Abstract:
Embodiments relate to a Floating Body Dynamic Random Access Memory (FBDRAM). The FBDRAM utilizes a purge line to reset a FBDRAM cell, prior to writing data to the FBDRAM cell.
Abstract:
A double gate MOSFET having a control gate and a signal gate. The effective threshold voltage seen by the signal gate may be modified by charging the control gate. The effective threshold voltage may be increased in magnitude to reduce sub-threshold leakage current when the double gate MOSFET is inactive. When inactive, the control gate is maintained at a negative voltage for a double gate nMOSFET, and is maintained at a positive voltage for a double gate pMOSFET. When active, the control gate is charged to a voltage close to the threshold voltage, and then floated, so that a signal voltage applied to the signal gate may turn the double gate MOSFET ON during a signal voltage transition via the coupling capacitance between the signal and control gates.
Abstract:
An apparatus and method are provided for limiting a drop of a supply voltage in an SRAM device to retain the state of the memory during an IDLE state. The apparatus may include a memory array, a sleep device, and a clamping circuit. The clamping circuit may be configured to activate the sleep device when a voltage drop across the memory array falls below a preset voltage and the memory array is in an IDLE state.
Abstract:
An apparatus and method for generating a reference in a memory circuit are disclosed. At least two dummy bit-cells are used to generate a reference voltage. One cell has high value stored and the other has a low value stored. The cells are activated and discharged into respective bit-lines. The bit-lines are equalized during the discharge process to generate a reference that is approximately a mid point between a high value cell and a low value cell.
Abstract:
A SRAM with reduced subthreshold leakage current, the SRAM including a pMOSFET with its gate at VSS and its source at VCC, and a diode-connected pMOSFET with its source at VCC, where the drains of the pMOSFET and the diode-connected pMOSFET are connected together to provide a voltage VCCL, where VSS
Abstract translation:具有降低的亚阈值漏电流的SRAM,SRAM包括其栅极为V SS的pMOSFET及其源极为V CC,以及二极管连接的pMOSFET,其源极为 其中pMOSFET和二极管连接的pMOSFET的漏极连接在一起,以提供一个电压V CCL,其中V SS SS < CCL SUB> CC SUB>。 二极管连接的pMOSFET的β基本上大于pMOSFET的β。 在读取操作期间,与每个存储器单元相关联的字线被驱动到电压-V EE EE,其中-V SS和/ CCL SUB> <=> CC SUB> CCL SUB>。 每个存储单元具有交叉耦合的反相器以存储数据位,其中交叉耦合的反相器具有其源极为V CCL SUB>的pMOSFET。
Abstract:
A static random access memory (SRAM) is provided that includes a logic circuit coupled to a column select signal line and a leakage reduction circuit coupled to the logic circuit and a bit line pair of a column. The logic circuit may control the leakage reduction circuit so as to reduce leakage through a column select device that is not selected.
Abstract:
Embodiments of the present invention relate to current and/or voltage generation. The current and/or voltage generation may be process independent. Accordingly, variances in a manufacturing process will not substantially affect the ultimate current or voltage output from the circuit.
Abstract:
A radiation measuring technique includes adjusting a threshold level of a radiation sensor in a radiation-measuring circuit and obtaining an output signal based on radiation dose sensed by the radiation sensor.
Abstract:
A pulse generator system includes a plurality of buffers at least two transmission gates. The inverters successively and input insert delays into an signal having a series of pulses, each pulse having first and second edges. The transmission gates are operatively coupled to the inverters. The first transmission gate selectively passes the input signal. The second transmission gape selectively passes inverted signal of the input signal.