SEMICONDUCTOR DEVICE MANUFACTURING METHOD
    11.
    发明申请
    SEMICONDUCTOR DEVICE MANUFACTURING METHOD 失效
    半导体器件制造方法

    公开(公告)号:US20100233865A1

    公开(公告)日:2010-09-16

    申请号:US12720831

    申请日:2010-03-10

    IPC分类号: H01L21/02

    摘要: Provided is a semiconductor device manufacturing method for a capacitor having a dielectric film which can be formed into a thin film, can be formed at a low temperature, and has a readily controllable property. The manufacturing method includes: forming an oxide film or an oxynitride film on a conductor for serving as one electrode of a capacitor; forming, on the oxide film or the oxynitride film, a manganese oxide film for serving as a dielectric film of the capacitor; and forming, on the manganese oxide film, a conductive film for serving as the other electrode of the capacitor.

    摘要翻译: 提供一种具有可形成为薄膜的电介质膜的电容器的半导体器件制造方法,可以在低温下形成,并具有容易控制的特性。 制造方法包括:在用作电容器的一个电极的导体上形成氧化膜或氮氧化物膜; 在氧化膜或氮氧化物膜上形成用作电容器的电介质膜的氧化锰膜; 在氧化锰膜上形成用作电容器的另一个电极的导电膜。

    MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
    12.
    发明申请
    MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE 有权
    半导体器件的制造方法

    公开(公告)号:US20100210097A1

    公开(公告)日:2010-08-19

    申请号:US12706237

    申请日:2010-02-16

    IPC分类号: H01L21/28

    摘要: Provided is a manufacturing method of a semiconductor device including a gate insulating film which can be formed into a thin film and of which film composition is easy to be controlled. The manufacturing method includes: forming a manganese oxide film for serving as a gate insulating film on a semiconductor substrate, on which a transistor is formed; forming a conductive film for serving as a gate electrode on the manganese oxide film; and forming a gate electrode and a gate insulating film by processing the conductive film and the manganese oxide film.

    摘要翻译: 提供一种半导体器件的制造方法,其包括可以形成为薄膜并且易于控制膜组成的栅极绝缘膜。 制造方法包括:在形成有晶体管的半导体衬底上形成用作栅极绝缘膜的氧化锰膜; 在氧化锰膜上形成用作栅电极的导电膜; 以及通过处理导电膜和氧化锰膜形成栅电极和栅极绝缘膜。

    Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and storage medium
    13.
    发明授权
    Method of manufacturing semiconductor device, semiconductor manufacturing apparatus, and storage medium 有权
    制造半导体器件,半导体制造装置和存储介质的方法

    公开(公告)号:US08349725B2

    公开(公告)日:2013-01-08

    申请号:US12920701

    申请日:2009-02-20

    IPC分类号: H01L21/4763

    摘要: The present invention is a method of manufacturing a semiconductor device comprising: forming a recess in an interlayer insulating film formed on a substrate surface, the recess being configured to be embedded with an upper conductive channel mainly made of copper to be electrically connected to a lower conductive channel; supplying a gas containing an organic compound of manganese, and forming a barrier layer made of a compound of manganese for preventing diffusion of copper to the interlayer insulating film, such that the barrier layer covers an exposed surface of the interlayer insulating film; after the formation of the barrier layer, supplying organic acid to the barrier layer in order to increase a ratio of manganese in the compound of manganese forming the barrier layer; after the supply of the organic acid, forming a seed layer mainly made of copper on a surface of the barrier layer; after the formation of the seed-layer, heating the substrate in order to separate out manganese from on the surface of the barrier layer or from in the barrier layer onto a surface of the seed layer; supplying a cleaning liquid to the seed layer in order to remove the manganese separated out on the surface of the seed layer by the heating; and after the supply of the cleaning liquid, forming the upper conductive channel mainly made of copper in the recess.

    摘要翻译: 本发明是一种制造半导体器件的方法,包括:在形成在衬底表面上的层间绝缘膜中形成凹部,所述凹部被构造成嵌入有主要由铜制成的上部导电沟道,以与下部电连接 导电通道; 提供含锰有机化合物的气体,形成由锰化合物制成的阻挡层,以防止铜向层间绝缘膜扩散,使得阻挡层覆盖层间绝缘膜的暴露表面; 在形成阻挡层之后,向阻挡层供给有机酸,以增加形成阻挡层的锰化合物中的锰的比例; 在供给有机酸之后,在阻挡层的表面上形成主要由铜制成的种子层; 在形成种子层之后,加热衬底以将锰从阻挡层的表面或阻挡层中分离出到种子层的表面上; 向种子层供应清洗液,以便通过加热去除种子层表面上分离的锰; 并且在供应清洁液之后,在凹槽中形成主要由铜制成的上导电通道。

