Abstract:
Methods and systems to read a logic value stored in a magnetic tunnel junction (MTJ)-based memory cell based on a pulsed read current, with time between pulses to permit the MTJ to relax towards the magnetization orientation between the pulses, which may reduce build-up of momentum within the MTJ, and which may reduce and/or eliminate inadvertent re-alignment of a magnetization orientation. A sequence of symmetric and/or non-symmetric pulses may be applied to a wordline (WL) to cause a pre-charged bit line (BL) capacitance to discharge a pulsed read current through the MTJ, resulting in a corresponding sequence of voltage changes on the BL. The BL voltage changes may be integrated over the sequence of read current pulses, and a stored logic value may be determined based on the integrated voltage changes. The pre-charged BL capacitance may also serve as the voltage integrator.
Abstract:
A NOR architecture for selecting a word line driver in a DRAM is disclosed. Complements of separately decoded addresses in the low, mid and high ranges are used to select a final word line driver. The output of the word line driver is at a potential negative with respect to ground for a deselected word line and a positive potential more positive than the power supply potential for a selected word line.
Abstract:
A hierarchical DRAM sensing apparatus and method which employs local bit line pairs and global bit lines. A word line selects the cells in a cluster of sense amplifiers, each of the amplifiers being associated with a pair of bit lines. One of the local bit lines is selected for coupling to global bit lines and a global sense amplifier. Clusters are located in a plurality of subarrays forming a bank with the global bit lines extending from each of the banks to the global sense amplifier.
Abstract:
A NAND architecture for selecting a word line driver in a DRAM is disclosed. Separately decoded addresses in the low, mid and high ranges are used to select a final word line driver. The output of the word line driver is at a potential negative with respect to ground for a deselected word line and a positive potential more positive than the power supply potential for a selected word line.
Abstract:
Techniques are disclosed that allow for power conservation in integrated circuit memories, such as SRAM. The techniques can be embodied in circuitry that allows for floating of bitlines to eliminate or otherwise reduce power leakage associated with precharging bitlines. For instance, the techniques can be embodied in a bitline floating circuit having a single logic gate for qualifying the precharge control signal with a wake signal, so that precharging of the bitline does not occur if the wake signal is not in an active state. The techniques further allow for the elimination or reduction of unnecessary power consumption by the I/O circuitry or the memory array, such as when the memory array is not being accessed or when the array or a portion thereof is permanently disabled for yield recovery.
Abstract:
For one disclosed embodiment, circuitry may bias one or more wells of a substrate from a first state to a second state. Bias by the circuitry of one or more wells of the substrate to the second state may be boosted. Other embodiments are also disclosed.
Abstract:
A circuit and method for reducing noise in a memory circuit is disclosed. In one embodiment, the circuit includes an amplifier, a first transistor and a second transistor. The first transistor is capable of pulling up a first input port of the amplifier in response to a complement of the second memory signal. The second transistor is capable of pulling of a second input port of the amplifier in response to a complement of the first memory signal. In one embodiment, the method includes receiving a first memory signal at a first input port of an amplifier, receiving a second memory signal at a second input port of the amplifier, and pulling up the second input port in response to a complement of the first memory signal.
Abstract:
An IC device may include a CMOS layer and memory layers at the frontside and backside of the CMOS layer. The CMOS layer may include one or more logic circuits with MOSFET transistors. The CMOS layer may also include memory cells, e.g., SRAM cells. A memory layer may include one or more memory arrays. A memory array may include memory cells (e.g., DRAM cells), bit lines, and word lines. A logic circuit in the CMOS layer may control access to the memory cells. A memory layer may be bonded with the CMOS layer through a bonding layer that includes conductive structures coupled to a logic circuit in the CMOS layer or to bit lines or word lines in the memory layer. An additional conductive structure may be at the backside of a MOSFET transistor in the CMOS layer and coupled to a conductive structure in the bonding layer.
Abstract:
An apparatus is described that includes a bit line. The apparatus also includes first and second storage cells coupled to the bit line. The first storage cell has a first access transistor. The first access transistor is coupled to a first line resistance. The second storage cell has a second access transistor. The second access transistor is coupled to a second line resistance. The second line resistance is greater than the first line resistance. The apparatus also includes first and second drivers that are coupled to the bit line. The second driver is a stronger driver than the first driver. The apparatus also includes circuitry to select the first driver to write information into the first storage cell and select the second driver to write information into the second storage cell.
Abstract:
Techniques are disclosed that allow for power conservation in integrated circuit memories, such as SRAM. The techniques can be embodied in circuitry that allows for floating of bitlines to eliminate or otherwise reduce power leakage associated with precharging bitlines. For instance, the techniques can be embodied in a bitline floating circuit having a single logic gate for qualifying the precharge control signal with a wake signal, so that precharging of the bitline does not occur if the wake signal is not in an active state. The techniques further allow for the elimination or reduction of unnecessary power consumption by the I/O circuitry or the memory array, such as when the memory array is not being accessed or when the array or a portion thereof is permanently disabled for yield recovery.