Semiconductor device with a wiring board having an angled linear part
    1.
    发明授权
    Semiconductor device with a wiring board having an angled linear part 失效
    具有布线板的半导体器件具有成角度的线性部分

    公开(公告)号:US08022305B2

    公开(公告)日:2011-09-20

    申请号:US12428860

    申请日:2009-04-23

    IPC分类号: H05K1/00

    摘要: A semiconductor device fabrication method includes: forming an elongated hole 5 in a wiring board plate along a perimeter line 3 of a plurality of wiring board regions defined over the wiring board plate with a connecting portion left unremoved at a corner of each of the wiring board regions; mounting semiconductor elements on the wiring board regions; and cutting the connecting portion using a punch 8 to isolate the wiring board regions from the wiring board plate into wiring boards. Each of the wiring boards has a cut edge formed by the punch, the cut edge starting from an end of the elongated hole 5 provided on a first side of the perimeter line 3 and extending across part of the connecting portion inside the perimeter line 3, the cut edge being angled inward of the wiring board so as to slope downward from the end of the elongated hole 5.

    摘要翻译: 半导体器件制造方法包括:沿着布线板板上限定的多个布线板区域的周边线3在布线板板上形成细长孔5,其中连接部分在左边未被移除在每个布线板的拐角处 区域; 将半导体元件安装在布线板区域上; 并使用冲头8切割连接部分,以将布线板区域与布线板板隔离成线路板。 每个布线板具有由冲头形成的切割边缘,切割边缘从设置在周边线3的第一侧上的细长孔5的端部开始并延伸穿过周边线3内的连接部分的一部分, 切割边缘从布线板向内倾斜,从而从细长孔5的端部向下倾斜。

    Semiconductor device
    3.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US08330266B2

    公开(公告)日:2012-12-11

    申请号:US12721067

    申请日:2010-03-10

    申请人: Takashi Yui

    发明人: Takashi Yui

    IPC分类号: H01L23/52

    摘要: A semiconductor device includes: a first semiconductor device including an interconnect substrate having a cavity structure and a semiconductor element mounted on a bottom part of the cavity structure; and a second semiconductor device provided on and connected to the first semiconductor device via connection terminals. A sealing material is provided between the first semiconductor device and the second semiconductor device. A sloped portion is formed, at a corner portion at which the bottom part and a side wall of the cavity structure in the first semiconductor device meets, to be sloped toward a center part of the cavity structure and have a tapered shape which becomes continuously wider in the direction from an upper part to a lower part.

    摘要翻译: 半导体器件包括:第一半导体器件,包括具有腔结构的互连衬底和安装在腔结构的底部上的半导体元件; 以及经由连接端子设置并连接到第一半导体器件的第二半导体器件。 在第一半导体器件和第二半导体器件之间提供密封材料。 在第一半导体器件中的空腔结构的底部和侧壁相交的角部形成倾斜部,朝向空腔结构的中心部倾斜,并且具有逐渐变宽的锥形形状 在从上部到下部的方向上。

    Semiconductor device
    5.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US07298043B2

    公开(公告)日:2007-11-20

    申请号:US11375134

    申请日:2006-03-15

    申请人: Takashi Yui

    发明人: Takashi Yui

    IPC分类号: H01L23/367

    摘要: A semiconductor device having a wiring substrate, a semiconductor element mounted on the wiring substrate via a heat sink, a wire electrically connecting the wiring substrate and the semiconductor element, the wiring substrate having through holes each connected to the wire or the heat sink, and external electrodes formed on a back surface of the wiring substrate and connected to the through holes. An insulating layer is formed between the heat sink and the semiconductor element, and the heat sink is divided into at least two sections. Hence, the back surface of the semiconductor element maintains an electrically disconnected state irrespective of the potential of the heat sink, and the heat dissipation design is allowed greater flexibility. Thus, the external electrodes connected to the heat sink via the through holes are connected to the mounting substrate wirings having satisfactory heat dissipation efficiency, allowing the heat of the semiconductor element to escape efficiently.

    摘要翻译: 一种具有布线基板的半导体器件,经由散热器安装在布线基板上的半导体元件,将布线基板与半导体元件电连接的布线,具有各自与导线或散热片连接的通孔的布线基板,以及 外部电极形成在布线基板的背面并与通孔连接。 在散热片和半导体元件之间形成绝缘层,将散热片分成至少两个部分。 因此,与散热器的电位无关地,半导体元件的背面保持电断开状态,并且允许散热设计更大的灵活性。 因此,通过通孔连接到散热器的外部电极与具有令人满意的散热效率的安装基板布线连接,从而使半导体元件的热量有效地逸出。

    Semiconductor wafer, method of manufacturing the same and semiconductor device
    8.
    发明授权
    Semiconductor wafer, method of manufacturing the same and semiconductor device 有权
    半导体晶片及其制造方法以及半导体器件

    公开(公告)号:US07964475B2

    公开(公告)日:2011-06-21

    申请号:US11951441

    申请日:2007-12-06

    IPC分类号: H01L27/00 H01L21/82

    CPC分类号: H01L21/78

    摘要: A modified layer 5 and an altered layer 8 are formed outside a dicing point of a dicing area 3. Thus without forming another interface between different physical properties on the dicing point, it is possible to prevent chipping from progressing along a crystal orientation from an interface between a semiconductor element 2 and a semiconductor substrate 1 and from a surface of the semiconductor element during dicing, thereby suppressing the development of chipping to the semiconductor element.

    摘要翻译: 在切割区域3的切割点的外侧形成改质层5和改质层8.因此,在切割点的不同物理性质之间不形成另一界面,可以防止从界面 在半导体元件2和半导体基板1之间以及在切割期间从半导体元件的表面,从而抑制了对半导体元件的切屑的发展。