公开(公告)号：US20160190060A1

公开(公告)日：2016-06-30

申请号：US14909736

申请日：2013-09-27

Applicant: Rami HOURANI ,  INTEL CORPORATION

Inventor： Robert L. Bristol ,  James M. BLACKWELL ,  Scott B. CLENDENNING ,  Florian GSTREIN ,  Eungnak HAN ,  Grant M. KLOSTER ,  Jeanette M. ROBERTS ,  Patricio E. ROMERO ,  Rami HOURANI

IPC: H01L23/528 ,  H01L23/532 ,  H01L21/311 ,  H01L21/768 ,  H01L21/3205 ,  H01L23/522 ,  H01L21/3105

CPC classification number: H01L23/528 ,  H01L21/28562 ,  H01L21/288 ,  H01L21/3105 ,  H01L21/31058 ,  H01L21/311 ,  H01L21/32 ,  H01L21/32051 ,  H01L21/321 ,  H01L21/76801 ,  H01L21/76816 ,  H01L21/76829 ,  H01L21/76832 ,  H01L21/76834 ,  H01L21/76849 ,  H01L21/76877 ,  H01L21/76897 ,  H01L23/5226 ,  H01L23/53295 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method of an aspect includes forming a first thicker layer of a first material over a first region having a first surface material by separately forming each of a first plurality of thinner layers by selective chemical reaction. The method also includes limiting encroachment of each of the first plurality of thinner layers over a second region that is adjacent to the first region. A second thicker layer of a second material is formed over the second region having a second surface material that is different than the first surface material.

Abstract translation: 一个方面的方法包括通过通过选择性化学反应分别形成第一多个较薄层中的每一个，在具有第一表面材料的第一区域上形成第一材料的第一较厚层。 该方法还包括限制在与第一区域相邻的第二区域上的第一多个较薄层中的每一个的侵入。 在第二区域上形成第二较厚的第二材料层，其具有不同于第一表面材料的第二表面材料。

公开(公告)号：US20240071917A1

公开(公告)日：2024-02-29

申请号：US18384582

申请日：2023-10-27

Applicant: Intel Corporation

Inventor： Richard E. SCHENKER ,  Robert L. BRISTOL ,  Kevin L. LIN ,  Florian GSTREIN ,  James M. BLACKWELL ,  Marie KRYSAK ,  Manish CHANDHOK ,  Paul A. NYHUS ,  Charles H. WALLACE ,  Curtis W. WARD ,  Swaminathan SIVAKUMAR ,  Elliot N. TAN

IPC: H01L23/528 ,  H01L23/522 ,  H01L23/532 ,  H01L27/088 ,  H01L29/78

CPC classification number: H01L23/528 ,  H01L23/5226 ,  H01L23/53238 ,  H01L23/5329 ,  H01L27/0886 ,  H01L29/7848

Abstract: Advanced lithography techniques including sub-10 nm pitch patterning and structures resulting therefrom are described. Self-assembled devices and their methods of fabrication are described.

公开(公告)号：US20220102207A1

公开(公告)日：2022-03-31

申请号：US17549831

申请日：2021-12-13

Applicant: Intel Corporation

Inventor： Florian GSTREIN ,  Rami HOURANI ,  Gopinath BHIMARASETTI ,  James M. BLACKWELL

IPC: H01L21/768 ,  H01L21/308 ,  H01L23/528 ,  H01L21/033

Abstract: Bottom-up fill dielectric materials for semiconductor structure fabrication, and methods of fabricating bottom-up fill dielectric materials for semiconductor structure fabrication, are described. In an example, a method of fabricating a dielectric material for semiconductor structure fabrication includes forming a trench in a material layer above a substrate. A blocking layer is formed partially into the trench along upper portions of sidewalls of the trench. A dielectric layer is formed filling a bottom portion of the trench with a dielectric material up to the blocking layer. The blocking layer is removed. The forming the blocking layer, the forming the dielectric layer, and the removing the blocking layer are repeated until the trench is completely filled with the dielectric material.

