摘要:
According to one embodiment, a semiconductor device includes a switch element provided in a surface area of a semiconductor substrate, a contact plug with an upper surface and a lower surface, and a function element provided on the upper surface of the contact plug. The lower surface of the contact plug is connected to the switch element. The upper surface of the contact plug has a maximum roughness of 0.2 nm or less.
摘要:
According to one embodiment, a resistance change memory includes resistance change elements, vias and sidewall insulating layers, the elements and the vias provided alternately in a first direction and a second direction orthogonal to the first direction, and the sidewall insulating layers provided on sidewalls of the elements. The elements are provided in a lattice pattern having a constant pitch. A thickness of each of the sidewall insulating layers in a direction orthogonal to the sidewalls is a value for contacting the sidewall insulating layers each other or more to form holes between the sidewall insulating layers. The vias are provided in the holes respectively.
摘要:
According to one embodiment, a semiconductor device includes a semiconductor substrate, a tunnel insulating film on the semiconductor substrate, a first floating gate electrode on the tunnel insulating film, an inter-floating gate insulating film on the first floating gate electrode, a second floating gate electrode on the inter-floating gate insulating film, an inter-electrode insulating film on the second floating gate electrode, and a control gate electrode on the inter-electrode insulating film. The inter-floating gate insulating film includes a main insulating film, and a first fixed charge layer between the main insulating film and the second floating gate electrode and having negative fixed charges.
摘要:
A semiconductor device includes a test target circuit; scan chains that enable scanning of the test target circuit; a first random number generation circuit that forms test patterns supplied to the scan chains; a second random number generation circuit that is provided separately from the first random number generation circuit; and a random number control circuit that uses the random numbers generated by the second random number generation circuit to change the random numbers generated by the first random number generation circuit. In a test of the semiconductor device, since a period of a clock of a scan chain does not need to be longer than that of a clock of a pattern generator, the number of clocks of the pattern generator needed for a test can be prevented from increasing. Accordingly, a test time can be prevented from increasing.
摘要:
According to the present invention, there is provided a semiconductor device comprising: a gate insulating film selectively formed on a predetermined region of a semiconductor substrate; a gate electrode formed on said gate insulating film; and a source region and drain region formed, in a surface portion of said semiconductor substrate, on two sides of a channel region positioned below said gate electrode, wherein a carbon concentration in an interface where said gate insulating film is in contact with said gate electrode is not more than 5×1022 atoms/cm3.
摘要:
A method of manufacturing a semiconductor device having a MOSFET of a first conductivity type and a MOSFET of a second conductivity type different from the first conductivity type formed on a semiconductor substrate, the method has: forming a gate insulating film; forming a first gate electrode layer, and forming a second gate electrode layer; forming a first metal containing layer on said first gate electrode layer and said second gate electrode layer; forming a second metal containing layer for preventing diffusion of a metal on said first metal containing layer; forming a third metal containing layer on said second gate electrode layer from which said first metal containing layer and said second metal containing layer are selectively removed, the third metal containing layer having a thickness different from the thickness of said first metal containing layer in a case where the third metal containing layer contains the same metal or alloy as the metal or alloy contained in said first metal containing layer; and performing a thermal processing, thereby causing reaction between the metal contained in said first metal containing layer and said first gate electrode layer to convert said first gate electrode layer into an alloy and causing reaction between the metal contained in said third metal containing layer and said second gate electrode layer to convert said second gate electrode layer into an alloy, thereby forming gate electrodes of different compositions.
摘要:
A method of forming a pattern comprising the steps of, forming a lower film on a substrate, the lower film being a film containing carbon atom at a ratio of 80 wt % or more, or a vapor phase deposition film, either applying an adhesion-promoting treatment to a surface of the lower film or forming an adhesion-promoting on the lower film, forming an intermediate film on a surface of the lower film, forming a resist film on the intermediate film, forming a resist pattern by conducting a patterning exposure of the resist film, forming an intermediate film pattern by transferring the resist pattern to the intermediate film, and forming a lower film pattern by transferring the intermediate film pattern to the lower film.
摘要:
At least one transmitting coil 1 and at least one receiving coil 2 are disposed along the bore axis 18 of a borehole 7 such that these coils are inclined and face each other, thus causing these coils to have directivity for examining electric characteristics of a formation around the borehole. More specifically, a method of and an apparatus for directional induction logging are provided, which permit measurement of the electric conductivity distribution of a formation in the circumferential direction in a range of several meters around the borehole and also imaging reflecting the electric conductivity.
摘要:
A fluorescent glass dosimeter comprises a glass element holder including inner and outer envelopes. Each of the inner and outer envelopes has a mask frame used for covering the peripheral portions of the corresponding fluorescent detection surface of a fluorescent glass element. The fluorescent glass dosimeter further comprises upper and lower cases. The upper case serves as a pivotable lock member and includes a lock portion, the locking condition of which can be released by means of a magnet. The lower case is adapted to receive the glass element holder. The upper and lower cases are engageable with each other at their slide portions. The glass element holder includes an integral index plate havig an identification hole code at a predetermined location. A direction regulating member is provided for the lower case, and a portion engageable with the direction regulating member is provided for the glass element holder. The fluorescent glass holder is positioned as a result of the engagement between the direction regulating member and the engageable portion of the glass element holder. A filter, used for adjusting energy dependency upon a radiation exposure, is located on the inner side of the upper wall of each of the upper and lower cases. A filter, used for adjusting direction dependency upon an incident radiation, is located on the inner side of the side wall of the lower case.
摘要:
A radiation dose measuring system using fluorescent dosemeters comprises fluorescent dosemeters including fluorescent glass elements having a fluorescent detection surface, a magazine capable of holding a predetermined number of fluorescent dosemeters, a magazine conveying device for conveying a magazine of a plurality of magazines fed one by one such that is predetermined segment is located to a take-out position, a fluorescent dosemeter take-out device for taking the fluorescent dosemeter from the magazine located in a predetermined position, a fluorescent glass element setting device for moving the fluorescent glass element to a predetermined measuring position and a dose measuring device for subjecting the fluorescent glass element which is set to a measuring position to an ultraviolet ray and for measuring an intensity of fluorescent light which is emitted from an excited glass element.