摘要:
A signal line drive circuit for a semiconductor device includes a first driver having an input for receiving an input signal and an output, a second driver having an input connected to the output of the first driver and an output connected to a signal line, and a third driver having an input connected to the output of the first driver and an output connected to a point of the signal line. The point of the signal line is spaced from the output of the second driver such that a first load is present between the output of the second driver and the point of the signal line, and such that a second load is present between the point of the signal line and an output of the signal line. The first, second and third drivers each include at least one inverting buffer. The drive circuit reduces a delay time of a signal transmitted through the signal line, and improves the voltage-time slope of the transmitted signal.
摘要:
A synchronous semiconductor memory device having a wave pipelining control structure and a method of outputting data therefrom. A register for storing the data output from a memory cell is controlled by a control signal in response to first and second external clock signals. The level transition of the control signal derived from the first clock is delayed, so that data output malfunctioning is prevented even though manufacturing process conditions are changed.
摘要:
Integrated circuit memory devices include a semiconductor substrate of first conductivity type (e.g., P-type), a first well region of second conductivity type (e.g., N-type) in the substrate and first and second nonoverlapping sub-well regions of first conductivity type in the first well region. To improve the electrical characteristics of circuits within the memory device, a first semiconductor device is provided in the first sub-well region (which is biased at a back-bias potential (Vbb)) and a second semiconductor device is provided in the second sub-well region (which is biased at a ground or negative supply potential (Vss)). The first semiconductor device is preferably selected from the group consisting of memory cell access transistors, equalization circuits and isolation gates. The second semiconductor device is also preferably selected from the group consisting of column select circuits and sense amplifiers.
摘要:
A display apparatus for calibrating a grayscale data including a timing controller, and a method for driving a panel are provided. A display apparatus includes a timing controller which calibrates the grayscale data of the current frame using the grayscale data of the previous and the current frame and a driving unit which drives a panel using the calibrated grayscale data of the current frame. By generating calibrated grayscale data which are variable according to the change of grayscale, response times of liquid crystal may be improved.
摘要:
A back bias generator for a semiconductor device improves refresh characteristics, reduces leakage current, and increases back bias supply capacity in a DRAM having a triple well structure by applying a well bias voltage to the bulk of an NMOS transfer transistor. The back bias generator includes a well bias generator that generates the well bias voltage before the pumping voltage is applied to the transfer transistor. The well bias provides a back bias to a parasitic NPN transistor formed in the triple well of the NMOS transfer transistor, thereby preventing leakage through the NPN into the substrate. The well bias is also applied to the bulk of a clamp transistor that initializes a pumping capacitor.
摘要:
Integrated circuit memory devices include at least first and second memory cells electrically coupled to respective first and second sense bit signal lines of a sense amplifier. The sense amplifier comprises a circuit for amplifying a difference in potential between the first and second sense bit signal lines by driving these lines to respective first and second different potentials. A driving circuit is also provided for simultaneously driving the first and second sense bit signal lines towards the first potential in response to application of a boost control signal. This driving circuit preferably comprises a first capacitor electrically connected in series between the boost control input and the first sense bit signal line and a second capacitor electrically connected in series between the boost control input and the second sense bit signal line. The boost control signal is established at the first potential to drive both the sense bit signal lines from different intermediate potentials (e.g., 1/2VCC+, 1/2VCC) towards the first potential, prior to amplification of the difference in potential between the first and second sense bit signal lines by the sense amplifier. The present invention enables the sense amplifier to operate in an environment where the power supply voltage (e.g., VCC) is reduced and the different intermediate potentials (e.g., 1/2VCC+, 1/2VCC) to be amplified are initially established at potentials below the normal sensitivity of the sense amplifier.