公开(公告)号：US20200066629A1

公开(公告)日：2020-02-27

申请号：US16346873

申请日：2016-12-23

Applicant: Intel Corporation

Inventor： Richard E. SCHENKER ,  Robert L. BRISTOL ,  Kevin L. LIN ,  Florian GSTREIN ,  James M. BLACKWELL ,  Marie KRYSAK ,  Manish CHANDHOK ,  Paul A. NYHUS ,  Charles H. WALLACE ,  Curtis W. WARD ,  Swaminathan SIVAKUMAR ,  Elliot N. TAN

IPC: H01L23/528 ,  H01L27/088 ,  H01L23/532 ,  H01L29/78 ,  H01L23/522

Abstract: Advanced lithography techniques including sub-10 nm pitch patterning and structures resulting therefrom are described. Self-assembled devices and their methods of fabrication are described.

公开(公告)号：US20190244806A1

公开(公告)日：2019-08-08

申请号：US16343385

申请日：2016-12-02

Applicant: Intel Corporation

Inventor： Robert L. BRISTOL ,  Kevin L. LIN ,  James M. BLACKWELL

IPC: H01L21/027 ,  H01L21/033 ,  H01L21/768

Abstract: Surface-aligned lithographic patterning approaches for back end of line (BEOL) interconnect fabrication, and the resulting structures, are described. In an example, an integrated circuit structure includes a substrate. A plurality of alternating first and second conductive lines is along a first direction of a back end of line (BEOL) metallization layer in a first inter-layer dielectric (ILD) layer above the substrate. A conductive via is on and electrically coupled to one of the conductive lines of the plurality of alternating first and second conductive lines, the conductive via centered over the one of the conductive lines. A second ILD layer is above plurality of alternating first and second conductive lines and laterally adjacent to the conductive via. The second ILD layer has an uppermost surface substantially co-planar with the flat top surface of the conductive via.

公开(公告)号：US20190146335A1

公开(公告)日：2019-05-16

申请号：US16097960

申请日：2016-07-01

Applicant: Intel Corporation

Inventor： James M. BLACKWELL ,  Robert L. BRISTOL ,  Marie KRYSAK ,  Florian GSTREIN ,  Eungnak HAN ,  Kevin L. LIN ,  Rami HOURANI ,  Shane M. HARLSON

IPC: G03F7/00 ,  H01L21/027 ,  H01L21/768 ,  G03F7/40

Abstract: Lined photoresist structures to facilitate fabricating back end of line (BEOL) interconnects are described. In an embodiment, a hard mask has recesses formed therein, wherein liner structures are variously disposed each on a sidewall of a respective recess. Photobuckets comprising photoresist material are also variously disposed in the recesses. The liner structures variously serve as marginal buffers to mitigate possible effects of misalignment in the exposure of photoresist material to photons or an electron beam. In another embodiment, a recess has disposed therein a liner structure and a photobucket that are both formed by self-assembly of a photoresist-based block-copolymer.

公开(公告)号：US20180236440A1

公开(公告)日：2018-08-23

申请号：US15772839

申请日：2015-12-04

Applicant: Jeffery D. BIELEFELD ,  James M. BLACKWELL ,  David J. MICHALAK ,  Jessica M. TORRES ,  Marie KRYSAK ,  Intel Corporation

Inventor： James M. BLACKWELL ,  David J. Michalak ,  Jessica M. Torres ,  Marie KRYSAK ,  Jeffery D. Bielefeld

IPC: B01J37/08 ,  B01J31/02 ,  B01J21/02 ,  C08L83/16 ,  C08J3/24 ,  H01B3/46

CPC classification number: B01J37/08 ,  B01J21/02 ,  B01J31/0284 ,  C08J3/245 ,  C08L83/16 ,  H01B3/22 ,  H01B3/46

