公开(公告)号：US20240387390A1

公开(公告)日：2024-11-21

申请号：US18671478

申请日：2024-05-22

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Jun Zhai

IPC: H01L23/538 ,  H01L21/66 ,  H01L23/00 ,  H01L23/488 ,  H01L23/498 ,  H01L23/522 ,  H01L23/528 ,  H01L23/58 ,  H01L25/18

Abstract: Stitched die structures, and methods for interconnecting die are described. In an embodiment, a stitched die structure includes a semiconductor substrate that includes a first die area of a first die and a second die area of a second die separate from the first die area. A back-end-of-the-line (BEOL) build-up structure spans over the first die area and the second die area, and includes a first metallic seal directly over a first peripheral area of the first die area, a second metallic seal directly over a second peripheral area of the second die area, and a die-to-die routing extending through the first metallic seal and the second metallic seal to electrically connect the first die to the second die.

公开(公告)号：US12119275B2

公开(公告)日：2024-10-15

申请号：US17461207

申请日：2021-08-30

Applicant: Apple Inc.

Inventor： Wei Chen ,  Jie-Hua Zhao ,  Jun Zhai

IPC: H01L23/053 ,  H01L23/10

CPC classification number: H01L23/053 ,  H01L23/10

Abstract: Modules and methods of assembly are described. A module includes a lid mounted on a module substrate and covering a component. A stiffener structure may optionally be mounted between the lid and module substrate. A recess can be formed in any of an outer wall bottom surface of the lid, and top or bottom surface of the stiffener structure such that an adhesive layer at least partially fills the recess.

公开(公告)号：US12033982B2

公开(公告)日：2024-07-09

申请号：US17457350

申请日：2021-12-02

Applicant: Apple Inc.

Inventor： Jun Zhai

IPC: H01L25/065

CPC classification number: H01L25/0657 ,  H01L2224/05009 ,  H01L2225/06513

Abstract: Reconstructed 3DIC structures and methods of manufacture are described. In an embodiment, one or more dies in each package level of a 3DIC are both functional chips and/or stitching devices for two or more dies in an adjacent package level. Thus, each die can function as a communication bridge between two other dies/chiplets in addition to performing a separate chip core function.

公开(公告)号：US12021035B2

公开(公告)日：2024-06-25

申请号：US17931343

申请日：2022-09-12

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Jun Zhai

IPC: H01L23/538 ,  H01L21/66 ,  H01L23/00 ,  H01L23/488 ,  H01L23/498 ,  H01L23/522 ,  H01L23/528 ,  H01L23/58 ,  H01L25/18

CPC classification number: H01L23/5389 ,  H01L22/32 ,  H01L23/488 ,  H01L23/49838 ,  H01L23/522 ,  H01L23/5283 ,  H01L23/58 ,  H01L24/19 ,  H01L24/20 ,  H01L24/24 ,  H01L24/73 ,  H01L24/92 ,  H01L25/18 ,  H01L22/34 ,  H01L24/06

Abstract: Stitched die structures, and methods for interconnecting die are described. In an embodiment, a stitched die structure includes a semiconductor substrate that includes a first die area of a first die and a second die area of a second die separate from the first die area. A back-end-of-the-line (BEOL) build-up structure spans over the first die area and the second die area, and includes a first metallic seal directly over a first peripheral area of the first die area, a second metallic seal directly over a second peripheral area of the second die area, and a die-to-die routing extending through the first metallic seal and the second metallic seal to electrically connect the first die to the second die.

公开(公告)号：US20240105704A1

公开(公告)日：2024-03-28

申请号：US18458918

申请日：2023-08-30

Applicant: Apple Inc.

Inventor： Chonghua Zhong ,  Jiongxin Lu ,  Kunzhong Hu ,  Jun Zhai ,  Sanjay Dabral

IPC: H01L25/18 ,  G02B6/43 ,  H01L23/00

CPC classification number: H01L25/18 ,  G02B6/43 ,  H01L24/08 ,  H01L28/10 ,  H01L28/40 ,  H01L2224/08145 ,  H01L2224/08225

Abstract: Semiconductor packages formed utilizing wafer reconstitution and optionally including an integrated heat spreader and methods of fabrication are described. In an embodiment, a semiconductor package includes a first package level, a second package level including one or more second-level chiplets. A heat spreader may be bonded to the second package level with a metallic layer, which may include one or more intermetallic compounds formed by transient liquid phase bonding. The chiplets within the first and/or second package levels may optionally be connected with one or more optical interconnect paths.

公开(公告)号：US20240105626A1

公开(公告)日：2024-03-28

申请号：US18296587

申请日：2023-04-06

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Jun Zhai ,  Kunzhong Hu ,  SivaChandra Jangam ,  Zhitao Cao

IPC: H01L23/538 ,  H01L23/498

CPC classification number: H01L23/5381 ,  H01L23/49894 ,  H01L23/5383 ,  H01L28/40

Abstract: Semiconductor packages including local interconnects and methods of fabrication are described. In an embodiment, a local interconnect is fabricated with one or more cavities filled with a low-k material or air gap where a die-to-die routing path electrically connecting the first die and the second die includes the metal wire spanning across the one or more cavities. In other embodiments fanout can be utilized to create a wider bump pitch for the local interconnect, or for the local interconnect to connect core regions of the dies. Multiple local interconnects can also be utilized to scale down electrostatic discharge.

