FTIR System and Method for Compositional Analysis of Matter
    153.
    发明申请
    FTIR System and Method for Compositional Analysis of Matter 审中-公开
    FTIR系统及其成分分析方法

    公开(公告)号:US20170059411A1

    公开(公告)日:2017-03-02

    申请号:US14835814

    申请日:2015-08-26

    Abstract: The present application is directed to a system and method for analysis of a predefined component (e.g., moisture, acid, or carbonate base content) of matter using a reagent that reacts with the predefined component to produce carbon dioxide gas. FTIR analyses are performed on contents of sealed vessels that hold a number of standard mixtures which include the reagent and a component part similar to the predefined component at different concentrations of the component part in order to derive a calibration equation that relates concentration of the predefined component to absorbance in a predefined spectral band characteristic of carbon dioxide gas concentration. FTIR analysis is performed on the contents of a sealed vessel that holds a mixture derived from a sample and the reagent. Data that characterizes concentration of the predefined component in the sample is calculated based on the absorbance in the predefined spectral band and the calibration equation.

    Abstract translation: 本申请涉及一种用于使用与预定义组分反应产生二氧化碳气体的试剂来分析物质的预定组分(例如,水分,酸或碳酸盐碱含量)的系统和方法。 对包含试剂的多个标准混合物的密封容器的内容进行FTIR分析,并且在组分部分的不同浓度下与预定义的组分类似的组分部分进行FTIR分析,以得出校准方程,其将预定组分的浓度 以二氧化碳气体浓度的预定光谱带特征的吸光度。 对保持来自样品和试剂的混合物的密封容器的内容进行FTIR分析。 基于预定光谱带和校准方程中的吸光度计算表征样品中预定组分浓度的数据。

    SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROMETERS
    158.
    发明申请
    SELF CALIBRATION FOR MIRROR POSITIONING IN OPTICAL MEMS INTERFEROMETERS 有权
    自动校准用于光学MEMS干涉仪中的镜像定位

    公开(公告)号:US20160231172A1

    公开(公告)日:2016-08-11

    申请号:US15130876

    申请日:2016-04-15

    Abstract: A Micro-Electro-Mechanical System (MEMS) apparatus provides for self-calibration of mirror positioning of a moveable mirror of an interferometer. At least one mirror in the MEMS apparatus includes a non-planar surface. The moveable mirror is coupled to a MEMS actuator having a variable capacitance. The MEMS apparatus includes a capacitive sensing circuit for determining the capacitance of the MEMS actuator at multiple reference positions of the moveable mirror corresponding to a center burst and one or more secondary bursts of an interferogram produced by the interferometer based on the non-planar surface. A calibration module uses the actuator capacitances at the reference positions to compensate for any drift in the capacitive sensing circuit.

    Abstract translation: 微机电系统(MEMS)装置提供干涉仪可移动反射镜的镜像定位的自校准。 MEMS装置中的至少一个反射镜包括非平面表面。 可移动镜连接到具有可变电容的MEMS致动器。 MEMS装置包括电容感测电路,用于确定MEMS致动器在可移动镜的对应于中心脉冲串的多个参考位置处的电容,以及由干涉仪基于非平面表面产生的干涉图的一个或多个二次脉冲串。 校准模块使用参考位置处的致动器电容来补偿电容感测电路中的任何漂移。

    INTERFEROMETER FOR SPATIAL CHIRP CHARACTERIZATION
    160.
    发明申请
    INTERFEROMETER FOR SPATIAL CHIRP CHARACTERIZATION 有权
    用于空间戒指特征的干涉仪

    公开(公告)号:US20160109298A1

    公开(公告)日:2016-04-21

    申请号:US14887114

    申请日:2015-10-19

    CPC classification number: G01J11/00 G01J3/45 G02B5/122 G02B27/149

    Abstract: Spectral interferometric systems and methods to characterize lateral and angular spatial chirp to optimize intensity localization in spatio-temporally focused ultrafast beams are described. Interference between two spatially sheared beams in an interferometer leads to straight fringes if the wavefronts are curved. To produce reference fringes, one arm relative to another is delayed in order to measure fringe rotation in the spatially resolved spectral interferogram. Utilizing Fourier analysis, frequency-resolved divergence is obtained. In another arrangement, one beam relative to the other is spatially flipped, which allows the frequency-dependent beamlet direction (angular spatial chirp) to be measured. Blocking one beam shows the spatial variation of the beamlet position with frequency (i.e., the lateral spatial chirp).

    Abstract translation: 描述了用于表征横向和角度空间啁啾的光谱干涉测量系统和方法以优化时空聚焦超快速波束中的强度定位。 如果波前弯曲,干涉仪中的两个空间剪切光束之间的干涉将导致直线条纹。 为了产生参考条纹,相对于另一个臂的一个臂被延迟以便在空间分辨的光谱干涉图中测量边缘旋转。 利用傅立叶分析,得到频率分辨发散。 在另一种布置中,相对于另一个的一个光束在空间上翻转,这允许测量频率相关的子束方向(角空间啁啾)。 阻挡一个光束以频率(即侧向空间啁啾)示出子束位置的空间变化。

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