Abstract: Catalysts for facilitating cross-linking of liquid precursors into solid dielectric materials are disclosed. Initially, catalysts are protected, either by coordination with other compounds or by conversion to an ionic salt. Protection prevents catalysts from facilitating cross-linking unless activated. A catalyst is activated upon receiving an excitation, e.g. thermal excitation by heating. Upon receiving an excitation, protection of a catalyst dissociates, decomposes, becomes neutralized, or is otherwise transformed to allow the catalyst to facilitate cross-linking of the precursors into solid dielectric materials. Methods for fabricating dielectric materials using such protected catalysts as well as devices comprising the resulting materials are also described. Dielectric materials comprising cross-linked cyclic carbosilane units having a ring structure including C and Si may be formed in this manner. Protected catalysts disclosed herein allow careful control of precursor cross-linking, resulting in higher quality dielectric materials that may be formed by coating techniques.

公开(公告)号：US20170345643A1

公开(公告)日：2017-11-30

申请号：US15529482

申请日：2014-12-24

Applicant: INTEL CORPORATION

Inventor： Todd R. YOUNKIN ,  Michael J. LEESON ,  James M. BLACKWELL ,  Ernisse S. PUTNA ,  Marie KRYSAK ,  Rami HOURANI ,  Eungnak HAN ,  Robert L. BRISTOL

IPC: H01L21/027 ,  H01L21/768 ,  H01L23/528

CPC classification number: H01L21/0271 ,  G03F7/0035 ,  G03F7/094 ,  G03F7/095 ,  G03F7/115 ,  H01L21/76801 ,  H01L21/76816 ,  H01L21/76897 ,  H01L23/528 ,  H01L2224/16225

Abstract: Photodefinable alignment layers for chemical assisted patterning and approaches for forming photodefinable alignment layers for chemical assisted patterning are described. An embodiment of the invention may include disposing a chemically amplified resist (CAR) material over a hardmask that includes a switch component. The CAR material may then be exposed to form exposed resist portions. The exposure may produces acid in the exposed portions of the CAR material that interact with the switch component to form modified regions of the hardmask material below the exposed resist portions.

公开(公告)号：US20220262722A1

公开(公告)日：2022-08-18

申请号：US17735006

申请日：2022-05-02

Applicant: Intel Corporation

Inventor： Richard E. SCHENKER ,  Robert L. BRISTOL ,  Kevin L. LIN ,  Florian GSTREIN ,  James M. BLACKWELL ,  Marie KRYSAK ,  Manish CHANDHOK ,  Paul A. NYHUS ,  Charles H. WALLACE ,  Curtis W. WARD ,  Swaminathan SIVAKUMAR ,  Elliot N. TAN

IPC: H01L23/528 ,  H01L23/522 ,  H01L23/532 ,  H01L27/088 ,  H01L29/78

Abstract: Advanced lithography techniques including sub-10 nm pitch patterning and structures resulting therefrom are described. Self-assembled devices and their methods of fabrication are described.

公开(公告)号：US20220229364A1

公开(公告)日：2022-07-21

申请号：US17712953

申请日：2022-04-04

Applicant: Intel Corporation

Inventor： Marie KRYSAK ,  James M. BLACKWELL ,  Robert L. BRISTOL ,  Florian GSTREIN

IPC: G03F7/004 ,  G03F7/20

Abstract: A photosensitive composition including metal nanoparticles capped with an organic ligand, wherein the metal particles includes a metal that absorbs light in the extreme ultraviolet spectrum. A method including synthesizing metal particles including a diameter of 5 nanometers or less, wherein the metal particles includes a metal that absorbs light in the extreme ultraviolet spectrum; and capping the metal particles with an organic ligand. A method including depositing a photosensitive composition on a semiconductor substrate, wherein the photosensitive composition includes metal nanoparticles capped with an organic ligand and the nanoparticles include a metal that absorbs light in the extreme ultraviolet spectrum; exposing the photosensitive composition to light in an ultraviolet spectrum through a mask including a pattern; and transferring the mask pattern to the photosensitive composition.