摘要:
A high performance CMOS comparator circuit is integrated with a bypass function allowing comparing first and second data sets (A & B) with a high data width (more than 30 and illustrated as 48 bits). In many cases, it is often required to compare not only sets A&B but also set A with an additional bypass set, and the preferred circuit embodiment permits this to be achieved.
摘要:
A late select circuit topology has pseudo-static circuits that provide fast dynamic circuit operation without the use of dynamic clock timing signals. An output from a selected set is enabled by the conjunction of bit line pulse and set select signal.
摘要:
A sense amplifier for a memory device comprising: a first sensing stage comprising a first sensing device and a second sensing device operably connected to a first sense line and a second sense line respectively, to reduce the capacitive load on the first sense line and second sense line. A source terminal of the sensing device is connected to a switchable current sink with drain terminal thereof connected to an input of a second sensing stage. The sense amplifier also includes a second sensing stage comprising cross-coupled inverters responsive to the first sensing stage, the second sensing stage is activated by a sense enable signal following a selected delay, and an output driver responsive to the second sensing stage.
摘要:
A SRAM sense amplifier timing circuit provides various delay settings for the sense amplifier enable signal (sae) and the sense amplifier reset signal (rse) in order to allow critical timing adjustments to be made for early mode, late mode conditions by varying the timing or with of the sense amplifier output pulse. These timing adjustments are programmable using scan in bits.
摘要:
A programmable Local Clock Buffer has a single inverter between the clock input and the delayed clock output. A transistor switch modulates the single inverter stage between a clock signal transmit state and a non-transmitting state. A combination of delay select bits control the timing of the beginning and ending of the transmit state of the inverter relative to the clock input via the transistor switch.
摘要:
A cache memory high performance pseudo dynamic address compare path divides the address into two or more address segments. Each segment is separately compared in a comparator comprised of static logic elements. The output of each of these static comparators is then combined in a dynamic logic circuit to generate a dynamic late select output.
摘要:
A test circuit and programmable voltage divider that may be used in the test circuit. The programmable voltage divider develops a voltage difference signal that may be digitally selected. The test circuit may be used to test and characterize sense amplifiers. The programmable voltage divider develops a signal with a selected polarity and magnitude that is provided to a sense amplifier being tested. The sense amplifier is set and its output latched. The latch contents are checked against an expected value. The difference voltage may be changed and the path retested to find passing and failing points.
摘要:
A CMOS static random access memory (SRAM) cell array, an integrated chip including the array and a method of accessing cells in the array with improved cell stability. Bit lines connected to half selected cells in the array are floated during cell accesses for improved cell stability.
摘要:
A domino SRAM is provided with active pull-up PFET devices that overwhelm “slow to write but very fast to read” cells and allow the cells to recover from timing mismatch situations. This approach allows the traditional “bit select” clamp to actively control the “local select” through “wired-or” PFET pull-up transistors. Separate read and write global “bit line” pairs allow the read and write performance to be optimized independently.