Abstract:
The present invention is directed to a device for securing an electrical component to a pin grid array (PGA) socket that has a substantially planar body portion and a plurality of conductor pins, which are electrically connectable to a circuit board and project outwardly in a direction substantially perpendicular to the planar body portion. The device comprises a base member that has a plurality of conductor pin apertures which extend through the base member. Each of the conductor pin apertures are registered to receive therethrough a corresponding one of the plurality of conductor pins, to thereby sandwich the base member between and anchor the base member to the circuit board and the PGA socket when the PGA socket is electrically connected to the circuit board. The device further comprises a retainer for releasably securing the electrical component to the PGA socket. The retainer is coupled to the base member and a surface of the electrical component and transmits a retaining force from the base member to the electrical component, thereby substantially preventing the electrical component from separating from the PGA socket.
Abstract:
A system for detecting and locating errors in printed wire assemblies contained in a device with capabilities of performing a power on self test (POST) comprised of testing subroutines. The system monitors the device during execution of the POST. If a run error occurs during the POST, the system, through its monitoring, receives an indication of the run error. The system then delivers to the device a command, external to the POST routine, which directs the POST routine to thereafter separately execute each of the testing subroutines of the POST. If a run error occurs in any testing subroutine as it is being separately executed, a signal indicative of the run error and particular testing subroutine in which it occurred is sent to the system. The system, in this manner, may track a particular printed wire assembly and, with information about where within the printed wire assembly execution steps of the particular testing subroutine occur, determine the source within the printed wire assembly of the failure which caused the run error.
Abstract:
A railroad maintenance device distributes, regulates and reclaims ballast along a railway road bed. The device includes one or more hopper cars for transporting and depositing ballast, a regulating car including a track regulator, a shoulder regulator, and an extensible plow arm for reclaiming ballast deposited at a distance from the shoulder of the road bed. The hopper cars include radio controlled gates for the remote control of ballast depositing operations, and a computer controlled system for optimizing the distribution of ballast according to predetermined parameters. A bucket elevator is located rearwardly of the track regulator for lifting excess ballast from the road bed, and a belt conveyor transports the lifted ballast to a hopper car.
Abstract:
The disclosed apparatus relates to a stringed practice device comprising: a neck with an upper end and a lower end; a headstock coupled to the lower end of the neck; and where the headstock comprises a plurality of tuning posts. The disclosed method relates to a using a stringed practice device. The method comprises resting a headstock against a thigh of the user; and fingering the strings on a neck of the stringed practice device with one hand of the user.
Abstract:
An apparatus is provided for retaining a production level device for use with an automated testing device for testing personal computer components. The apparatus includes an extrusion having a first portion for receiving the production level device and a second portion for attaching the extrusion to the automated test device. The apparatus also includes a moldable fastener for precisely fastening the production-level device to the first portion.
Abstract:
A hold-down finger for holding a circuit board in a test fixture. The hold-down finger includes an attachment portion and a finger. The attachment portion is for attaching the hold-down finger to the test fixture. The attachment portion has a central axis. The finger is coupled to the attachment portion at a location displaced from the central axis of the attachment portion. Displacing the finger from the central axis allows for the tip of the finger to be located more precisely in a radial manner about the center point of the device to hold a circuit board down against the extreme pressures of test probe springs.
Abstract:
A rework configuration is provided for disconnecting defective lithography-formed conductors and/or overlying electrical components from the printed circuit wiring netlist and connecting rework elements at the substituted sites. In particular, defective regions can be severed at spaced first and second target areas the upper surface of the PCB and one or more interconnect structures can be coupled therebetween. The interconnect structures allow re-routing of PCB conductors, allow connectivity between the upper and lower surfaces, allow connectivity to power and ground planes, and allow pull-up, pull-down and decoupling connectivity.
Abstract:
A printed circuit board is provided having a beveled edge for ease of insertion into a receptor. The beveled edge is extended onto the solder mask to present a contiguous beveled surface. Moreover, the PCB includes bonding pads which can be surface mounted with pins extending from the receptor. Each bonding pad includes a forward portion and a rearward portion. The forward portion is covered with the solder mask layer to present a smooth surface channeled inward in a V-shaped configuration. The forward portion channels or directs the pin along a central axis near the apex of the V-shaped forward portion onto the upper surface of the bonding pad rearward portion. Accordingly, the pin is channeled to an area absent solder paste along the central axis such that during subsequent reflow operation the solder paste is reliably extended over and around the centrally placed pin.
Abstract:
A circuit board design featuring a fine pitch ball grid array ("BGA") having a simplified construction. The circuit board comprises: (1) an insulating substrate, the substrate having a via therethrough, (2) a conductive layer located over the substrate, the via passing through the layer and laterally uninterrupted through the circuit board, (3) a first solder having a first melting point located within and substantially blocking the via and (4) a second solder having a second melting point located over the blocked via, the second melting point lower than the first melting point, the first solder remaining substantially solid and preventing the second solder from substantially entering the via when the first and second solders are heated to a temperature between the first and second melting points. The present invention eliminates precision drilling required by current blind via BGA pad designs.