摘要:
An external high/low voltage compatible semiconductor memory device includes an internal voltage pad, an internal voltage generation circuit, and an internal voltage control signal generation circuit. The internal voltage pad connects a low external voltage with an internal voltage, and the internal voltage generation circuit generates an internal voltage in response to an internal voltage control signal and a high external voltage. The internal voltage control signal generation circuit generates an internal voltage control signal according to an high or low external voltage. Thus, a database of the semiconductor memory device can be managed without classifying the database into databases for the high voltage and databases for the low voltage because of the internal voltage control signal. In addition, the internal voltage level is stable because charges provided to the internal voltage are regulated according to a voltage level of the external voltage.
摘要:
A bit line pre-charge circuit of a semiconductor memory device includes a pre-charge circuit connected between a pair of bit lines for pre-charging the pair of bit lines in response to a pre-charge control signal and a pre-charge voltage transmitting circuit for transmitting a pre-charge voltage to the pre-charge circuit in response to the pre-charge control signal. A voltage drop in a pre-charge voltage generation line may be prevented when a short circuit is formed between a word line and a pair of bit lines, and current consumption during a standby operation of the semiconductor memory device may also be reduced, by preventing current from flowing from the pair of bit lines to the pre-charge voltage generation line.
摘要:
An inrush current prevention circuit for a DC-DC converter is provided and in preferred aspects comprises a switching element that transforms an input voltage by being switched on and off and outputs the transformed voltage. A filter filtrates the outputted voltage, transformed via the switching element, and outputs the filtrated voltage as an output voltage. A reference voltage generator generates a reference voltage. An error amplifier compares the reference voltage and output voltage and outputs an error signal. A Pulse Width Modulation (PWM) signal generator generates a PWM signal to switch on and off the switching element according to the error signal. An on-off circuit either transmits or isolates the PWM signal to the switching element. An Electronic Control Unit (ECU) controls the on-off circuit. Preferred systems of the invention can prevent an inrush current immediately following power input or during reactivation of the DC-DC converter.
摘要:
Multi-bank integrated circuit memory devices include a plurality of banks of memory cells that are divided into pairs of sub-banks of memory cells. The sub-banks of memory cells are arranged in a plurality of rows and columns of sub-banks of memory cells. The pairs of sub-banks extend diagonally relative to the plurality of rows and columns of sub-banks of memory cells. The pairs of sub-banks of the respective banks preferably are adjacent one another and extend diagonally relative to the plurality of rows and columns of sub-banks of memory cells. By providing diagonally extending sub-banks, the row address lines that extend between respective sub-banks of each bank may occupy reduced area. More specifically, row address lines that extend between pairs of sub-banks in same adjacent rows and same adjacent columns can cross over one another to thereby allow reduced area.
摘要:
A synchronous semiconductor memory device having a wave pipelining control structure and a method of outputting data therefrom. A register for storing the data output from a memory cell is controlled by a control signal in response to first and second external clock signals. The level transition of the control signal derived from the first clock is delayed, so that data output malfunctioning is prevented even though manufacturing process conditions are changed.
摘要:
A signal generator produces enable signals for bitline sense amplifiers in a semiconductor device. The signal generator includes a first driving element for producing a first enable signal at a first output line in response to first and second control signals, a second driving element for producing a second enable signal at a second output line in response to inverted signals of the first and second control signals, and an equalizing element connected between the first output line and the second output line for equalizing the first and second output lines in response to a third control signal. A control signal generating element generates the first, second, and third control signals, and inverted signals thereof, in response to predetermined input signals. The DC current generated from an output driver and the charging and discharging current of output loading can be reduced, to thereby reduce power consumption. Also, when the output signals are applied as enable signals of bitline sense amplifiers, an initial invalid sensing the bitline sense amplifier circuits can be avoided.
摘要:
An integrated circuit memory device includes an array of memory cells arranged into rows and columns. A main word line decoder receives a first portion of a row address and generates a main word line activation signal on a predetermined word line in response thereto. A word driver predecoder receives a second portion of the row address and generates a sub-row activation signal in response thereto. A sub-word line driver generates a sub-word line activation signal on an output node. This sub-word line driver includes a pull-down transistor, a pull-up transistor, and a driving transistor. The pull-down transistor electrically connects the output node to a ground terminal in response to an inverse of the sub-row activation signal. The pull-up transistor transfers the sub-row activation signal to the output node in response to the main word line activation signal. The driving transistor transfers the main word line activation signal to the output node in response to the sub-row activation signal. A sub-word line electrically connects the output node and a predetermined memory cell so that the predetermined memory cell is activated in response to the sub-word line activation signal.
摘要:
Programmable disabling and selection circuits operate on a block level for integrated circuit memory devices. Thus, a redundant block can be substituted for a block having more defective rows and/or columns than the number of redundant rows and/or columns which are provided in the integrated circuit memory devices. A plurality of normal block selection circuits are included, a respective one of which produces a respective normal block selection signal in response to an address of a respective one of the plurality of blocks of memory cells. A plurality of programmable block selection circuits are also included, a respective one of which is connected between the respective one of the plurality of normal block selection circuits and a respective one of the plurality of blocks of memory cells. Each programmable block selection circuit includes a first fuse, the activation of which blocks the corresponding one of the plurality of normal block selection circuits. Each of the programmable block selection circuits further includes a plurality of second fuses, the activation of which generates a replacement address for the corresponding one of the plurality of blocks of memory cells. A plurality of block disable circuits are also included, a respective one of which is connected to a respective one of the plurality of blocks of memory cells. Each of the plurality of block disable circuits includes a fuse, the activation of which disables the corresponding one of the plurality of blocks of memory cells.
摘要:
A MRAM includes a memory cell array of spin-transfer torque magnetic random access memory (STT-MRAM) cells and a source line commonly connected to the plurality of STT-MRAM cells. A source line voltage generator generates a source line driving voltage in response to an external power supply voltage and provides the source line driving voltage to the source line.
摘要:
A layout structure of bit line sense amplifiers for use in a semiconductor memory device includes first and second bit line sense amplifiers arranged to share and be electrically controlled by a first column selection line signal, and each including a plurality of transistors. In this layout structure, each of the plurality of transistors forming the first bit line sense amplifier is arranged so as not to share an active region with any transistors forming the second bit line sense amplifier.