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公开(公告)号:US20170170105A1
公开(公告)日:2017-06-15
申请号:US14969940
申请日:2015-12-15
Applicant: Intel Corporation
Inventor: Jimin Yao , Sanka Ganesan , Shawna M. Liff , Yikang Deng , Debendra Mallik
CPC classification number: H01L23/49816 , H01L21/4853 , H01L23/3114 , H01L23/49838 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/32 , H01L24/73 , H01L24/81 , H01L24/83 , H01L24/92 , H01L24/97 , H01L25/0657 , H01L2224/0401 , H01L2224/131 , H01L2224/13111 , H01L2224/14135 , H01L2224/16237 , H01L2224/16503 , H01L2224/32225 , H01L2224/73204 , H01L2224/8101 , H01L2224/81191 , H01L2224/81192 , H01L2224/81447 , H01L2224/81815 , H01L2224/83102 , H01L2224/92125 , H01L2224/97 , H01L2924/15321 , H01L2924/3511 , H05K1/03 , H05K1/18 , H05K1/181 , H05K3/34 , H05K3/3436 , H05K2201/10515 , H05K2201/1053 , H01L2924/014 , H01L2924/00014 , H01L2224/81 , H01L2924/01047 , H01L2924/01029 , H01L2924/01028
Abstract: Integrated circuit (IC) package structures, and related devices and methods, are disclosed herein. In some embodiments, an IC package substrate may include: a dielectric layer having a first face and a second face; a metal layer disposed at the first face of the dielectric layer and having a first face and a second face, wherein the second face of the metal layer is disposed between the first face of the metal layer and the second face of the dielectric layer; a package contact at the first face of the metal layer to couple the IC package substrate to a component; and a die contact at the first face of the metal layer to couple a die to the IC package substrate.
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公开(公告)号:US12205915B2
公开(公告)日:2025-01-21
申请号:US18346321
申请日:2023-07-03
Applicant: Intel Corporation
Inventor: Debendra Mallik , Sergio Antonio Chan Arguedas , Jimin Yao , Chandra Mohan Jha
IPC: H01L23/00 , H01L23/16 , H01L23/367
Abstract: Embodiments may relate to a microelectronic package that includes a die coupled with a package substrate. A plurality of solder thermal interface material (STIM) thermal interconnects may be coupled with the die and an integrated heat spreader (IHS) may be coupled with the plurality of STIM thermal interconnects. A thermal underfill material may be positioned between the IHS and the die such that the thermal underfill material at least partially surrounds the plurality of STIM thermal interconnects. Other embodiments may be described or claimed.
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公开(公告)号:US11870163B2
公开(公告)日:2024-01-09
申请号:US17705182
申请日:2022-03-25
Applicant: Intel Corporation
Inventor: Jimin Yao , Robert L. Sankman , Shawna M. Liff , Sri Chaitra Jyotsna Chavali , William J. Lambert , Zhichao Zhang
IPC: H01Q9/04 , H01L21/48 , H01L21/56 , H01L23/498 , H01L23/66
CPC classification number: H01Q9/0414 , H01L21/4853 , H01L21/4857 , H01L21/563 , H01L23/49816 , H01L23/49822 , H01L23/49838 , H01L23/66 , H01L2223/6616 , H01L2223/6677
Abstract: In accordance with disclosed embodiments, there is an antenna package using a ball attach array to connect an antenna and base substrates of the package. One example is an RF module package including an RF antenna package having a stack material in between a top and a bottom antenna layer to form multiple antenna plane surfaces, a base package having alternating patterned conductive and dielectric layers to form routing through the base package, and a bond between a bottom surface of the antenna package and to a top surface of the base package.
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公开(公告)号:US20230343738A1
公开(公告)日:2023-10-26
申请号:US18346321
申请日:2023-07-03
Applicant: Intel Corporation
Inventor: Debendra Mallik , Sergio Antonio Chan Arguedas , Jimin Yao , Chandra Mohan Jha
IPC: H01L23/00 , H01L23/16 , H01L23/367
CPC classification number: H01L24/17 , H01L23/16 , H01L23/3675 , H01L23/562 , H01L2224/17051 , H01L2224/1713 , H01L2224/17163 , H01L2224/17181 , H01L2224/17519
Abstract: Embodiments may relate to a microelectronic package that includes a die coupled with a package substrate. A plurality of solder thermal interface material (STIM) thermal interconnects may be coupled with the die and an integrated heat spreader (IHS) may be coupled with the plurality of STIM thermal interconnects. A thermal underfill material may be positioned between the IHS and the die such that the thermal underfill material at least partially surrounds the plurality of STIM thermal interconnects. Other embodiments may be described or claimed.
