Bleachable materials for lithography
    91.
    发明授权
    Bleachable materials for lithography 有权
    用于光刻的可漂洗材料

    公开(公告)号:US07875408B2

    公开(公告)日:2011-01-25

    申请号:US11698182

    申请日:2007-01-25

    摘要: Compositions comprising photobleachable organic materials can be bleached by 193 nm light, and brought back to their original state by stimuli after exposure. (reversible photobleaching). We use these compositions in art-known contrast enhancement layers and as a part of a photoresist, especially in optical lithography processes for semiconductor fabrication. They may comprise polymers such as organo-silicon polymers, polymers comprising polymers of aromatic hydroxyl compounds such as phenol and naphthol such as phenol formaldehyde polymers and naphthol formaldehyde polymers styrene polymers and phenolic acrylate polymers or cyclic materials comprising: where the radicals “R” and “Y” represent organo, or substituted organo moieties, Structures I, II, and III represent basic organic skeletons and can be unsubstituted or substituted in any available position with any one or combinations of multiple substituents.

    摘要翻译: 包含可光漂白有机材料的组合物可以用193nm的光漂白,并且在曝光后通过刺激使其恢复到其初始状态。 (可逆光漂白)。 我们将这些组合物用于本领域已知的对比增强层和作为光致抗蚀剂的一部分,特别是在用于半导体制造的光刻工艺中。 它们可以包括聚合物,例如有机硅聚合物,包含芳族羟基化合物如苯酚和萘酚的聚合物的聚合物,例如苯酚甲醛聚合物和萘酚甲醛聚合物苯乙烯聚合物和酚醛丙烯酸酯聚合物或环状材料,其包括:其中基团“R”和 “Y”表示有机或取代的有机部分,结构I,II和III表示碱性有机骨架,并且可以在任何可用位置被未取代或被任何一个或多个取代基的组合取代。

    Orienting, positioning, and forming nanoscale structures
    94.
    发明授权
    Orienting, positioning, and forming nanoscale structures 有权
    定位,定位和形成纳米结构

    公开(公告)号:US07651735B2

    公开(公告)日:2010-01-26

    申请号:US12061777

    申请日:2008-04-03

    IPC分类号: B05D5/00

    摘要: Methods and a structure. A first film of a first block copolymer is formed inside a trough integrally disposed on an energetically neutral surface layer of a substrate. Line-forming microdomains are assembled of the first block copolymer, and form first self-assembled structures within the first film normal to the sidewalls and parallel to the surface layer. At least one microdomain is removed from the first film such that oriented structures remain in the trough oriented normal to the sidewalls and parallel to the surface layer. A second film of a second block copolymer is formed inside the trough. Line-forming microdomains are assembled of the second block copolymer, and form second self-assembled structures within the second film oriented normal to the oriented structures and parallel to the sidewalls. A second method and a structure are also provided.

    摘要翻译: 方法和结构。 第一嵌段共聚物的第一膜形成在整体设置在基材的能量中性表面层上的槽内。 线形成微区域由第一嵌段共聚物组装,并且在垂直于侧壁并平行于表面层的第一膜内形成第一自组装结构。 至少一个微区域从第一膜移除,使得定向结构保持在垂直于侧壁并平行于表面层的槽中。 在槽内形成第二嵌段共聚物的第二膜。 线形成微区域由第二嵌段共聚物组装,并且在第二膜中形成第二自组装结构,其定向垂直于取向结构并平行于侧壁。 还提供了第二种方法和结构。

    PHOTOPATTERNABLE DIELECTRIC MATERIALS FOR BEOL APPLICATIONS AND METHODS FOR USE
    95.
    发明申请
    PHOTOPATTERNABLE DIELECTRIC MATERIALS FOR BEOL APPLICATIONS AND METHODS FOR USE 有权
    用于BEOL应用的光电介质材料和使用方法

    公开(公告)号:US20090233226A1

    公开(公告)日:2009-09-17

    申请号:US12047435

    申请日:2008-03-13

    IPC分类号: G03F7/004 G03F7/20

    摘要: Compositions, a method, and a photopatternable blend. The compositions include a blend of a first and a second polymer. The first polymer is a substituted silsesquioxane copolymer. The second polymer is a substituted silsesquioxane polymer. The second polymer is configured to undergo chemical crosslinking with the first polymer, the second polymer, or a combination thereof, upon exposure to light, thermal energy, or a combination thereof. The compositions include a photosensitive acid generator. The method includes forming a film. The film is patternwise imaged, and at least one region is exposed to radiation. After the imaging, the film is baked, wherein at least one exposed region is rendered substantially soluble. After the baking, the film is developed, wherein a relief pattern remains. The relief pattern is exposed to radiation. The relief pattern is baked. The relief pattern is cured. A chemically amplified positive-tone photopatternable blend is also described.

