Method of fabricating an electromechanical device including at least one active element
    152.
    发明授权
    Method of fabricating an electromechanical device including at least one active element 有权
    制造包括至少一个有源元件的机电装置的方法

    公开(公告)号:US08076169B2

    公开(公告)日:2011-12-13

    申请号:US12488882

    申请日:2009-06-22

    Abstract: The invention relates to a method of fabricating an electromechanical device including an active element, wherein the method comprises the following steps:a) making a monocrystalline first stop layer on a monocrystalline layer of a first substrate;b) growing a monocrystalline mechanical layer epitaxially on said first stop layer out of at least one material that is different from that of the stop layer;c) making a sacrificial layer on said active layer out of a material that is suitable for being etched selectively relative to said mechanical layer;d) making a bonding layer on the sacrificial layer;e) bonding a second substrate on the bonding layer; andf) eliminating the first substrate and the stop layer to reveal the surface of the mechanical layer opposite from the sacrificial layer, the active element being made by at least a portion of the mechanical layer.

    Abstract translation: 本发明涉及一种制造包括有源元件的机电装置的方法,其中该方法包括以下步骤:a)在第一衬底的单晶层上制备单晶第一阻挡层; b)在所述第一停止层上外延生长至少一种不同于所述停止层的材料的单晶机械层; c)在适合于相对于所述机械层选择性蚀刻的材料中在所述有源层上制造牺牲层; d)在牺牲层上形成结合层; e)在接合层上粘合第二衬底; 以及f)消除所述第一衬底和所述阻挡层以露出与所述牺牲层相对的所述机械层的表面,所述有源元件由所述机械层的至少一部分制成。

    METHOD FOR TRANSFERRING AN EPITAXIAL LAYER FROM A DONOR WAFER TO A SYSTEM WAFER APPERTAINING TO MICROSYSTEMS TECHNOLOGY
    155.
    发明申请
    METHOD FOR TRANSFERRING AN EPITAXIAL LAYER FROM A DONOR WAFER TO A SYSTEM WAFER APPERTAINING TO MICROSYSTEMS TECHNOLOGY 审中-公开
    将离子层转移到微波技术的系统中的方法

    公开(公告)号:US20100330506A1

    公开(公告)日:2010-12-30

    申请号:US12669933

    申请日:2008-07-18

    Applicant: Roy Knechtel

    Inventor: Roy Knechtel

    Abstract: For bonding a donor wafer (1) and a system wafer (9) an edge bead (3) of an epitaxial layer (2) on the donor wafer is flattened or completely removed by etching so that a reliable contact after bonding up to the edge region (5, 6) is possible. The etching mask is produced by means of a resist layer (4) as well as by means of removal of resist at the edge, free exposure and developing without a special photomask.

    Abstract translation: 为了接合供体晶片(1)和系统晶片(9),施主晶片上的外延层(2)的边缘(3)被平坦化或通过蚀刻完全去除,使得在结合到边缘之后的可靠接触 区域(5,6)是可能的。 蚀刻掩模通过抗蚀剂层(4)以及通过在边缘处去除抗蚀剂而产生,在没有特殊光掩模的情况下自由曝光和显影。

    METHOD OF FABRICATING AN ELECTROMECHANICAL DEVICE INCLUDING AT LEAST ONE ACTIVE ELEMENT
    158.
    发明申请
    METHOD OF FABRICATING AN ELECTROMECHANICAL DEVICE INCLUDING AT LEAST ONE ACTIVE ELEMENT 有权
    制造包括至少一个活动元件的电气设备的方法

    公开(公告)号:US20090317931A1

    公开(公告)日:2009-12-24

    申请号:US12488882

    申请日:2009-06-22

    Abstract: The invention relates to a method of fabricating an electromechanical device including an active element, wherein the method comprises the following steps:a) making a monocrystalline first stop layer on a monocrystalline layer of a first substrate;b) growing a monocrystalline mechanical layer epitaxially on said first stop layer out of at least one material that is different from that of the stop layer;c) making a sacrificial layer on said active layer out of a material that is suitable for being etched selectively relative to said mechanical layer;d) making a bonding layer on the sacrificial layer;e) bonding a second substrate on the bonding layer; andf) eliminating the first substrate and the stop layer to reveal the surface of the mechanical layer opposite from the sacrificial layer, the active element being made by at least a portion of the mechanical layer.

    Abstract translation: 本发明涉及一种制造包括有源元件的机电装置的方法,其中该方法包括以下步骤:a)在第一衬底的单晶层上制备单晶第一阻挡层; b)在所述第一停止层上外延生长至少一种不同于所述停止层的材料的单晶机械层; c)在适合于相对于所述机械层选择性蚀刻的材料中在所述有源层上制造牺牲层; d)在牺牲层上形成结合层; e)在接合层上粘合第二衬底; 以及f)消除所述第一衬底和所述阻挡层以露出与所述牺牲层相对的所述机械层的表面,所述有源元件由所述机械层的至少一部分制成。

    Method and device for controlled cleaving process
    160.
    发明授权
    Method and device for controlled cleaving process 有权
    控制裂解过程的方法和装置

    公开(公告)号:US07470600B2

    公开(公告)日:2008-12-30

    申请号:US11842104

    申请日:2007-08-20

    Abstract: A technique for forming a film of material (12) from a donor substrate (10). The technique has a step of forming a stressed region in a selected manner at a selected depth (20) underneath the surface. An energy source such as pressurized fluid is directed to a selected region of the donor substrate to initiate a controlled cleaving action of the substrate (10) at the selected depth (20), whereupon the cleaving action provides an expanding cleave front to free the donor material from a remaining portion of the donor substrate.

    Abstract translation: 一种用于从供体衬底(10)形成材料(12)的膜的技术。 该技术具有以选定的方式在表面下方的选定深度(20)处形成应力区域的步骤。 诸如加压流体的能量源被引导到供体基底的选定区域,以在所选择的深度(20)处引发基底(10)的受控切割作用,因此所述切割动作提供扩张切割前缘以释放供体 来自供体衬底的剩余部分的材料。

Patent Agency Ranking