Active probe for an atomic force microscope and method of use thereof

    公开(公告)号:US20030094036A1

    公开(公告)日:2003-05-22

    申请号:US10310546

    申请日:2002-12-05

    IPC分类号: G01B005/28

    摘要: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample in either ambient air or fluid includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value. The AFM includes a first feedback circuit nested within a second feedback circuit, wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever during a scanning operation, and the second feedback circuit is responsive to the cantilever control signal to generate a position control signal. A Z position actuator is also included within the second feedback circuit and is responsive to the position control signal to position the sample. In operation, preferably, the cantilever control signal alone is indicative of the topography of the sample surface. In a further embodiment, the first feedback circuit includes an active damping circuit for modifying the quality factor (nullQnull) of the cantilever resonance to optimize the bandwidth of the cantilever response.

    Multiple local probe measuring device and method
    112.
    发明授权
    Multiple local probe measuring device and method 有权
    多个本地探头测量装置及方法

    公开(公告)号:US06545492B1

    公开(公告)日:2003-04-08

    申请号:US09399961

    申请日:1999-09-20

    IPC分类号: G01R3102

    摘要: A local probe measuring device is provided for effecting local measurements of a sample. This device includes first and second local probes for local measurements with respect to a sample or a reference surface. A measurement condition adjustment arrangement is adapted to commonly adjust first and second measurement conditions of the respective first and second local probes with respect to the sample or the reference surface. A detection arrangement is provided that includes first and second detection arrangements associated with the respective first and second local probes and adapted to independently detect first and second measurement data referring to local measurements effected by the respective first and second local probes.

    摘要翻译: 提供了本地探针测量装置,用于对样品进行局部测量。 该装置包括用于相对于样品或参考表面进行局部测量的第一和第二局部探针。 测量条件调整装置适于相对于样本或参考表面共同调整相应的第一和第二局部探针的第一和第二测量条件。 提供了一种检测装置,其包括与相应的第一和第二局部探针相关联的第一和第二检测装置,并且适于独立地检测参考由相应的第一和第二局部探针实施的局部测量的第一和第二测量数据。

    Apparatus and method for introducing an implant
    114.
    发明授权
    Apparatus and method for introducing an implant 失效
    用于引入植入物的装置和方法

    公开(公告)号:US06530896B1

    公开(公告)日:2003-03-11

    申请号:US09624565

    申请日:2000-07-24

    申请人: James B. Elliott

    发明人: James B. Elliott

    IPC分类号: A61M3100

    摘要: An apparatus for introducing an implant into tissue is provided. The apparatus comprises a cartridge having proximal and distal ends, inner and outer surfaces, and a central bore extending therethrough having proximal and distal ends. An implant having proximal and distal ends is within the central bore. A piston is provided proximal to the implant and slidably maintained within the bore, whereby, during operation, the piston moves distally through the bore and urges the implant distally through the bore. The distal end of the cartridge includes a pressure-activated tip section enclosing the distal end of the bore. The bore is enclosed such that sterility of the implant within the bore can be maintained until the implant is released from the cartridge into the patient.

    摘要翻译: 提供了一种用于将植入物引入组织的装置。 该装置包括具有近端和远端,内表面和外表面以及延伸穿过其中的中心孔的药筒,其具有近端和远端。 具有近端和远端的植入物在中心孔内。 活塞被设置在植入物的近侧并且可滑动地保持在孔内,由此,在操作期间,活塞向远侧移动通过孔并且推动植入物向远侧穿过孔。 盒的远端包括封闭孔的远端的压力激活的尖端部分。 孔被封闭,使得植入物在孔内的无菌性可以保持直到植入物从药筒释放到患者体内。

    Bi-level charge pulse apparatus to facilitate nerve location during peripheral nerve block procedures
    116.
    发明授权
    Bi-level charge pulse apparatus to facilitate nerve location during peripheral nerve block procedures 失效
    双周期充电脉冲装置,以便于周围神经阻滞手术期间的神经位置

    公开(公告)号:US06325764B1

    公开(公告)日:2001-12-04

    申请号:US08967054

    申请日:1997-11-10

    IPC分类号: A61B505

    摘要: A self-contained electrolocation apparatus of the present invention includes an electrically conducting needle cannula having a proximal end, a distal end and a hollow bore therethrough. The invention further includes a non-conductive tube having a proximal end and a distal end, the tube being mounted over the needle cannula so that the distal end of the non-conductive tube is proximal to the distal end of the needle cannula. The non-conductive tube has a conductive layer thereon, whereby the needle cannula and the conductive layer respectively define first and second conductors coaxially spaced from one another by the non-conductive tube. There is a grip fixedly attached to the needle cannula for manipulating the apparatus. The grip has an electrical stimulus generator circuit within it that is electrically connected to the first conductor and the second conductor. The stimulus generator circuit is capable of applying a potential across the conductors so that when the needle is positioned in a patient's tissue and the electrical stimulus generator circuit is activated, the potential is sufficient to induce a preselected current thereby providing a charge pulse between the distal end of the conductive layer and the distal end of said needle cannula through the patient's tissue. The charge pulse is sufficient to induce a twitch response in the patient.

