摘要:
The temperature control of substrates (W) to be processed is improved in a plasma processing apparatus. A chamber (10) includes a cylindrical ceramic support (26). The upper end of the support (26) is hermetically connected to the back (24b) of a wafer stage (24) by solid-phase welding. The lower end of the support (26) is hermetically connected to the bottom (10b) of the chamber (10) through a lower cooling jacket (90) and O-rings (92, 96). The support (26) defines an atmospheric chamber (38) in which a cooling jacket (40) formed of disklike aluminum blocks is provided. The cooling jacket (40) is mounted on the back (24a) of the wafer stage (24) with a heat-conducting sheet (42).
摘要:
A microwave plasma processing apparatus is disclosed that enables fast and easy plasma ignition at the pressure for plasma processing. In the microwave plasma processing apparatus, a plasma ignition facilitating unit is provided to facilitate plasma ignition induced by a microwave. The plasma ignition facilitating unit includes a deuterium lamp that emits vacuum ultraviolet rays, and a transmission window that allows the vacuum ultraviolet rays to penetrate and irradiate a plasma excitation space. The transmission window is a convex lens, and focuses the vacuum ultraviolet rays to enhance ionization of the plasma excitation gas. With such a configuration, it is possible to induce plasma ignition easily and quickly.
摘要:
When, for example, a film is formed after preheating, the preheating time is short. The current values passing through a main electromagnetic coil (26) and an auxiliary electromagnetic coil (27) in preheating are made different from those in film forming, so that the shape of the magnetic field produced is varied. In film forming, the uniformity of the magnetic field is high and the magnetic flux density is low; in preheating, the uniformity is low and the magnetic flux density is high. As a result, uniform film forming is possible because a substantially uniform plasma is created over the surface of a wafer (W). Meanwhile, in preheating, although the uniformity is low, a plasma whose density is higher than in film forming is created, and consequently the amount of heat given to the wafer (W) is larger than in film forming, thereby shortening the preheating time.
摘要:
A method and apparatus for efficiently depositing a dielectric film with a preselected thickness pattern, in particular a homogeneous, uniform diamond or diamond-like film on large area substrates through the use of opposing plasma torches (23) and linearly superimposing of microwave modes within the reaction chamber (26) creating and maintaining an extended linear plasma in close proximity to the substrate surfaces and utilizing laminar flow of the reactant gases in the plasma and over the surfaces. Substrate surfaces can be moved past the opposing torches (23) permitting the coating of large area, rectangularly-shaped substrate surfaces in a simple manner. Alternatively, the plasma horn or horns (23) can be moved across the substrate permitting coating of large area, rectangularly-shaped substrate surfaces.
摘要:
A method for depositing, by microwave plasma enhanced chemical vapor deposition, a modified, silicon oxide, barrier coating atop a temperature sensitive substrate; said barrier coating having barrier properties to at least gaseous oxygen and water vapor. The precursor gaseous mixture includes at least a silicon-hydrogen containing gas, an oxygen containing gas and a gas containing at least one element selected from the group consisting of germanium, tin, phosphorus, and boron. The method requires introducing a sufficient flow rate of oxygen-containing gas into the precursor gaseous mixture to eliminate the inclusion of silicon-hydrogen bonds into the deposited coating. The preferred modifier is germanium. Also, a composite material having a microwave-plasma-enhanced-chemical-vapor-deposited silicon oxide (modified or non-modified) barrier coating. The barrier coating has barrier properties to at least gaseous oxygen and water vapor and is substantially free of Si-H bonds. The barrier coating is deposited by the instant method on a temperature sensitive substrate.
摘要:
In order to easily and accurately manufacture a micromachine comprising a member which is made of a single-crystalline material and having a complicated structure, an uppermost layer (1104) of a single-crystalline Si substrate (1102) whose (100) plane is upwardly directed is irradiated with Ne atom currents from a plurality of prescribed directions, so that the crystal orientation of the uppermost layer (1104) is converted to such orientation that the (111) plane is upwardly directed. A masking member (106) is employed as a shielding member to anisotropically etch the substrate (1102) from its bottom surface, thereby forming a V-shaped groove (1112). At this time, the uppermost layer (1104) serves as an etching stopper. Thus, it is possible to easily manufacture a micromachine having a single-crystalline diaphragm having a uniform thickness. A micromachine having a complicated member such as a diagram which is made of a single-crystalline material can be easily manufactured through no junction.
摘要:
An improved chemical vapor deposition method for the high-rate low-temperature deposition of high-quality thin film material. The method includes the steps of providing an evacuated chamber having a plasma deposition region defined therein; placing a substrate (24) inside the chamber; supplying plasma deposition precursor gases to the deposition region in the evacuated chamber; directing microwave energy from a source (4) thereof to the deposition region, the microwave energy interacting with the deposition precursor gases to form a plasma of electrons, ions and activated electrically neutral species, the plasma including one or more depositing species; increasing the surface mobility of the depositing species in the plasma by coupling additional non-microwave electronic energy and magnetic energy into the plasma, without intentionally adding thermal energy to the substrate (24) or precursor gas; and depositing a thin film of material onto the substrate (24).
摘要:
Method and apparatus for the simultaneous plasma assisted chemical vapor deposition of thin film material onto an elongated web of substrate material at a plurality of discrete spatially separated deposition zones (12). In order to accomplish said simultaneous deposition, the web of substrate material (10) is operatively positioned so as to assume a serpentine path of travel through a reduced pressure enclosure (1). By using an elongated linear applicator (4) as a source of microwave energy, a high rate of uniform deposition of said thin film material over a plurality of large areas of the web substrate material can be simultaneously achieved without heating of said web above the melting point thereof. In a preferred embodiment, the web of substrate material is formed of a low temperature, microwave transmissive synthetic plastic resin and the thin film material deposited thereupon forms a barrier coating for preventing oxygen diffusion therethrough.
摘要:
Open circuit voltage of photovoltaic devices manufactured by a microwave deposition process is increased by disposing a bias wire in the microwave energized plasma and applying a positive voltage of approximately 100 volts to the wire during only a portion of the time in which the intrinsic semiconductor layer (12a, 12b) is being deposited.
摘要:
An apparatus for processing with plasma wherein a gas is introduced into a plasma forming chamber (20) through a gas introduction pipe (22), input microwave from a microwave source (31) is supplied to the plasma forming chamber (20), and the gas introduced is converted into a plasma by electron cyclotron resonance. The input microwave in TE mode from a microwave source (31) is received by a tapered waveguide (60) which accomodates a dielectric board (63), and at least part of the input microwave is converted into a microwave portion in EH mode having an electric field component in the traveling direction of the input microwave. A hybrid-mode microwave containing the waves in these two modes is guided into the plasma forming chamber (20) via a microwave introduction window (27). Since the plasma forming chamber (20) receives the hybrid-mode wave of a propagation mode having an electric field component toward the traveling direction, i.e., having a longitudinal component, the microwave energy is efficiently supplied to the plasma region that satisfies the ECR condition, and absorbed in the plasma. Therefore, the plasma forming efficiency increases and the throughput of processing with plasma increases, too.