利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

113 条记录 (耗时 0.054 秒)

    FOCAL POINT DETECTION DEVICE OF CAMERA AND METHOD OF DETECTING FOCAL POINT THEREOF
    92.
    发明申请
    FOCAL POINT DETECTION DEVICE OF CAMERA AND METHOD OF DETECTING FOCAL POINT THEREOF 有权
    摄像机的焦点检测装置及其检测点的方法

    公开(公告)号：US20090129766A1

    公开(公告)日：2009-05-21

    申请号：US12273876

    申请日：2008-11-19

    申请人： Tetsuo Kikuchi ,  Keiji Kunishige

    发明人： Tetsuo Kikuchi ,  Keiji Kunishige

    IPC分类号： G03B3/10

    CPC分类号： G03B13/36 ,  G03B3/10 ,  H04N5/232 ,  H04N5/23212

    摘要： A focal point detection device includes a focal point detection section which detects a focal point state of an object image corresponding to each of focal point detection regions. A group selection section selects focal point detection regions as a group. A judgment section determines a focal point detection region in which detection of the focal point state is enabled in the selected group. An automatic focal point detection region selection section selects, when detection of the focal point detection regions can be performed in the selected group, a focal point detection region in the selected group, and selects, when detection of the focal point detection regions cannot be performed, a focal point detection region outside the selected group. A control section drives an imaging optical system in accordance with the focal point state corresponding to the focal point detection region selected.

    摘要翻译： 焦点检测装置包括：焦点检测部，其检测与各焦点检测区域对应的被摄体图像的焦点状态。 组选择部选择焦点检测区域作为组。 判断部确定在所选择的组中启用焦点状态的检测的焦点检测区域。 自动焦点检测区域选择部，当在所选择的组中检测到焦点检测区域时，选择所选择的组中的焦点检测区域，并且当不能执行焦点检测区域的检测时，选择 ，选定组外的焦点检测区域。 控制部根据与选择的焦点检测区域对应的焦点状态来驱动摄像光学系统。

    Image sensor
    93.
    发明授权
    Image sensor 有权
    图像传感器

    公开(公告)号：US07485837B2

    公开(公告)日：2009-02-03

    申请号：US11925114

    申请日：2007-10-26

    申请人： Shiro Tsunai ,  Kosei Tamiya ,  Tetsuo Kikuchi

    发明人： Shiro Tsunai ,  Kosei Tamiya ,  Tetsuo Kikuchi

    IPC分类号： H01L27/146 ,  G01J1/10

    CPC分类号： G01J1/4228

    摘要： In an autofocus image sensor, monitoring pixels are disposed adjacent to a pixel array over a length equal to that of the pixel array in each of a standard portion and a reference portion. Signals from the monitoring pixels of both of the standard portion and the reference portion are subjected to arithmetic operation to control accumulation of electric charges. Thus, an error in position detection is minimized.

    摘要翻译： 在自动聚焦图像传感器中，在标准部分和参考部分的每一个中，监视像素被布置成与像素阵列的长度相等的像素阵列相邻。 对来自标准部分和参考部分的监视像素的信号进行算术运算以控制电荷的累积。 因此，位置检测中的错误被最小化。

    Focus detection device and accumulation control method of focus detection device
    94.
    发明申请
    Focus detection device and accumulation control method of focus detection device 审中-公开
    焦点检测装置的聚焦检测装置和聚焦检测装置的累积控制方法

    公开(公告)号：US20080100738A1

    公开(公告)日：2008-05-01

    申请号：US11975935

    申请日：2007-10-23

    申请人： Hitoshi Tsuchiya ,  Masato Osawa ,  Kosei Tamiya ,  Tatsuya Takei ,  Mitsutomo Kariya ,  Tetsuo Kikuchi ,  Koichi Nakata

    发明人： Hitoshi Tsuchiya ,  Masato Osawa ,  Kosei Tamiya ,  Tatsuya Takei ,  Mitsutomo Kariya ,  Tetsuo Kikuchi ,  Koichi Nakata

