Abstract:
A memory device comprises a plurality of memory cells and a plurality of evaluation elements, wherein each evaluation element of the plurality of evaluation elements is connectable with a memory cell of the memory device. The memory device further comprises an interconnection unit configured for connecting the plurality of memory cells to a first assignment of evaluation elements in a first state and for connecting the same plurality of memory cells to a second assignment of the evaluation elements in a second state. The memory device comprises an evaluation unit configured for controlling the interconnection unit to transition from the first state to the second state. The evaluation unit is configured for evaluating the plurality of memory cells in the first state to obtain a first evaluation result, and for evaluating the plurality of memory cells in the second state to obtain a second evaluation result.
Abstract:
A method for data processing including mapping between a logical address and a physical address of a memory, wherein the memory comprises several pages, wherein a group of pages comprises at least one page that comprises at least two portions, and wherein the at least two portions of each page of the group are not part of a single-page logical address space.
Abstract:
According to one embodiment, a chip is described comprising a transistor level, a semiconductor region in, below, or in and below the transistor level, a test signal circuit configured to supply a test signal to the semiconductor region, a determiner configured to determine a behavior of the semiconductor region in response to the test signal and a detector configured to detect a change of geometry of the semiconductor region based on the behavior and a reference behavior of the semiconductor region in response to the test signal.
Abstract:
The disclosure relates to an electronic memory system, and more specifically, to a system for adaptive bit rate programming of a memory device, and a method for adaptive bit rate programming of a memory device. According to an embodiment, a system for adaptive bit rate programming of a memory device including a plurality of memory cells is provided, wherein the memory cells are configured to be electrically programmable by application of a current supplied by a current source, the system including selection devices for selecting memory cells for programming based on availability of current from the current source.
Abstract:
An electronic device includes a non-volatile memory having a plurality of memory cells, a memory controller, and an evaluator. The memory controller is configured to provide control signals to the non-volatile memory causing the non-volatile memory, or a selected memory section of the non-volatile memory, to be in one of a read state and a weak erase state, wherein the weak erase state causes the plurality of memory cells to maintain different states depending on different physical properties of the plurality of memory cells. The evaluator is configured to read out the plurality of memory cells and to provide a readout pattern during the read state, wherein the readout pattern that is provided after a preceding weak erase state corresponds to a physically unclonable function (PUF) response of the electronic device uniquely identifying the electronic device.
Abstract:
Read circuitry for a memory cell of a resistive change memory is suggested, wherein a signal of a bit-line that is connected to the memory cell is compared with a reference signal, and wherein the reference signal is determined based on a first dummy circuit that determines a leakage current of memory cells addressed by the bit-line. Also, a corresponding method is provided.
Abstract:
A method for data processing is disclosed. A blank state is determined for several data bits based on a majority decision. Each data bit is represented by a group of at least two memory cells. The at least two memory cells of this group are complementary cells of a differential read memory.
Abstract:
A memory circuit includes electrically programmable memory cells arranged in a non-volatile memory cell array along rows and columns, word lines, each word line coupled with one or more memory cells, non-volatile marking memory cells, wherein at least one word line of the word lines is associated with one or more marking memory cells, and marking bit lines, each associated with marking memory cells, marking source lines, each associated with marking memory cells, wherein, for marking memory cells, a physical connection from an associated marking source line and/or from an associated marking bit line to the marking memory cells defines those marking memory cells to a non-changeable state, wherein the marking memory cells are configured to identify the associated word line of respective marking memory cells in the non-changeable memory state.
Abstract:
According to one embodiment, a chip is described comprising a substrate; an energy source configured to provide energy to the substrate; an energy receiver configured to receive energy from the energy source via the substrate and a determiner configured to determine a value of a parameter of the energy transmission between the energy source and the energy receiver, to check whether the value matches a predetermined value of the parameter and to output a signal depending on the result of the check.
Abstract:
An embodiment relates to a method for determining a health state of a non-volatile memory comprising: determining the health state based on at least one indicator for determining a predictable failure of the non-volatile memory.