Abstract:
The bit lines are produced by an implantation of a dopant by means of a sacrificial hard mask layer, which is later replaced with the gate electrodes formed of polysilicon in the memory cell array. Striplike areas of the memory cell array, which run transversely to the bit lines, are reserved by a blocking layer to be occupied by the bit line contacts. In these areas, the hard mask is used to form contact holes, which are self-aligned with the implanted buried bit lines. Between the blocked areas, the word lines are arranged normally to the bit lines.
Abstract:
A semiconductor substrate is provided with a recess. A memory layer or memory layer sequence is applied to sidewalls and the bottom of the recess. The memory layer is formed into two separate portions at opposite sidewalls of the recess either by reducing the memory layer to sidewall spacers or by forming sidewall spacers and removing portions of the memory layer that are not covered by the spacers. A gate electrode is applied into the recess, and source/drain regions are formed by an implantation of doping atoms adjacent to the sidewalls of the recess and the remaining portions of the memory layer. The memory layer can especially be a dielectric material suitable for charge-trapping.
Abstract:
The invention relates to a method for automatic measurement and for teaching-in of location positions of objects (11) within a substrate processing system (20, 26) in which a sensor carrier (1) is moved by means of a robot end effector (24). Sensor units (2, 3, 4, 5a, 5b) of the sensor carrier (1) are moved along straight movement lines (B1, B2, B3) across the edges (10a, 10b) of the object (11), wherein each of the sensor units (2, 3, 4, 5a, 5b) output at least one sensor signal which changes its value upon detection of an edge (10a, 10b). From the positions of the signal changes along the respective straight movement lines (B1, B2, B3), the location position of the object (11) is determined. Furthermore, the invention relates to a substrate like movable, wireless sensor carrier for carrying out the method according to the invention, with a carrier plate (1a), at least one first sensor unit (4, 5a, 5b) which is mounted on the carrier plate (1a) and which is arranged to detect a first object edge (10a) and a second object edge (10b) of the object (11) during a movement of the sensor carrier (1) on a straight movement line (B1) perpendicular to an object surface (13), and at least one second sensor unit (2, 3) which is mounted on the carrier plate (Ia) and which is arranged to detect at least a first object edge (10b) of the object (11) during a movement of the sensor carrier (1) on a straight movement line (B2) parallel to the object surface (13).
Abstract:
A tensioning device is provided for a ribbed V-belt of a motor vehicle with at least one tensioning pulley that is directly and functionally connected to the ribbed V-belt and with a controller designed for varying the position and/or configuration of the tensioning pulley in dependence on the instantaneous operating state of at least one belt pulley on a driven side and/or a driving side that is connected to the ribbed V-belt in order to operationally adapt the tension of the ribbed V-belt.
Abstract:
A method is provided for operating a combustion engine of a motor vehicle during a deceleration of the combustion engine. The method includes, but is not limited to determining a degree of depression of an accelerator pedal of the motor vehicle takes place, determining of a degree of depression of a brake pedal of the motor vehicle takes place. Furthermore, an adjusting of a throttle valve arranged in an intake tract of the combustion engine as a function of the determined degree of depression of the accelerator pedal and as a function of the determined degree of depression of the brake pedal takes place. The throttle valve is adjusted into an at least partially opened position in the event that the determined degree of depression of the brake pedal undershoots a first predetermined threshold value and the throttle valve is adjusted into a closed position in the event that the determined degree of depression of the brake pedal exceeds a second predetermined threshold value.
Abstract:
A method is provided for monitoring the light-off temperature of a diesel oxidation catalyst of a combustion engine. The method includes, but is not limited to measuring the temperature of the exhaust gas upstream and downstream of the diesel oxidation catalyst during a post injection phase or after injection phase of the combustion engine, determining whether a catalyst light-off occurred by using the temperature data of the exhaust gas, calculating the surface temperature of the diesel oxidation catalyst by using the measured temperature data of the exhaust gas, and defining the calculated temperature as light-off temperature of the diesel oxidation catalyst in the case that a catalyst light-off is determined. By means of the method, it is possible to determine the actual light-off temperature of the diesel oxidation catalyst for instance after each engine start by means of calculating the surface temperature of the diesel oxidation catalyst. Since the light-off temperature is not considered as a constant but as a changing variable, the aging of the diesel oxidation catalyst is sufficiently considered. Thus, it is provided a means for monitoring the light-off temperature of a diesel oxidation catalyst considering an aging of the diesel oxidation catalyst.
Abstract:
A method for manufacturing an integrated circuit including at least one storage cell is provided. The method includes providing a substrate having a first and second side, and a plurality of parallel trenches so that a dividing wall is formed between adjacent trenches, filling the trenches with an insulating compound, providing a first insulating layer having a first and second side on the top surface of the dividing wall, wherein the first side is arranged on the substrate's first side, providing a first conductive layer having a first and second side, wherein the first side is arranged on the insulating layer's second side, wherein the conductive layer protrudes from the substrate surface, providing a second conductive layer having a first and second side, wherein the first side is located on the first conductive layer's second side, and removing parts of the second conductive layer by an anisotropic etching means.
Abstract:
A method for manufacturing an integrated circuit including at least one storage cell is provided. The method includes providing a substrate having a first and second side, and a plurality of parallel trenches so that a dividing wall is formed between adjacent trenches, filling the trenches with an insulating compound, providing a first insulating layer having a first and second side on the top surface of the dividing wall, wherein the first side is arranged on the substrate's first side, providing a first conductive layer having a first and second side, wherein the first side is arranged on the insulating layer's second side, wherein the conductive layer protrudes from the substrate surface, providing a second conductive layer having a first and second side, wherein the first side is located on the first conductive layer's second side, and removing parts of the second conductive layer by an anisotropic etching means.
Abstract:
A periodic pattern of conductor tracks with broader interspaces is produced by the application of a totally periodic pattern and subsequent removal of individual conductor tracks. An alternative method comprises the formation of a completely periodic hardmask, from which individual parts are removed. The modified hardmask is then used to etch a periodic pattern of conductor tracks with intermediate broader spaces.
Abstract:
A method is provided for fabricating stacked non-volatile memory cells. A semiconductor wafer is provided having a plurality of diffusion regions forming buried bit lines. A charge-trapping layer and a conductive layer are deposited on the surface of the semiconductor wafer. Using a mask layer on top of the conductive layer, contact holes are formed wherein an insulating layer is formed. An etch stop layer is deposited on the surface of the semiconductor wafer. Above the etch stop layer, a dielectric layer is deposited and is patterned so as to form contact holes. Subsequently, the contact holes are enlarged through the etch stop layer and the insulating layer to the buried bit lines.