    摘要翻译: 组合,一种方法和一种光图案化混合物。 组合物包括第一和第二聚合物的共混物。 第一聚合物是取代的倍半硅氧烷共聚物。 第二聚合物是取代的倍半硅氧烷聚合物。 第二聚合物被配置为在暴露于光,热能或其组合时与第一聚合物,第二聚合物或其组合进行化学交联。 组合物包括光敏酸产生剂。 该方法包括形成膜。 膜被图案化成像,并且至少一个区域暴露于辐射。 在成像之后,烘烤该膜,其中至少一个曝光区域呈现基本上可溶的。 烘烤后,显影膜,其中保留有浮雕图案。 浮雕图案暴露于辐射。 浮雕图案被烘烤。 浮雕图案被修复。 还描述了化学放大的正色调可光图案化混合物。

    ORIENTING, POSITIONING, AND FORMING NANOSCALE STRUCTURES
    97.
    发明申请
    ORIENTING, POSITIONING, AND FORMING NANOSCALE STRUCTURES 有权
    定向,定位和形成纳米结构

    公开(公告)号:US20080233343A1

    公开(公告)日:2008-09-25

    申请号:US12061777

    申请日:2008-04-03

    IPC分类号: B32B5/12 B05D3/00

    摘要: Methods and a structure. A first film of a first block copolymer is formed inside a trough integrally disposed on an energetically neutral surface layer of a substrate. Line-forming microdomains are assembled of the first block copolymer, and form first self-assembled structures within the first film normal to the sidewalls and parallel to the surface layer. At least one microdomain is removed from the first film such that oriented structures remain in the trough oriented normal to the sidewalls and parallel to the surface layer. A second film of a second block copolymer is formed inside the trough. Line-forming microdomains are assembled of the second block copolymer, and form second self-assembled structures within the second film oriented normal to the oriented structures and parallel to the sidewalls. A second method and a structure are also provided.

    摘要翻译: 方法和结构。 第一嵌段共聚物的第一膜形成在整体设置在基材的能量中性表面层上的槽内。 线形成微区域由第一嵌段共聚物组装,并且在垂直于侧壁并平行于表面层的第一膜内形成第一自组装结构。 至少一个微区域从第一膜移除,使得定向结构保持在垂直于侧壁并平行于表面层的槽中。 在槽内形成第二嵌段共聚物的第二膜。 线形成微区域由第二嵌段共聚物组装,并且在第二膜中形成第二自组装结构,其定向垂直于取向结构并平行于侧壁。 还提供了第二种方法和结构。

    Methods and systems using ratiometric characterizations to improve air data accuracy
    98.
    发明授权
    Methods and systems using ratiometric characterizations to improve air data accuracy 有权
    使用比例表征法提高空气数据准确度的方法和系统

    公开(公告)号:US07334469B2

    公开(公告)日:2008-02-26

    申请号:US11193645

    申请日:2005-07-29

    IPC分类号: G01L19/00

    CPC分类号: G01P5/165 G01P21/025

    摘要: A method for characterizing pressure sensors to improve accuracy in an air data system is described where the sensors include at least one static pressure sensor and at least one total pressure sensor. The method includes characterizing the static pressure sensor and the total pressure sensor to determine a static pressure sensor error, Pse, and a total pressure sensor error, Pte, and performing a second ratiometric characterization to reference the total pressure sensor error, Pte, to the static pressure sensor error, Pse.

    摘要翻译: 描述了用于表征压力传感器以提高空气数据系统中的精度的方法,其中传感器包括至少一个静态压力传感器和至少一个总压力传感器。 该方法包括表征静态压力传感器和总压力传感器以确定静态压力传感器误差Pse和总压力传感器误差Pte,并且执行第二比例表征以将总压力传感器误差Pte引用到 静压传感器错误,Pse。