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41.发明授权Method of preparing an ultra sharp tip and use of an apparatus therefor 有权一种用于生产设备用于此目的的非常尖锐的尖端和使用方法
公开(公告)号：EP2144274B1
公开(公告)日：2012-09-12
申请号：EP08159924.3
申请日：2008-07-08
发明人： Winkler, Dieter , Weigel, Udo , Grimm, Stefan
IPC分类号： H01J37/073 , H01J37/08 , H01J1/304 , H01J9/02 , H01J27/26 , C25D5/48 , C25D7/00 , G01Q70/16 , B81C1/00 , B82Y15/00
CPC分类号： C25D5/48 , B81C1/00111 , B82Y15/00 , C25D7/00 , H01J1/3044 , H01J9/025 , H01J27/26 , H01J37/073 , H01J37/08 , H01J2201/30411 , H01J2201/30415 , H01J2209/0226 , H01J2237/06341 , H01J2237/0807
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公开(公告)号：EP2416342A2
公开(公告)日：2012-02-08
申请号：EP11182539.4
申请日：2006-11-15
申请人： Alis Corporation
IPC分类号： H01J37/28 , H01J9/02 , H01J37/08 , H01J37/252 , H01J37/317 , B82Y10/00 , G01N23/225 , H01J27/26 , H01J37/20
CPC分类号： H01J9/02 , H01J37/08 , H01J37/20 , H01J37/252 , H01J37/28 , H01J37/3056 , H01J37/3174 , H01J2237/024 , H01J2237/0807 , H01J2237/202 , H01J2237/20228 , H01J2237/20264 , H01J2237/2566 , H01J2237/2623 , H01J2237/2812 , H01J2237/30438 , H01J2237/30477 , H01J2237/31737 , H01J2237/3174 , H01J2237/31755
摘要： The present invention refers to a system that comprises an ion source, wherein the system is capable of imaging the ion source in a first mode, and the system is capable of using the ion source to collect an image of a sample in a second mode, the sample being different from the ion source.
摘要翻译： 本发明涉及一种包括离子源的系统，其中系统能够以第一模式成像离子源，并且系统能够使用离子源以第二模式收集样品的图像， 样品不同于离子源。 该图显示了气体离子显微镜系统（100）。
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公开(公告)号：EP2124244B1
公开(公告)日：2011-08-03
申请号：EP08156663.0
申请日：2008-05-21
发明人： Frosien, Juergen
IPC分类号： H01J37/08 , H01J37/304 , H01J37/26 , H01J27/26
CPC分类号： H01J37/265 , H01J37/28 , H01J37/304 , H01J37/3056 , H01J2237/0805 , H01J2237/0807 , H01J2237/244 , H01J2237/24507 , H01J2237/24535
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44.发明公开DISPOSITIF DE GÉNÉRATION D'UN FAISCEAU D'IONS AVEC PIÈGE CRYOGÉNIQUE 有权EINRICHTUNG ZUR ERZEUGUNG EINES IONENSTRAHLS MIT CRYOGENFALLE
公开(公告)号：EP2342733A1
公开(公告)日：2011-07-13
申请号：EP09749165.8
申请日：2009-09-14
发明人： GIERAK, Jacques , JEDE, Ralf
摘要： This device (2) for generating an ion beam (4), which includes a liquid metal ion source (18), is characterized in that the ion source is surrounded by a cryogenic trap (28) maintained at a low temperature, this cryogenic trap being capable of trapping volatile chemical species (G) by condensing them before they can reach the ion source.
摘要翻译： 用于产生包括液体金属离子源（18）的离子束（4）的该装置（2）的特征在于，离子源被保持在低温的低温阱（28）包围，该低温阱能够 挥发性化学物质（G）通过在它们到达离子源之前冷凝来捕获。
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公开(公告)号：EP2331946A2
公开(公告)日：2011-06-15
申请号：EP09791973.2
申请日：2009-08-27
申请人： Carl Zeiss NTS, LLC.
