Abstract:
A structure including a first semiconductor chip 20 with front and rear surfaces 24, 26 and a cavity 36 in the rear surface. A second semiconductor chip 70 is mounted within the cavity. The first chip 20 may have vias 48 extending from the cavity to the front surface and via conductors 54 within these vias serving to connect the additional microelectronic element 70 to the active elements of the first chip 20. The structure may have a volume comparable to that of the first chip 20 alone and yet provide the functionality of a multi-chip assembly. A composite chip 720 incorporating a body 722 and a layer 702 of semiconductor material mounted on a front surface 724 of the body similarly may have a cavity 736 extending into the body from the rear surface 726 and may have an additional microelectronic element 770 mounted in such cavity 736.
Abstract:
A microelectronic unit 12 includes a substrate 20 and an electrically conductive element 40. The substrate 20 can have a CTE less than 10 ppm/°C, a major surface 21 having a recess 30 not extending through the substrate, and a material 50 having a modulus of elasticity less than 10 GPa disposed within the recess. The electrically conductive element 40 can include a joining portion 42 overlying the recess 30 and extending from an anchor portion 41 supported by the substrate 20. The joining portion 42 can be at least partially exposed at the major surface 21 for connection to a component 14 external to the microelectronic unit 12.
Abstract:
A microelectronic image sensor assembly (10) for backside illumination and method of making same are provided. The assembly (10) includes a microelectronic element (100) having contacts (106) exposed at a front face (102) and light sensing elements (114) arranged to receive light of different wavelengths through a rear face (104). A semiconductor region (110) has an opening (118) overlying at least one of first and second light sensing elements (114a, 114b), the semiconductor region (110) having a first thickness (112a) between the first light sensing element (114a) and the rear face (104) and a second thickness (112b) between the second light sensing element (114b) and the rear face (104). A light-absorbing material (116) overlies the semiconductor region (110) within the opening (118) above at least one of the light sensing elements (114) such that the first and second light sensing elements (114a, 114b) receive light of substantially the same intensity.
Abstract:
A microelectronic unit 12 includes a substrate 20 and an electrically conductive element 40. The substrate 20 can have a CTE less than 10 ppm/°C, a major surface 21 having a recess 30 not extending through the substrate, and a material 50 having a modulus of elasticity less than 10 GPa disposed within the recess. The electrically conductive element 40 can include a joining portion 42 overlying the recess 30 and extending from an anchor portion 41 supported by the substrate 20. The joining portion 42 can be at least partially exposed at the major surface 21 for connection to a component 14 external to the microelectronic unit 12.