Process for manufacturing a membrane microelectromechanical device, and membrane microelectromechanical device
    11.
    发明授权
    Process for manufacturing a membrane microelectromechanical device, and membrane microelectromechanical device 有权
    膜微机电装置的制造方法以及膜微机电装置

    公开(公告)号:US09162876B2

    公开(公告)日:2015-10-20

    申请号:US13419230

    申请日:2012-03-13

    IPC分类号: B81C1/00 G01L9/00

    摘要: Disclosed herein is a microelectromechanical device and a process for manufacturing same. One or more embodiments may include forming a semiconductor structural layer separated from a substrate by a dielectric layer, and opening a plurality of trenches through the structural layer exposing a portion of the dielectric layer. A sacrificial portion of the dielectric layer is selectively removed through the plurality of trenches in membrane regions so as to free a corresponding portion of the structural layer to form a membrane. To close the trenches, the wafer is brought to an annealing temperature for a time interval in such a way as to cause migration of the atoms of the membrane so as to reach a minimum energy configuration.

    摘要翻译: 本文公开了一种微机电装置及其制造方法。 一个或多个实施例可以包括通过电介质层形成与衬底分离的半导体结构层,以及通过暴露电介质层的一部分的结构层来打开多个沟槽。 电介质层的牺牲部分通过膜区域中的多个沟槽选择性地去除,以便释放结构层的相应部分以形成膜。 为了封闭沟槽,将晶片以这样的方式达到退火温度一段时间,使得膜的原子迁移以达到最小能量构型。

    PROCESS FOR MANUFACTURING A MICROMECHANICAL STRUCTURE HAVING A BURIED AREA PROVIDED WITH A FILTER
    12.
    发明申请
    PROCESS FOR MANUFACTURING A MICROMECHANICAL STRUCTURE HAVING A BURIED AREA PROVIDED WITH A FILTER 有权
    制造具有过滤器的烧结区域的微观结构的方法

    公开(公告)号:US20120018819A1

    公开(公告)日:2012-01-26

    申请号:US13190254

    申请日:2011-07-25

    IPC分类号: H01L29/84 H01L21/02

    摘要: A process for manufacturing a micromechanical structure envisages: forming a buried cavity within a body of semiconductor material, separated from a top surface of the body by a first surface layer; and forming an access duct for fluid communication between the buried cavity and an external environment. The method envisages: forming an etching mask on the top surface at a first access area; forming a second surface layer on the top surface and on the etching mask; carrying out an etch such as to remove, in a position corresponding to the first access area, a portion of the second surface layer, and an underlying portion of the first surface layer not covered by the etching mask until the buried cavity is reached, thus forming both the first access duct and a filter element, set between the first access duct and the same buried cavity.

    摘要翻译: 微机械结构的制造方法设想:在半导体材料体内形成通过第一表面层从主体顶表面分离的掩埋腔; 以及形成用于在所述掩埋腔和外部环境之间流体连通的进入管。 该方法设想:在第一进入区域的顶表面上形成蚀刻掩模; 在顶表面和蚀刻掩模上形成第二表面层; 进行蚀刻,以在对应于第一进入区域的位置中移除第二表面层的一部分,以及未被蚀刻掩模覆盖的第一表面层的下面部分,直到达到掩埋空腔,因此 形成第一进入管道和过滤元件,设置在第一进入管道和相同的掩埋空腔之间。

    Integrated angular speed sensor device and production method thereof
    14.
    发明授权
    Integrated angular speed sensor device and production method thereof 有权
    一体式角速度传感器装置及其制造方法

    公开(公告)号:US06209394B1

    公开(公告)日:2001-04-03

    申请号:US09178285

    申请日:1998-10-23

    IPC分类号: G01P904

    摘要: An angular speed sensor comprises a pair of mobile masses which are formed in an epitaxial layer and are anchored to one another and to the remainder of the device by anchorage elements. The mobile masses are symmetrical with one another, and have first mobile excitation electrodes which are intercalated with respective first fixed excitation electrodes and second mobile detection electrodes which are intercalated with second fixed detection electrodes. The first mobile and fixed excitation electrodes extend in a first direction and the second mobile and fixed detection electrodes extend in a second direction which is perpendicular to the first direction and is disposed on a single plane parallel to the surface of the device.

    摘要翻译: 角速度传感器包括一对移动质量块,其形成在外延层中并且通过锚定元件锚固到装置的其余部分。 移动质量彼此对称,并且具有插入有第一固定激励电极的第一移动激励电极和插入第二固定检测电极的第二移动检测电极。 第一移动和固定激励电极沿第一方向延伸,并且第二移动和固定检测电极在垂直于第一方向的第二方向上延伸并且设置在平行于装置表面的单个平面上。

    Method for manufacturing integrated structures including removing a sacrificial region
    15.
    发明授权
    Method for manufacturing integrated structures including removing a sacrificial region 失效
    包括去除牺牲区域的集成结构的制造方法

    公开(公告)号:US06197655B1

    公开(公告)日:2001-03-06

    申请号:US09113466

    申请日:1998-07-10

    IPC分类号: H01L2176

    摘要: The method is based on the use of a silicon carbide mask for removing a sacrificial region. In case of manufacture of integrated semiconductor material structures, the following steps are performed: forming a sacrificial region of silicon oxide on a substrate of semiconductor material; growing a pseudo-epitaxial layer; forming electronic circuit components; depositing a silicon carbide layer; defining photolithographically the silicon carbon layer so as to form an etching mask containing the topography of a microstructure to be formed; with the etching mask, forming trenches in the pseudo-epitaxial layer as far as the sacrificial region so as to laterally define the microstructure; and removing the sacrificial region through the trenches.