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公开(公告)号:US20220216611A1
公开(公告)日:2022-07-07
申请号:US17705182
申请日:2022-03-25
Applicant: Intel Corporation
Inventor: Jimin Yao , Robert L. Sankman , Shawna M. Liff , Sri Chaitra Jyotsna Chavali , William J. Lambert , Zhichao Zhang
IPC: H01Q9/04 , H01L21/48 , H01L21/56 , H01L23/498 , H01L23/66
Abstract: In accordance with disclosed embodiments, there is an antenna package using a ball attach array to connect an antenna and base substrates of the package. One example is an RF module package including an RF antenna package having a stack material in between a top and a bottom antenna layer to form multiple antenna plane surfaces, a base package having alternating patterned conductive and dielectric layers to form routing through the base package, and a bond between a bottom surface of the antenna package and to a top surface of the base package.
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公开(公告)号:US20210202347A1
公开(公告)日:2021-07-01
申请号:US16727703
申请日:2019-12-26
Applicant: Intel Corporation
Inventor: Shawna Liff , Adel Elsherbini , Johanna Swan , Jimin Yao , Veronica Strong
IPC: H01L23/373 , H01L23/48 , H01L25/065 , H01L21/768
Abstract: A heat spreading material is integrated into a composite die structure including a first IC die having a first dielectric material and a first electrical interconnect structure, and a second IC die having a second dielectric material and a second electrical interconnect structure. The composite die structure may include a composite electrical interconnect structure comprising the first interconnect structure in direct contact with the second interconnect structure at a bond interface. The heat spreading material may be within at least a portion of a dielectric area through which the bond interface extends. The heat spreading material may be located within one or more dielectric materials surrounding the composite interconnect structure, and direct a flow of heat generated by one or more of the first and second IC dies.
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公开(公告)号:US20210098411A1
公开(公告)日:2021-04-01
申请号:US16584522
申请日:2019-09-26
Applicant: Intel Corporation
Inventor: Shawna Liff , Adel Elsherbini , Johanna Swan , Nagatoshi Tsunoda , Jimin Yao
IPC: H01L23/00 , H01L23/498 , H01L21/48
Abstract: Embodiments include a mixed hybrid bonding structure comprising a composite dielectric layer, where the composite dielectric layer comprises an organic dielectric material having a plurality of inorganic filler material. One or more conductive substrate interconnect structures are within the composite dielectric layer. A die is on the composite dielectric layer, the die having one or more conductive die interconnect structures within a die dielectric material. The one or more conductive die interconnect structures are directly bonded to the one or more conductive substrate interconnect structures, and the inorganic filler material of the composite dielectric layer is bonded to the die dielectric material.
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公开(公告)号:US20190287872A1
公开(公告)日:2019-09-19
申请号:US15925429
申请日:2018-03-19
Applicant: INTEL CORPORATION
Inventor: Eng Huat Goh , Jiun Hann Sir , Min Suet Lim , Richard C. Stamey , Chu Aun Lim , Jimin Yao
IPC: H01L23/31 , H01L23/528 , H01L23/538 , H01L23/00
Abstract: A semiconductor package is disclosed, which comprises a substrate, one or more dies on a first side of the substrate, and a plurality of interconnect structures having a first pitch and coupled to a second side of the substrate. The interconnect structures may attach the substrate to a board. The substrate may include a first interconnect layer having a second pitch. The first interconnect layer may be coupled to the one or more dies through second one or more interconnect layers. Third one or more interconnect layers between the first interconnect layer and the interconnect structures may translate the first pitch to the second pitch. The substrate may include a recess on a section of the second side of the substrate. The semiconductor package may further include one or more components within the recess and attached to the second side of the substrate.
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公开(公告)号:US10249515B2
公开(公告)日:2019-04-02
申请号:US15089136
申请日:2016-04-01
Applicant: Intel Corporation
Inventor: Jimin Yao , Eric Li , Shawna Liff
Abstract: Electronic device package technology is disclosed. In one example, an electronic device package can include a substrate, an electronic component disposed on the substrate and electrically coupled to the substrate, and an underfill material disposed at least partially between the electronic component and the substrate. A lateral portion of the underfill material can comprises a lateral surface extending away from the substrate and a meniscus surface extending between the lateral surface and the electronic component.
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公开(公告)号:US20170278816A1
公开(公告)日:2017-09-28
申请号:US15083089
申请日:2016-03-28
Applicant: Intel Corporation
Inventor: Eric J. Li , Jimin Yao , Shawna M. Liff
IPC: H01L23/00
CPC classification number: H01L24/14 , H01L21/4853 , H01L23/49816 , H01L24/11 , H01L2224/11003 , H01L2224/1403 , H01L2224/14132 , H01L2924/01029 , H01L2924/01047 , H01L2924/0105 , H01L2924/0133
Abstract: BGA packages with a spatially varied ball height, molds and techniques to form such packages. A template or mold with cavities may be pre-fabricated to hold solder paste material applied to the mold, for example with a solder paste printing process. The depth and/or diameter of the cavities may be predetermined as a function of spatial position within the mold working surface area. Mold cavity dimensions may be specified corresponding to package position to account for one or more pre-existing or expected spatial variations in the package, such as a package-level warpage measurement. Any number of different ball heights may be provided. The molds may be employed in a standardize process that need not be modified with each change in the mold.
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