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公开(公告)号：US12198917B2
公开(公告)日：2025-01-14
申请号：US17843221
申请日：2022-06-17
Applicant: JEOL Ltd.
Inventor： Takaya Satoh
IPC: H01J49/00
Abstract: Peak determination is executed with respect to the mass spectrum of a sample to generate a peak list. For each of the plurality of peaks contained in the peak list, a Kendrick mass (KM) of a designated monomer is calculated. An RKM is calculated, the RKM being a fractional part of a value obtained by dividing the KM by the integer mass of the monomer, or a remainder of dividing a nominal Kendrick mass (NKM) by the integer mass of the monomer. A plurality of peaks contained in the peak list and satisfying a grouping condition, including the permissible range of the RKM of the starting point peak, are grouped.
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公开(公告)号：US12103080B2
公开(公告)日：2024-10-01
申请号：US17886841
申请日：2022-08-12
Applicant: JEOL Ltd.
Inventor： Tatsuo Naruse , Takayuki Shimizu
Abstract: A vacuum pump that evacuates an inside of a vacuum chamber and powder capturing devices disposed on an intake side of the vacuum pump are included. The powder capturing devices include a plurality of flow path forming units that form a continuous gas flow path from an intake unit located on the vacuum chamber side to an exhaust unit located on the vacuum pump side. The plurality of flow path forming units include a first flow path forming unit having a first catching unit that causes the powder sucked from the intake unit to collide and then catch the powder, and a second flow path forming unit having a second catching unit that causes the powder passing through the first flow path forming unit to collide and then catch the powder.
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3.发明公开公开(公告)号：US20240145210A1
公开(公告)日：2024-05-02
申请号：US18385022
申请日：2023-10-30
Applicant: JEOL Ltd.
Inventor： Shigeyuki Morishita , Yu Jimbo
IPC: H01J37/153 , H01F7/20 , H01J37/28
CPC classification number: H01J37/153 , H01F7/20 , H01J37/28 , H01J2237/1534 , H01J2237/2802
Abstract: There is provided an electron microscope capable of reducing variations of aberrations due to thermal variations. The electron microscope includes an electron optical system having a built-in aberration corrector equipped with multipole elements each for producing a multipolar field. Each multipole element includes a plurality of magnetic polepieces. Each polepiece includes a magnetic core, a first coil wound around the core, and a second coil wound around the core. The first coil and the second coil produce a first multipolar field and a second multipolar field, respectively, when energized. The first and second multipolar fields are identical in terms of symmetry.
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公开(公告)号：US20240126215A1
公开(公告)日：2024-04-18
申请号：US18277353
申请日：2022-02-10
Inventor： Shigenori Tsuji , Masao Takamoto , Hidetoshi Katori
IPC: G04F5/14
CPC classification number: G04F5/14
Abstract: An atomic oven includes a cartridge and a main body. The cartridge includes a holder that accommodates an atom source; and a capillary nozzle. The main body includes: a housing in which the cartridge is installed; a button heater; an access opening for removing the cartridge from the main body and placing the cartridge into the main body, the access opening being provided on the atmosphere side, which is outside the main body; and a passage from the access opening to the housing. The cartridge is inserted into the main body through the access opening and is installed in the housing. The atom source is heated by the button heater, whereby atomic gas generated from the atom source is emitted as an atom beam to the vacuum side, which is outside the main body.
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公开(公告)号：US20240096588A1
公开(公告)日：2024-03-21
申请号：US18368310
申请日：2023-09-14
Applicant: JEOL Ltd.
Inventor： Kanako Noguchi
IPC: H01J37/22
CPC classification number: H01J37/228 , H01J37/224 , H01J2237/2802
Abstract: A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.
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Patent Agency Ranking
公开(公告)号：US11927510B2
公开(公告)日：2024-03-12
申请号：US16953502
申请日：2020-11-20
Applicant: JEOL Ltd.