    Semiconductor device manufacturing method
    15.
    发明授权
    Semiconductor device manufacturing method 失效
    半导体器件制造方法

    公开(公告)号:US08124492B2

    公开(公告)日:2012-02-28

    申请号:US12720831

    申请日:2010-03-10

    IPC分类号: H01L21/20

    摘要: Provided is a semiconductor device manufacturing method for a capacitor having a dielectric film which can be formed into a thin film, can be formed at a low temperature, and has a readily controllable property. The manufacturing method includes: forming an oxide film or an oxynitride film on a conductor for serving as one electrode of a capacitor; forming, on the oxide film or the oxynitride film, a manganese oxide film for serving as a dielectric film of the capacitor; and forming, on the manganese oxide film, a conductive film for serving as the other electrode of the capacitor.

    摘要翻译: 提供一种具有可形成为薄膜的电介质膜的电容器的半导体器件制造方法,可以在低温下形成,并具有容易控制的特性。 制造方法包括:在用作电容器的一个电极的导体上形成氧化膜或氮氧化物膜; 在氧化膜或氮氧化物膜上形成用作电容器的电介质膜的氧化锰膜; 在氧化锰膜上形成用作电容器的另一个电极的导电膜。

    Imprint apparatus and pattern transfer method
    18.
    发明授权
    Imprint apparatus and pattern transfer method 有权
    印刷装置和图案转印方法

    公开(公告)号:US09244342B2

    公开(公告)日:2016-01-26

    申请号:US12963009

    申请日:2010-12-08

    申请人: Hiroshi Sato

    发明人: Hiroshi Sato

    摘要: An imprint apparatus comprises a scope which observes a mark formed in each shot of a substrate and a mark formed on a mold and a controller. The controller performs observation by the scope, detects an amount of displacement of the shot with respect to the mold based on the observation result, and, if the detected displacement amount falls outside an allowable range, executes at least one of remeasuring a baseline amount and reexecuting a global alignment process.

    摘要翻译: 压印装置包括观察在基板的每个镜头中形成的标记的范围和形成在模具上的标记和控制器。 控制器通过该范围进行观察,基于观察结果检测射出相对于模具的位移量,并且如果检测到的位移量超出允许范围,则执行重新测量基线量和 重新执行全局对齐过程。

    Method and apparatus for detecting and processing specific pattern from image
    19.
    发明授权
    Method and apparatus for detecting and processing specific pattern from image 有权
    用于从图像中检测和处理特定图案的方法和装置

    公开(公告)号:US09239946B2

    公开(公告)日:2016-01-19

    申请号:US13546355

    申请日:2012-07-11

    IPC分类号: G06K9/00 H04N5/232

    摘要: In an image within which a face pattern is detected, when a ratio of a skin color pixel is equal to or smaller than a first threshold value in a first region and a ratio of a skin color pixel is equal to or greater than a second threshold value in a second r region, the vicinity of the first region is determined to be a face candidate position at which the face pattern can exist. Face detection is carried out on the face candidate position. The second region is arranged in a predetermined position relative to the first region.

    摘要翻译: 在其中检测到面部图案的图像中,当皮肤颜色像素的比例在第一区域中等于或小于第一阈值并且皮肤颜色像素的比率等于或大于第二阈值时 在第二r区域中,第一区域附近被确定为可以存在脸部图案的面部候选位置。 脸部检测在脸部候选位置进行。 第二区域相对于第一区域布置在预定位置。

    Mark position detector, imprint apparatus, and article manufacturing method
    20.
    发明授权
    Mark position detector, imprint apparatus, and article manufacturing method 有权
    标记位置检测器,压印装置和制品制造方法

    公开(公告)号:US08953175B2

    公开(公告)日:2015-02-10

    申请号:US12966237

    申请日:2010-12-13

    申请人: Hiroshi Sato

    发明人: Hiroshi Sato

    摘要: A detector for detecting a position of a mark comprises: an image sensing device; an optical system which projects the mark onto an image sensing surface of the image sensing device; a pattern located in a position between the image sensing surface and an optical element located closest to a plane on which the mark is to be located, among optical elements forming the optical system, the position being optically conjugated with the plane; and a processor which calculates a position of the mark with respect to one of a position of the pattern and a position already known from the position of the pattern, based on a moire pattern formed on the image sensing surface by the mark and the pattern.

    摘要翻译: 用于检测标记位置的检测器包括:图像感测装置; 光学系统,其将标记投射到图像感测装置的图像感测表面上; 在形成光学系统的光学元件中位于图像感测表面和位于最靠近标记所在的平面的光学元件之间的位置的图案,该位置与该平面光学共轭; 以及处理器,其基于通过标记和图案形成在图像感测表面上的莫尔图案,计算相对于图案的位置和从图案的位置已知的位置之一的标记的位置。