    IPC分类号： G01J1/42 ,  G03B13/00

    CPC分类号： G03B13/18 ,  G01J1/4228

    摘要： A focus detection device having a pair of light receiving sections (a first and second light receiving sections) which receive subject images observed from different view fields having parallax to accumulate charges is disclosed. The accumulation of the charges in the pair of light receiving sections is ended selectably based on an accumulation level of the charges at one light receiving section and an accumulation levels of the charges at both light receiving sections. Moreover/alternatively, the light receiving section has a plurality of light receiving units, and signals to end the accumulation of the charges at the respective light receiving units are sent to the first and second light receiving sections. In this case, a combination of the light receiving unit of the first light receiving section and the light receiving unit of the second light receiving section to which the signals are to be sent can be switched.

    摘要翻译： 公开了一种具有一对受光部（第一和第二光接收部）的焦点检测装置，其接收从具有视差积累电荷的不同视场观察的被摄体图像。 基于一个光接收部分的电荷的累积电平和两个光接收部分的电荷的累积电平可选择地结束在一对光接收部分中的电荷的累积。 此外，或者，光接收部分具有多个光接收单元，并且将在各个光接收单元处结束电荷累积的信号发送到第一和第二光接收部分。 在这种情况下，可以切换第一光接收部分的光接收单元和要发送信号的第二光接收部分的光接收单元的组合。

    Coating liquid application apparatus, image printing apparatus and coating liquid application method
    95.
    发明授权
    Coating liquid application apparatus, image printing apparatus and coating liquid application method 失效
    涂布液施加装置，图像打印装置和涂布液施加方法

    公开(公告)号：US07211151B2

    公开(公告)日：2007-05-01

    申请号：US11128213

    申请日：2005-05-13

    申请人： Nobuhiko Takekoshi ,  Tetsuo Kikuchi

    发明人： Nobuhiko Takekoshi ,  Tetsuo Kikuchi

    IPC分类号： B05C1/08

    CPC分类号： B05C1/0865 ,  B05C1/0813 ,  B05C1/083 ,  B05C1/0834 ,  B41M7/0054

    摘要： A coating liquid application apparatus is provided which can apply a coating liquid, such as a coating agent for improving a weatherability of a printed surface, to the printed surface of a print medium automatically and at high speed. For this purpose, this invention uses application mechanisms to apply the coating liquid to the print medium that was ink-printed with an image. Each application mechanism has a pair of rollers supplied with the coating liquid. Multiple stages of such application mechanisms are provided. The print medium is passed between the paired rollers successively from one application mechanism to another to apply the coating liquid to the print medium in a plurality of stages.

    摘要翻译： 提供涂布液施加装置，其可以自动和高速地将涂布液（例如用于提高印刷表面的耐候性的涂布剂）施加到打印介质的印刷表面。 为此，本发明使用施加机构将涂布液施加到用油墨印刷图像的打印介质上。 每个施加机构都具有一对供应有涂布液的辊。 提供了这种应用机制的多个阶段。 打印介质从一个施加机构到另一个施加机构之间连续地在成对的辊之间通过，以多个阶段将涂布液施加到打印介质。

    Method and apparatus for measuring thin film, and thin film deposition system
    96.
    发明授权
    Method and apparatus for measuring thin film, and thin film deposition system 失效
    测量薄膜的方法和装置以及薄膜沉积系统

    公开(公告)号：US06970532B2

    公开(公告)日：2005-11-29

    申请号：US09852111

    申请日：2001-05-09

    申请人： Seiichi Hayashi ,  Jimpei Harada ,  Tetsuo Kikuchi ,  Kazuhiko Omote ,  Katsuhiko Inaba

    发明人： Seiichi Hayashi ,  Jimpei Harada ,  Tetsuo Kikuchi ,  Kazuhiko Omote ,  Katsuhiko Inaba

    IPC分类号： G01B15/02 ,  G01N23/20

    CPC分类号： C23C14/545 ,  G01B15/02

    摘要： The thin film deposition system for depositing a thin film on the surface of substrates disposed in a sealed thin film deposition furnace comprises a measuring unit at a site communicating with the thin film deposition furnace, the measuring unit comprising a thin film deposition sample substrate for allowing a thin film substance flowing in from the thin film deposition furnace to adhere while X-ray incidence and extraction windows being provided on the side walls of the measuring unit, wherein X-ray is irradiated on the thin film deposition sample substrate in the measuring unit through the X-ray incidence window by means of a thin film measuring unit provided at the outside of the thin film deposition furnace, and the X-ray reflected from the thin film deposition sample substrate is sensed through the X-ray extraction window.