Inventor： Masaki Takiwaki , Seketsu Fukuzawa , Yoshikuni Kikutani , Kiyotaka Fujino , Kentaro Abe , Yoshiyuki Ito
CPC classification number: G01N1/28 , G01N33/743 , G01N33/82 , G01N2001/2893 , Y10T436/104165
Abstract: A standard calibration solution includes water, a non-alcoholic solvent that is mixed with water, and a steroid hormone, and a content of the non-alcoholic solvent is 10% by volume or more and 50% by volume or less. The standard calibration solution is used for quantitative measurement using a mass spectrometry device.
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公开(公告)号：US11894854B2
公开(公告)日：2024-02-06
申请号：US17915776
申请日：2021-03-30
Inventor： Shigenori Tsuji , Masao Takamoto , Hidetoshi Katori
Abstract: An optical lattice clock includes a clock transition space having disposed therein an atom group trapped in an optical lattice, and a triaxial magnetic field correction coil for correcting the magnetic field of the clock transition space. Additionally, in a correction space that includes the clock transition space and is larger than the clock transition space, a photoreceiver promotes the clock transition of the atom group trapped in the optical lattice and acquires a clock transition frequency distribution for the correction space. Further, a corrector corrects the magnetic field of the triaxial magnetic field correction coil on the basis of the frequency distribution measured by the photo receiver.
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公开(公告)号：US20240038513A1
公开(公告)日：2024-02-01
申请号：US18226493
申请日：2023-07-26
Applicant: JEOL Ltd.
Inventor： Ayumi Kubo , Masaaki Ubukata , Kenji Nagatomo
CPC classification number: H01J49/0036 , G16C20/20
Abstract: A first searcher executes a primary search with respect to a primary library based on a sample mass spectrum. The primary library includes a plurality of standard mass spectra. When a judging unit judges that a search range is to be enlarged, a second searcher executes a secondary search with respect to a secondary library based on the sample mass spectrum. The secondary library includes a plurality of predicted mass spectra produced from a plurality of molecular structures.
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公开(公告)号：US11885825B2
公开(公告)日：2024-01-30
申请号：US16924589
申请日：2020-07-09
Applicant: JEOL Ltd.
Inventor： Makoto Asakura
CPC classification number: G01N35/1004 , B01L3/52 , B01L13/00 , G01N35/00584 , G01N35/1002 , G01N35/1009 , G01N2035/00534
Abstract: An automated analyzer including: a stirring part provided with a stirring bar; a cleaning part that cleans the stirring bar; and a control unit that controls the stirring part and the cleaning part, when the control unit causes the stirring part to stir a liquid containing a specimen in a second cycle subsequent to a first cycle, the control unit performing first processing that sets a range of the stirring bar to be cleaned in the second cycle as a cleaning range R2, and when the control unit does not cause the stirring part to stir the liquid in the second cycle, the control unit performing second processing that sets a range of the stirring bar to be cleaned in at least one of the first cycle and the second cycle as a cleaning range R4 that is wider than the cleaning range R2.
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公开(公告)号：US20240021405A1
公开(公告)日：2024-01-18
申请号：US18222068
申请日：2023-07-14
Applicant: JEOL Ltd.
Inventor： Yoshikazu Sasaki , Tomohisa Fukuda , Tomohiro Mihira , Norimasa Sakuta , Misumi Kadoi , Tatsuhito Kimura
IPC: H01J37/20
CPC classification number: H01J37/20
Abstract: A holder includes a first sub holder configured to hold a primary specimen, and a second sub holder configured to hold a support member. The primary specimen is processed in a first state where the holder is disposed within a first specimen processing apparatus. Subsequently, in a second state where the holder is disposed within a second specimen processing apparatus, a secondary specimen is prepared from the primary specimen, the secondary specimen is moved onto the support member, and a thin film specimen is prepared from the secondary specimen.
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