/21

CPC分类号： H01J37/09 ,  H01J37/147 ,  H01J37/244 ,  H01J2237/0453 ,  H01J2237/04756 ,  H01J2237/24465 ,  H01J2237/24592 ,  H01J2237/2817

摘要： A secondary charged particle detection device for detection of a signal beam is described. The device includes a detector arrangement having at least two detection elements with active detection areas, wherein the active detection areas are separated by a gap (G), a particle optics configured for separating the signal beam into a first portion of the signal beam and into at least one second portion of the signal beam, and configured for focusing the first portion of the signal beam and the at least one second portion of the signal beam. The particle optics includes an aperture plate and at least a first inner aperture openings in the aperture plate, and at least one second radially outer aperture opening in the aperture plate, wherein the aperture plate is configured to be biased to one potential surrounding the first inner aperture opening and the at least one outer aperture opening.

摘要翻译： 描述了用于检测信号光束的二次带电粒子检测装置。 该装置包括具有至少两个具有主动检测区域的检测元件的检测器装置，其中主动检测区域由间隙（G）分开，粒子光学器件被配置用于将信号光束分离成信号光束的第一部分并进入 信号光束的至少一个第二部分，并且被配置为聚焦信号光束的第一部分和信号光束的至少一个第二部分。 颗粒光学器件包括孔板和孔板中的至少第一内孔开口和孔板中的至少一个第二径向外孔开口，其中孔板被配置为偏置到围绕第一内孔的一个电位 孔开口和至少一个外孔开口。

公开(公告)号：US20110272577A1

公开(公告)日：2011-11-10

申请号：US12776980

申请日：2010-05-10

申请人： Stefan LANIO ,  Gerald SCHOENECKER

发明人： Stefan LANIO ,  Gerald SCHOENECKER

IPC分类号： H01J37/147 ,  H01J3/26 ,  H01J37/28

CPC分类号： H01J37/28 ,  H01J37/1471 ,  H01J37/153 ,  H01J2237/1523 ,  H01J2237/1534 ,  H01J2237/244

摘要： An electron beam device comprises: a beam emitter for emitting a primary electron beam; an objective electron lens for focusing the primary electron beam onto a specimen, the objective lens defining an optical axis; a beam separator having a first dispersion for separating a signal electron beam from the primary electron beam; and a dispersion compensation element. The dispersion compensation element has a second dispersion, the dispersion compensation element being adapted for adjusting the second dispersion independently of an inclination angle of the primary beam downstream of the dispersion compensation element, such that the second dispersion substantially compensates the first dispersion. The dispersion compensation element is arranged upstream, along the primary electron beam, of the beam separator.

摘要翻译： 电子束装置包括：用于发射一次电子束的射束发射器; 用于将一次电子束聚焦到样本上的目标电子透镜，物镜限定光轴; 具有用于从一次电子束分离信号电子束的第一色散的光束分离器; 和色散补偿元件。 色散补偿元件具有第二色散，色散补偿元件适用于独立于色散补偿元件下游的主光束的倾斜角而调节第二色散，使得第二色散基本上补偿第一色散。 色散补偿元件沿着一级电子束布置在分束器的上游。