    摘要翻译： 用于在设置在密封薄膜沉积炉中的基板的表面上沉积薄膜的薄膜沉积系统包括在与薄膜沉积炉连通的位置处的测量单元，测量单元包括薄膜沉积样品基板，用于允许 在测量单元的侧壁上设置X射线入射和提取窗口的同时从薄膜沉积炉流入的薄膜物质，其中在测量单元中的薄膜沉积样品基板上照射X射线 通过设置在薄膜沉积炉外部的薄膜测量单元通过X射线入射窗，并且通过X射线提取窗口感测从薄膜沉积样品基底反射的X射线。

    X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus
    97.
    发明申请
    X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus 有权
    X射线晶体取向测定方法和X射线晶体取向测定装置

    公开(公告)号：US20050078790A1

    公开(公告)日：2005-04-14

    申请号：US10939471

    申请日：2004-09-14

    申请人： Tetsuo Kikuchi ,  Yoshio Inago ,  Makoto Usui ,  Toshio Uematsu

    发明人： Tetsuo Kikuchi ,  Yoshio Inago ,  Makoto Usui ,  Toshio Uematsu

    IPC分类号： G01N23/207 ,  G01N23/205 ,  G01N23/20

    CPC分类号： G01N23/205

    摘要： An X-ray crystal orientation measuring apparatus and a method thereof, for enabling to measure distribution of crystal orientations upon a crystal having the sub-grain structure, lineage structure, other than the single domain, with using X-ray, comprises, an XY stage 20 for mounting a crystal S to be measured thereon and being movable in X-Y directions, an X-ray generating device 50 for irradiating X-ray at a predetermined angle upon a measuring surface of the crystal to be measured on the stage, a high-sensitive two-dimensional detector 60 for detecting the diffraction image (i.e., the Laue image) of X-ray, which is irradiated from the X-ray generating device upon the measuring surface of the crystal to be measured, and a control PC (CPU) 90, wherein the control PC calculates out a central position of the diffraction image detected, from the detected screen, so as to calculate out the crystal orientation upon the measuring surface of the crystal to be measured, and thereby enabling the measurement of the crystal orientation within a short time, even if conducing mapping measurement at a large number of points thereon.

    摘要翻译： 一种X射线晶体取向测定装置及其方法，能够使用X射线测定具有亚晶粒结构，除了单结构域以外的谱系结构的晶体的晶体取向分布，包括XY 用于安装要测量的晶体S并可在XY方向上移动的阶段20，用于以预定角度将X射线照射在待测晶体的测量表面上的X射线产生装置50，高 用于检测从待测晶体的测量表面上的从X射线产生装置照射的X射线的衍射图像（即，Laue图像）的感光二维检测器60和控制PC（ CPU）90，其中控制PC从检测到的屏幕计算检测到的衍射图像的中心位置，以计算被测晶体的测量表面上的晶体取向，从而使得t 他在短时间内测量晶体取向，即使在其上大量点进行映射测量。

    Channel-cut monochromator
    99.
    发明授权
    Channel-cut monochromator 失效
    通道切割单色仪

