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公开(公告)号:US20170279036A1
公开(公告)日:2017-09-28
申请号:US15080569
申请日:2016-03-24
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Chieh Mo , Shih-Chi Kuo , Tsung-Hsien Lee , Wu-An Weng , Chung-Yu Lin
Abstract: MRAM devices and methods of forming the same are provided. One of the MRAM devices includes a dielectric layer, a resistance variable memory cell and a conductive layer. The dielectric layer is over a substrate and has an opening. The resistance variable memory cell is in the opening and includes a first electrode, a second electrode and a magnetic tunnel junction layer between the first electrode and the second electrode. The conductive layer fills a remaining portion of the opening and is electrically connected to one of the first electrode and the second electrode of the resistance variable memory cell.
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公开(公告)号:US11961745B2
公开(公告)日:2024-04-16
申请号:US17866908
申请日:2022-07-18
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor: Chung-Yu Lin , Shih-Chi Kuo , Chun-Chieh Mo
IPC: H01L21/02 , H01L21/67 , H01L21/673 , H01L21/687
CPC classification number: H01L21/67057 , H01L21/02052 , H01L21/67086 , H01L21/6733 , H01L21/68742 , H01L21/68764
Abstract: The present disclosure describes an apparatus for processing one or more objects. The apparatus includes a carrier configured to hold the one or more objects, a tank filled with a processing agent and configured to receive the carrier, and a spinning portion configured to contact the one or more objects and to spin the one or more objects to disturb a flow field of the processing agent.
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公开(公告)号:US11309347B2
公开(公告)日:2022-04-19
申请号:US16788145
申请日:2020-02-11
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Wei Hsu , Tsai-Hao Hung , Chung-Yu Lin , Ying-Hsun Chen
IPC: H01L27/146 , H01L31/18 , H01L31/028 , H01L31/0236 , H01L31/0232 , H01L31/0304 , H01L31/032 , H01L31/0296
Abstract: An integrated circuit includes a photodetector. The photodetector includes one or more dielectric structures positioned in a trench in a semiconductor substrate. The photodetector includes a photosensitive material positioned in the trench and covering the one or more dielectric structures. A dielectric layer covers the photosensitive material. The photosensitive material has an index of refraction that is greater than the indices of refraction of the dielectric structures and the dielectric layer.
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公开(公告)号:US12074041B2
公开(公告)日:2024-08-27
申请号:US16413275
申请日:2019-05-15
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chung-Yu Lin , Shih-Chi Kuo , Chun-Chieh Mo
IPC: H01L21/67 , H01L21/02 , H01L21/673 , H01L21/687
CPC classification number: H01L21/67057 , H01L21/02052 , H01L21/67086 , H01L21/6733 , H01L21/68742 , H01L21/68764
Abstract: The present disclosure describes an apparatus for processing one or more objects. The apparatus includes a carrier configured to hold the one or more objects, a tank filled with a processing agent and configured to receive the carrier, and a spinning portion configured to contact the one or more objects and to spin the one or more objects to disturb a flow field of the processing agent.
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公开(公告)号:US11923396B2
公开(公告)日:2024-03-05
申请号:US17723127
申请日:2022-04-18
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Wei Hsu , Tsai-Hao Hung , Chung-Yu Lin , Ying-Hsun Chen
IPC: H01L27/146 , H01L31/0232 , H01L31/0236 , H01L31/028 , H01L31/18 , H01L31/0296 , H01L31/0304 , H01L31/032
CPC classification number: H01L27/14643 , H01L27/14627 , H01L27/1463 , H01L27/14685 , H01L31/02327 , H01L31/02363 , H01L31/028 , H01L31/1804 , H01L27/14612 , H01L27/14636 , H01L31/02966 , H01L31/03046 , H01L31/0324 , H01L31/1808 , H01L31/1812 , H01L31/1832 , H01L31/1844
Abstract: An integrated circuit includes a photodetector. The photodetector includes one or more dielectric structures positioned in a trench in a semiconductor substrate. The photodetector includes a photosensitive material positioned in the trench and covering the one or more dielectric structures. A dielectric layer covers the photosensitive material. The photosensitive material has an index of refraction that is greater than the indices of refraction of the dielectric structures and the dielectric layer.
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公开(公告)号:US09972771B2
公开(公告)日:2018-05-15
申请号:US15080569
申请日:2016-03-24
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Chun-Chieh Mo , Shih-Chi Kuo , Tsung-Hsien Lee , Wu-An Weng , Chung-Yu Lin
Abstract: MRAM devices and methods of forming the same are provided. One of the MRAM devices includes a dielectric layer, a resistance variable memory cell and a conductive layer. The dielectric layer is over a substrate and has an opening. The resistance variable memory cell is in the opening and includes a first electrode, a second electrode and a magnetic tunnel junction layer between the first electrode and the second electrode. The conductive layer fills a remaining portion of the opening and is electrically connected to one of the first electrode and the second electrode of the resistance variable memory cell.
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