IPC分类号： G01N23/225 , H01J37/08 , H01J27/26
CPC分类号： H01J37/28 , H01J37/05 , H01J37/08 , H01J37/265 , H01J2237/057 , H01J2237/0807 , H01J2237/24514
摘要： Ion microscope methods and systems are disclosed. In general, the systems and methods provide high ion beam stability.
摘要翻译： 公开了离子显微镜的方法和系统。 通常，这些系统和方法提供了高离子束稳定性。
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公开(公告)号：EP2311063A2
公开(公告)日：2011-04-20
申请号：EP09789975.1
申请日：2009-06-29
申请人： Carl Zeiss NTS, LLC.
CPC分类号： H01J37/08 , H01J27/024 , H01J2237/061 , H01J2237/0805 , H01J2237/0807
摘要： Disclosed are charged particle systems that include a tip (504), at least one gas inlet (512a-f) configured to supply gas particles to the tip, and a element (506) having a curved surface (514) positioned to adsorb un-ionized gas particles (182a-d), and to direct desorbing gas particles to propagate toward the tip. The charged particle systems can include a field shunt connected to the tip, and configured to adjust an electric field at an apex of the tip.
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公开(公告)号：EP2263248A1
公开(公告)日：2010-12-22
申请号：EP09716494.1
申请日：2009-02-13
申请人： Carl Zeiss SMT, Inc.
发明人： NOTTE IV, John V.
IPC分类号： H01J37/08 , H01J27/26 , H01J37/065 , H01J37/26 , H01J37/30
CPC分类号： H01J49/168 , H01J27/26 , H01J37/065 , H01J37/08 , H01J37/28 , H01J2237/06341 , H01J2237/0807 , H01J2237/28
摘要： Coated tips, as well as related articles, systems and methods are disclosed.
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公开(公告)号：EP1829436A4
公开(公告)日：2010-11-24
申请号：EP05808221
申请日：2005-11-21
发明人： KOLODNEY ELI , BEKKERMAN ANATOLY , TSIPINYUK BORIS
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公开(公告)号：EP1766651A2
公开(公告)日：2007-03-28
申请号：EP05752304.5
申请日：2005-05-19
申请人： Whitehouse, Craig M.
CPC分类号： H01J49/165 , B01D61/00 , B01D61/425 , B01D2313/345 , G01N30/7266 , H01J49/0018 , H01J49/167 , Y10T436/212 , Y10T436/24
摘要： Charged droplet spray is formed from a solution with all or a portion of the charged droplet spray current generated from reduction or oxidation (redox) reactions occurring on surfaces removed from the first or sample solution flow path. In one embodiment of the invention, two solution flow channels are separated by a semipermeable membrane. A first or sample solution flowing through the first solution flow channel exchanges cation or anion charged species through the semipermeable membrane with a second solution or gas flowing through the second flow channel. Charge exchange is driven by the electric field applied at the charged droplet sprayer sample solution outlet. Redox reactions occur at an electrode surface in contact with the second solution. The invention increases the control and range of the Electrospray ionization process during ES/MS operation. Alternative embodiments of the invention provide for conducting redox reactions on conductive surfaces removed from the first or sample solution flow path but not separated by semipermeable membranes.
摘要翻译： 从溶液形成带电的液滴喷雾，其中从在第一或样品溶液流动路径上去除的表面上发生还原或氧化（氧化还原）反应产生的所有或一部分带电液滴喷雾电流。 在本发明的一个实施方案中，两个溶液流动通道被半透膜隔开。 流过第一溶液流动通道的第一或样品溶液通过半透膜与穿过第二流动通道的第二溶液或气体交换阳离子或阴离子带电物质。 电荷交换由在带电液滴喷雾器样品溶液出口处施加的电场驱动。 在与第二溶液接触的电极表面处发生氧化还原反应。 本发明增加了ES / MS操作期间电喷雾电离过程的控制和范围。 本发明的替代实施方案提供了在从第一或样品溶液流动路径移除但不被半透膜隔离的导电表面上进行氧化还原反应。
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公开(公告)号：EP1622182B1
公开(公告)日：2007-03-21
申请号：EP04017894.9
申请日：2004-07-28
发明人： Pilz, Wolfgang , Bischoff, Lothar
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