    公开(公告)号：US06574306B2

    公开(公告)日：2003-06-03

    申请号：US09867186

    申请日：2001-05-29

    申请人： Tetsuo Kikuchi

    发明人： Tetsuo Kikuchi

    IPC分类号： G21K106

    CPC分类号： G21K1/06

    摘要： A channel-cut monochromator has at least two kinds of reflecting surface pairs processed on a common single crystal block. Each reflecting surface pair has a first and a second reflecting surfaces between which X-rays are reflected even-number times. The channel-cut monochromator can be rotated around an axis of rotation perpendicular to a reference plane so as to switch the reflecting surface pair which reflects X-rays. An X-ray beam incident on any reflecting surface pair or its extension line is tangent to a common imaginary circle whose center coincides with the axis of rotation. With this structure, the switchover of the reflecting surface pair is accomplished by only the rotation of the channel-cut monochromator around its axis of rotation, so that various X-ray beams reflected by various Miller indices can be taken out selectively. The channel-cut monochromator may have a direct path through which an X-ray beam passes in no contact with any reflecting surface. The channel-cut monochromator may be made of silicon or germanium single crystal and may have preferably five or more kinds of reflecting surfaces, for example, for {220}, {400}, {422}, {511} and {111} reflection. Further, at least one of reflecting surface pair may have one or two asymmetrical reflecting surfaces.

    摘要翻译： 通道切割单色仪具有在普通单晶块上处理的至少两种反射表面对。 每个反射面对具有第一反射面和第二反射面，X射线之间反射数倍。 通道切割单色仪可以围绕垂直于参考平面的旋转轴线旋转，以便切换反射X射线的反射面对。 入射在任何反射面对或其延伸线上的X射线束与其中心与旋转轴线重合的共同假想圆相切。 通过这种结构，反射面对的切换仅通过通道切割单色器围绕其旋转轴的旋转来实现，从而可以选择性地取出由各种米勒指数反射的各种X射线束。 通道切割单色仪可以具有直接路径，X射线束通过该直通路径不与任何反射表面接触。 通道切割单色仪可以由硅或锗单晶制成，并且可以具有例如{220}，{400}，{422}，{511}和{111}反射的优选的五种或更多种反射表面 。 此外，反射面对中的至少一个可以具有一个或两个不对称的反射表面。

    X-ray diffraction apparatus and method for measuring X-ray rocking curves
    100.
    发明授权
    X-ray diffraction apparatus and method for measuring X-ray rocking curves 有权
    X射线衍射装置和X射线摇摆曲线测量方法

    公开(公告)号：US06385289B1

    公开(公告)日：2002-05-07

    申请号：US09546890

    申请日：2000-04-10

    申请人： Tetsuo Kikuchi

    发明人： Tetsuo Kikuchi

    IPC分类号： G01N1300

    CPC分类号： G01N23/20

    摘要： A two-dimensional position-sensitive X-ray detector is used for the precision measurement of lattice constants so that a plurality of X-ray rocking curves can be measured at the same time for the respective points on a sample and an area map, on the sample, of the lattice constants can be obtained in a short time. X-rays from an X-ray source pass through the first slit and are then incident on a crystal collimator. X-rays reflected by the crystal collimator are incident on the sample. X-rays diffracted at the sample are detected by the two-dimensional position-sensitive X-ray detector. The diffracted X-rays from the respective points on the sample are detected separately at respective points on the X-ray detector. X-ray intensities which are detected at respective points on the detecting surface of the X-ray detector are recorded, at the same time, at every rotation angle with a predetermined pitch of angle during sample rotation, so that a plurality of rocking curves for said respective points of the sample can be obtained at the same time.

    摘要翻译： 使用二维位置敏感的X射线检测器来精确测量晶格常数，使得可以同时测量多个X射线摇摆曲线用于样本和区域图上的各个点，在 可以在短时间内获得样品的晶格常数。 来自X射线源的X射线穿过第一狭缝，然后入射到晶体准直仪上。 由晶体准直器反射的X射线入射到样品上。 通过二维位置敏感的X射线检测器检测在样品处衍射的X射线。 在X射线检测器上的各个点分别检测来自样品上各个点的衍射X射线。 在X射线检测器的检测面的各个点处检测到的X射线强度同时在样本旋转期间以预定的角度间隔在每个旋转角度被记录，使得多个摇摆曲线用于 所述样品的各个点可以同时获得。