    摘要翻译: 本发明的自包含的定位装置包括具有近端,远端和穿过其的中空孔的导电针插管。 本发明还包括具有近端和远端的非导电管,所述管安装在针插管上方,使得非导电管的远端靠近针插管的远端。 非导电管在其上具有导电层,由此针管和导电层分别限定由非导电管彼此同轴间隔开的第一和第二导体。 固定地连接到针插管上的把手用于操纵该装置。 手柄具有电连接到第一导体和第二导体的电刺激发生器电路。 刺激发生器电路能够跨导体施加电位,使得当针定位在患者组织中并且电刺激发生器电路被激活时,电位足以引起预选电流,从而在远端 导电层的端部和所述针插管的远端穿过病人的组织。 充电脉冲足以引起患者的抽搐反应。

    Interpolated height determination in an atomic force microscope
    117.
    发明授权
    Interpolated height determination in an atomic force microscope 有权
    原子力显微镜内插高度测定

    公开(公告)号:US06244103B1

    公开(公告)日:2001-06-12

    申请号:US09465494

    申请日:1999-12-16

    IPC分类号: G01B2130

    摘要: A method and apparatus associated with an atomic force microscope (AFM) to more accurately measure the height of a microscopic feature in a substrate, particularly one having a sloping face. The probe tip is sequentially positioned at a number of vertical positions approaching the surface being probed. At each vertical position, a vertical force encountered by the probe tip is measured, and the measured force is stored in a memory together with its corresponding vertical position. When the measured force exceeds a threshold force, the downward movement is stopped, and the accumulated force and position data are analyzed. A controller fits the data to two curves, for example, two linear relationships in force vs. height. One curve is associated with the lower forces away from the surface, the other curve with the higher forces after initial engagement with the surface. The intersection of the two curves gives the height of the feature in the surface.

    摘要翻译: 与原子力显微镜(AFM)相关联的方法和装置,以更精确地测量衬底中的微观特征的高度,特别是具有倾斜面的微观特征。 探针尖端依次定位在接近被探测表面的多个垂直位置。 在每个垂直位置处,测量由探针尖端遇到的垂直力,并且将测量的力与其对应的垂直位置一起存储在存储器中。 当测量的力超过阈值力时,停止向下运动,并分析积累的力和位置数据。 控制器将数据拟合到两条曲线,例如,力与高度之间的两个线性关系。 一条曲线与远离表面的较小的力相关联,另一条曲线与初始与表面接合之后具有较高的力。 两条曲线的交点给出了表面特征的高度。

    Active probe for an atomic force microscope and method of use thereof
    118.
    发明授权
    Active probe for an atomic force microscope and method of use thereof 有权
    原子力显微镜的有源探针及其使用方法

    公开(公告)号:US06189374B1

    公开(公告)日:2001-02-20

    申请号:US09280160

    申请日:1999-03-29

    IPC分类号: G01B528

    摘要: An AFM that combines an AFM Z position actuator and a self-actuated Z position cantilever (both operable in cyclical mode and contact mode), with appropriate nested feedback control circuitry to achieve high-speed imaging and accurate Z position measurements. A preferred embodiment of an AFM for analyzing a surface of a sample includes a self-actuated cantilever having a Z-positioning element integrated therewith and an oscillator that oscillates the self-actuated cantilever at a frequency generally equal to a resonant frequency of the self-actuated cantilever and at an oscillation amplitude generally equal to a setpoint value. The AFM includes a first feedback circuit nested within a second feedback circuit, wherein the first feedback circuit generates a cantilever control signal in response to vertical displacement of the self-actuated cantilever during a scanning operation, and the second feedback circuit is responsive to the cantilever control signal to generate a position control signal. A Z position actuator is also included within the second feedback circuit and is responsive to the position control signal to position the sample. In operation, preferably, the cantilever control signal alone is indicative of the topography of the sample surface. In a further embodiment, the first feedback circuit includes an active damping circuit for modifying the quality factor (“Q”) of the cantilever resonance to optimize the bandwidth of the cantilever response.

    摘要翻译: AFM将AFM Z位置执行器和自动Z位置悬臂(可循环模式和接触模式)两者兼容,并配有适当的嵌套反馈控制电路,实现高速成像和精确的Z位置测量。 用于分析样品表面的AFM的优选实施例包括具有与其集成的Z定位元件的自动致动悬臂,以及振荡器,该振荡器以大体上等于自身的共振频率的频率振荡自动致动悬臂, 并且在大致等于设定值的振荡幅度下。 AFM包括嵌套在第二反馈电路内的第一反馈电路,其中第一反馈电路在扫描操作期间响应于自致动悬臂的垂直位移而产生悬臂控制信号,并且第二反馈电路响应于悬臂 控制信号以产生位置控制信号。 Z位置致动器还包括在第二反馈电路内,并且响应于位置控制信号来定位样品。 在操作中,优选地,悬臂控制信号单独指示样品表面的形貌。 在另一实施例中,第一反馈电路包括用于修改悬臂谐振的质量因子(“Q”)的主动阻尼电路,以优化悬臂响应的带宽。