公开(公告)号：US20240088032A1

公开(公告)日：2024-03-14

申请号：US17932182

申请日：2022-09-14

Applicant: Apple Inc.

Inventor： Vidhya Ramachandran ,  Chi Nung Ni ,  Chueh-An Hsieh ,  Rekha Govindaraj ,  Jun Zhai ,  Long Huang ,  Rohan U. Mandrekar ,  Saumya K. Gandhi ,  Zhuo Yan ,  Yizhang Yang ,  Saurabh P. Sinha ,  Antonietta Oliva

IPC: H01L23/528 ,  H01L23/00 ,  H01L23/48 ,  H01L23/522 ,  H01L49/02

CPC classification number: H01L23/5283 ,  H01L23/481 ,  H01L23/5226 ,  H01L24/08 ,  H01L24/16 ,  H01L28/40 ,  H01L2224/08265 ,  H01L2224/16225

Abstract: Microelectronic modules are described. In an embodiment, a microelectronic module includes a module substrate, a chip mounted onto the module substrate, and a semiconductor-based integrated passive device between the chip and the module substrate. The semiconductor-based integrated passive device may include an upper RDL stack-up with thicker wiring layers than a lower BEOL stack-up. The semiconductor-based integrated passive device may be further solder bonded or hybrid bonded with the chip.

公开(公告)号：US20240014178A1

公开(公告)日：2024-01-11

申请号：US18348641

申请日：2023-07-07

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Jun Zhai ,  Kwan-Yu Lai ,  Kunzhong Hu ,  Vidhya Ramachandran

IPC: H01L25/065 ,  H01L21/56 ,  H01L21/768 ,  H01L21/78 ,  H01L21/66 ,  H01L23/48 ,  H01L23/60 ,  H01L23/00 ,  H01L25/00

CPC classification number: H01L25/0657 ,  H01L21/561 ,  H01L21/568 ,  H01L21/76897 ,  H01L21/78 ,  H01L22/32 ,  H01L23/481 ,  H01L23/60 ,  H01L24/96 ,  H01L25/50 ,  H01L2224/95001 ,  H01L2225/06524 ,  H01L2225/06541 ,  H01L2225/06596 ,  H01L2924/30205

Abstract: Stitched die packaging techniques and structures are described in which reconstituted chips are formed using wafer reconstitution and die-stitching techniques. In an embodiment, a chip includes a reconstituted chip-level back end of the line (BEOL) build-up structure to connect a die set embedded in an inorganic gap fill material.

公开(公告)号：US11862557B2

公开(公告)日：2024-01-02

申请号：US17483535

申请日：2021-09-23

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Jun Zhai ,  Jung-Cheng Yeh ,  Kunzhong Hu ,  Raymundo Camenforte ,  Thomas Hoffmann

IPC: H01L21/00 ,  H01L23/528 ,  H01L23/538 ,  H01L23/48 ,  H01L25/065 ,  H01L23/58 ,  H01L21/66 ,  H01L23/00 ,  H01L21/78

CPC classification number: H01L23/528 ,  H01L23/481 ,  H01L23/5386 ,  H01L23/585 ,  H01L25/0652 ,  H01L25/0655 ,  H01L21/78 ,  H01L22/20 ,  H01L24/05 ,  H01L24/06 ,  H01L24/08 ,  H01L24/30 ,  H01L24/32 ,  H01L2224/0557 ,  H01L2224/06181 ,  H01L2224/08145 ,  H01L2224/08225 ,  H01L2224/30181 ,  H01L2224/32145 ,  H01L2224/32225

Abstract: Multi-die structures and methods of fabrication are described. In an embodiment, a multi-die structure includes a first die, a second die, and die-to-die routing connecting the first die to the second die. The die-to-die interconnection may be monolithically integrated as a chip-level die-to-die routing, or external package-level die-to-die routing.

公开(公告)号：US20230335494A1

公开(公告)日：2023-10-19

申请号：US18339102

申请日：2023-06-21

Applicant: Apple Inc.

Inventor： Sanjay Dabral ,  Zhitao Cao ,  Kunzhong Hu ,  Jun Zhai

IPC: H01L23/528 ,  H01L23/498 ,  H01L23/538 ,  H01L25/065 ,  H05K1/11 ,  H05K1/18

CPC classification number: H01L23/5286 ,  H01L23/49816 ,  H01L23/5381 ,  H01L23/5383 ,  H01L23/5386 ,  H01L23/5389 ,  H01L25/0652 ,  H05K1/111 ,  H05K1/181 ,  H01L24/16

Abstract: Electronic package structures and systems are described in which a 3D interconnect structure is integrated into a package redistribution layer and/or chiplet for power and signal delivery to a die. Such structures may significantly improve input output (TO) density and routing quality for signals, while keeping power delivery feasible.