RFID DEVICE TESTER AND METHOD
    10.
    发明申请
    RFID DEVICE TESTER AND METHOD 审中-公开
    RFID设备测试仪和方法

    公开(公告)号:WO2004072892A2

    公开(公告)日:2004-08-26

    申请号:PCT/US2004/004227

    申请日:2004-02-13

    IPC: G06K

    Abstract: An RFID device tester includes coupling elements for capacitively coupling a reader to an RFID device to be tested. The reader may power the RFID device by sending an outgoing signal, such as an outgoing AC power signal, which may be rectified and/or reflected by the RFID device, if the RFID device is operating properly. The outgoing signal may have a frequency that is different from the resonant frequency of an antenna of the RFID device. A reader in the RFID device tester detects the reflected and/or transmitted signal to confirm proper operation of the RFID device. The RFID device tester may be used as part of a roll-to-roll process, to individually test RFID devices on a roll of material. By utilizing short-range capacitive coupling, difficulties caused by simultaneous activation of multiple RFID devices may be reduced or avoided.

    Abstract translation: RFID设备测试器包括用于将读取器电容耦合到待测试的RFID设备的耦合元件。 如果RFID设备正常运行,则读取器可以通过发送诸如输出AC电力信号的输出信号来为RFID装置供电,RFID输出装置可以由RFID装置整流和/或反射。 输出信号可以具有与RFID设备的天线的谐振频率不同的频率。 RFID设备测试器中的读取器检测反射和/或发射的信号以确认RFID设备的正常操作。 RFID设备测试器可以用作卷对卷过程的一部分,以单独测试一卷材料上的RFID设备。 通过利用短距离电容耦合,可以减少或避免由同时激活多个RFID装置引起的困难。

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