摘要翻译:集成电路存储器件包括电耦合到读出放大器的相应第一和第二感测位信号线的至少第一和第二存储器单元。 感测放大器包括用于通过将这些线驱动到相应的第一和第二不同电位来放大第一和第二感测位信号线之间的电位差的电路。 还提供驱动电路,用于响应于施加升压控制信号,同时将第一和第二感测位信号线驱动朝向第一电位。 该驱动电路优选地包括串联电连接在升压控制输入和第一感测位信号线之间的第一电容器和串联电连接在升压控制输入和第二感测位信号线之间的第二电容器。 升压控制信号被建立在第一电位,以驱动来自不同中间电位(例如,+ E,fra 1/2 + EE VCC +,+ E,fra 1/2 + EE VCC)的感测位信号线朝着第一 在由感测放大器放大第一和第二感测位信号线之间的电位差之前的电位。 本发明使得读出放大器能够在电源电压(例如,VCC)减小的环境中工作,并且不同的中间电位(例如,+ E,fra 1/2 + EE VCC +,+ E, + EE VCC)最初建立在低于读出放大器正常灵敏度的电位。
摘要:
The semiconductor memory device includes a power supply voltage (Vcc) applied to the semiconductor device, a row controller for generating an output signal in response to a control signal representing one of a normal operation state and a stand-by state, and a plurality of row decoders connected between the row controller and a plurality of word lines. Each row decoder activates a corresponding word line in response to the output signal from the row controller and a row address signal from an external source, and the output signal of the row controller is a high voltage or a ground voltage when the plurality of row decoders are in a normal operation state or in a stand-by state, respectively. The semiconductor memory device also includes a column controller for generating an output signal in response to a first control signal representing one of a normal operation state and a stand-by state and a plurality of column decoders connected between the column controller and a plurality of column selection lines. Each column decoder activates a corresponding column selection line in response to the output signal from the column controller, a column address signal, and a second control signal, and the output signal of the column controller is an internal supply voltage or the ground voltage when the plurality of column decoders are in a normal operation state or in a stand-by state, respectively. The semiconductor memory device does not generate leakage current in a stand-by state.
摘要:
An internal power control circuit for a semiconductor device allows easy testing of the internal circuit blocks or memory arrays at various voltage levels. In the semiconductor device, internal voltage switching circuits connected between the internal power supply line and each array power supply line are switched ON or OFF according to signals applied to control pads coupled to each internal voltage switching circuit. During normal operation, a power voltage generated by the internal voltage generator is applied through an internal power supply line to each array power supply line coupled to the internal circuit blocks. During a test operation, different power voltages may be applied to the control pads to selectively decouple individual array power supply lines from the internal power supply line, and selectively couple the power voltages applied to the control pads to the corresponding array power supply lines and internal circuit blocks.
摘要:
Multi-bank integrated circuit memory devices include a plurality of banks of memory cells that are divided into pairs of sub-banks of memory cells. The sub-banks of memory cells are arranged in a plurality of rows and columns of sub-banks of memory cells. The pairs of sub-banks extend diagonally relative to the plurality of rows and columns of sub-banks of memory cells. The pairs of sub-banks of the respective banks preferably are adjacent one another and extend diagonally relative to the plurality of rows and columns of sub-banks of memory cells. By providing diagonally extending sub-banks, the row address lines that extend between respective sub-banks of each bank may occupy reduced area. More specifically, row address lines that extend between pairs of sub-banks in same adjacent rows and same adjacent columns can cross over one another to thereby allow reduced area.
摘要:
A signal generator produces enable signals for bitline sense amplifiers in a semiconductor device. The signal generator includes a first driving element for producing a first enable signal at a first output line in response to first and second control signals, a second driving element for producing a second enable signal at a second output line in response to inverted signals of the first and second control signals, and an equalizing element connected between the first output line and the second output line for equalizing the first and second output lines in response to a third control signal. A control signal generating element generates the first, second, and third control signals, and inverted signals thereof, in response to predetermined input signals. The DC current generated from an output driver and the charging and discharging current of output loading can be reduced, to thereby reduce power consumption. Also, when the output signals are applied as enable signals of bitline sense amplifiers, an initial invalid sensing the bitline sense amplifier circuits can be avoided.