    摘要翻译: 该方法基于使用碳化硅掩模去除牺牲区域。 在制造集成半导体材料结构的情况下,执行以下步骤:在半导体材料的衬底上形成氧化硅牺牲区; 生长伪外延层; 形成电子电路部件; 沉积碳化硅层; 光刻地定义硅碳层,以形成含有要形成的微结构的形貌的蚀刻掩模; 利用蚀刻掩模,在伪外延层中形成直到牺牲区域的沟槽,以横向限定微结构; 并通过沟槽去除牺牲区域。

    Process for manufacturing a micromechanical structure having a buried area provided with a filter
    17.
    发明授权
    Process for manufacturing a micromechanical structure having a buried area provided with a filter 有权
    具有设置有过滤器的掩埋区域的微机械结构的制造方法

    公开(公告)号:US08633553B2

    公开(公告)日:2014-01-21

    申请号:US13190254

    申请日:2011-07-25

    IPC分类号: H01L29/84 H01L21/00

    摘要: A process for manufacturing a micromechanical structure envisages: forming a buried cavity within a body of semiconductor material, separated from a top surface of the body by a first surface layer; and forming an access duct for fluid communication between the buried cavity and an external environment. The method envisages: forming an etching mask on the top surface at a first access area; forming a second surface layer on the top surface and on the etching mask; carrying out an etch such as to remove, in a position corresponding to the first access area, a portion of the second surface layer, and an underlying portion of the first surface layer not covered by the etching mask until the buried cavity is reached, thus forming both the first access duct and a filter element, set between the first access duct and the same buried cavity.

    摘要翻译: 微机械结构的制造方法设想:在半导体材料体内形成通过第一表面层从主体顶表面分离的掩埋腔; 以及形成用于在所述掩埋腔和外部环境之间流体连通的进入管。 该方法设想:在第一进入区域的顶表面上形成蚀刻掩模; 在顶表面和蚀刻掩模上形成第二表面层; 进行蚀刻,以在对应于第一进入区域的位置中移除第二表面层的一部分,以及未被蚀刻掩模覆盖的第一表面层的下面部分,直到达到掩埋空腔,因此 形成第一进入管道和过滤元件,设置在第一进入管道和相同的掩埋空腔之间。

    Process for manufacturing micromechanical components in a semiconductor material wafer with reduction in the starting wafer thickness
    19.
    发明授权
    Process for manufacturing micromechanical components in a semiconductor material wafer with reduction in the starting wafer thickness 有权
    在半导体材料晶片中制造微型机械部件的方法,其中起始晶片厚度减小

    公开(公告)号:US06689627B2

    公开(公告)日:2004-02-10

    申请号:US10037484

    申请日:2001-12-19

    IPC分类号: H01L2100

    CPC分类号: H01L21/2007 H01L21/76256

    摘要: A process for manufacturing components in a multi-layer wafer, including the steps of: providing a multi-layer wafer comprising a first semiconductor material layer, a second semiconductor material layer (, and a dielectric material layer arranged between the first and the second semiconductor material layer; and removing the first semiconductor material layer initially by mechanically thinning the first semiconductor material layer, so as to form a residual conductive layer, and subsequently by chemically removing the residual conductive layer. In one application, the multi-layer wafer is bonded to a first wafer of semiconductor material, with the second semiconductor material layer facing the first wafer, after micro-electromechanical structures have been formed in the second semiconductor material layer of the multi-layer wafer.

    摘要翻译: 一种用于制造多层晶片中的部件的方法,包括以下步骤:提供包括第一半导体材料层,第二半导体材料层(以及布置在第一和第二半导体之间的介电材料层)的多层晶片 最初通过机械稀化第一半导体材料层去除第一半导体材料层,从而形成残留的导电层,随后通过化学去除残留的导电层,在一个应用中,多层晶片被粘合 在多层晶片的第二半导体材料层中形成微机电结构之后,将第二半导体材料层面向第一晶片的半导体材料的第一晶片。

    Method of manufacturing pressure microsensors
    20.
    发明授权
    Method of manufacturing pressure microsensors 失效
    制造压力传感器的方法

    公开(公告)号:US06527961B1

    公开(公告)日:2003-03-04

    申请号:US09033467

    申请日:1998-03-02

    IPC分类号: C23F100

    CPC分类号: G01L9/0054 G01L9/0055

    摘要: A method for the formation of a region of silicon dioxide on a substrate of monocrystalline silicon. The epitaxial growth of a silicon layer, the opening of holes in the silicon layer above the silicon dioxide region, and the removal of the silicon dioxide which constitutes the region by means of chemical attack through the holes until a silicon diaphragm, attached to the substrate along the edges and separated therefrom by a space, is produced. In order to form an absolute pressure microsensor, the space has to be sealed. To do this, the method provides for the holes to have diameters smaller than the thickness of the diaphragm and to be closed by the formation of a silicon dioxide layer by vapor-phase deposition at atmospheric pressure.

    摘要翻译: 一种在单晶硅衬底上形成二氧化硅区域的方法。 硅层的外延生长,在二氧化硅区域上方的硅层中的孔的开放,以及通过孔的化学侵蚀去除构成该区域的二氧化硅,直到连接到衬底的硅隔膜 沿着边缘并与之隔开一个空间。 为了形成绝对压力微传感器,必须密封空间。 为此,该方法提供的孔具有小于隔膜厚度的直径,并且通过在大气压下气相沉积形成二氧化硅层来封闭孔。