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公开(公告)号:US20150162301A1
公开(公告)日:2015-06-11
申请号:US14276320
申请日:2014-05-13
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Huei-Nuan Huang , Mu-Hsuan Chan , Chun-Tang Lin
CPC classification number: H01L21/78 , H01L21/4846 , H01L21/4853 , H01L21/561 , H01L21/568 , H01L21/6836 , H01L23/3128 , H01L23/49816 , H01L23/5384 , H01L23/5385 , H01L24/13 , H01L24/16 , H01L24/92 , H01L24/95 , H01L25/0655 , H01L2221/68331 , H01L2221/68372 , H01L2224/131 , H01L2224/16227 , H01L2224/81005 , H01L2224/92 , H01L2224/95 , H01L2924/15311 , H01L2924/181 , H01L2924/18161 , H01L2924/351 , H01L2924/3511 , H01L2924/3841 , H05K1/181 , H05K3/284 , H05K2201/10378 , H01L2924/00 , H01L2924/014 , H01L2224/81 , H01L2221/68304 , H01L21/56 , H01L21/304 , H01L2221/68381
Abstract: A method for fabricating a semiconductor package is provided, which includes the steps of: providing a carrier having at least a semiconductor chip disposed thereon, the semiconductor chip having a first surface attached to the carrier, and an opposite second surface having a plurality of first conductive elements thereon; disposing an interposer on the first conductive elements, wherein the interposer has opposite third and fourth surfaces, the interposer is disposed on the first conductive elements via the third surface, and a plurality of conductive posts are embedded in the interposer and electrically connected to the third surface; forming an encapsulant on the carrier for encapsulating the semiconductor chip and the interposer; removing a portion of the encapsulant from the upper surface thereof and a portion of the interposer from the fourth surface thereof to expose ends of the conductive posts; and removing the carrier, thereby improving the connection quality between the semiconductor chip and the interposer.
Abstract translation: 提供一种制造半导体封装的方法,其包括以下步骤:提供至少具有其上设置的半导体芯片的载体,所述半导体芯片具有附接到载体的第一表面,以及相对的第二表面,具有多个第一 导电元件; 在所述第一导电元件上设置插入件,其中所述插入件具有相对的第三和第四表面,所述插入件经由所述第三表面设置在所述第一导电元件上,并且多个导电柱嵌入所述插入件中并电连接到所述第三导电元件 表面; 在载体上形成密封剂以封装半导体芯片和插入件; 从其上表面去除所述密封剂的一部分和从所述第四表面移除所述插入件的一部分以暴露所述导电柱的端部; 并移除载体,从而提高半导体芯片和插入件之间的连接质量。
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公开(公告)号:US08829687B2
公开(公告)日:2014-09-09
申请号:US13722138
申请日:2012-12-20
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Mu-Hsuan Chan , Wan-Ting Chen , Yi-Chian Liao , Chun-Tang Lin , Yi-Chi Lai
IPC: H01L23/48 , H01L21/00 , H01L21/78 , H01L23/00 , H01L23/498
CPC classification number: H01L23/49811 , H01L21/486 , H01L21/78 , H01L23/147 , H01L23/49827 , H01L24/19 , H01L24/96 , H01L2224/04105 , H01L2924/351 , H01L2924/3511 , H01L2924/00
Abstract: A semiconductor package is provided, which includes: a semiconductor substrate having opposite first and second surfaces; an adhesive layer formed on the first surface of the semiconductor substrate; at least a semiconductor chip disposed on the adhesive layer; an encapsulant formed on the adhesive layer for encapsulating the semiconductor chip; and a plurality of conductive posts penetrating the first and second surfaces of the semiconductor substrate and the adhesive layer and electrically connected to the semiconductor chip, thereby effectively reducing the fabrication cost, shortening the fabrication time and improving the product reliability.
Abstract translation: 提供一种半导体封装,其包括:具有相反的第一和第二表面的半导体衬底; 形成在所述半导体衬底的第一表面上的粘合剂层; 至少设置在所述粘合剂层上的半导体芯片; 形成在用于封装半导体芯片的粘合剂层上的密封剂; 以及贯穿半导体衬底的第一和第二表面和粘合剂层并且电连接到半导体芯片的多个导电柱,从而有效地降低了制造成本,缩短了制造时间并提高了产品的可靠性。
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公开(公告)号:US20140084484A1
公开(公告)日:2014-03-27
申请号:US13922828
申请日:2013-06-20
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Mu-Hsuan Chan , Wan-Ting Chen , Chun-Tang Lin , Yi-Che Lai
IPC: H01L23/00
CPC classification number: H01L23/562 , H01L21/563 , H01L21/565 , H01L23/3114 , H01L24/97 , H01L2224/16225 , H01L2924/351 , H01L2924/00
Abstract: A semiconductor package is provided, which includes: a carrier; at least an interposer disposed on the carrier; an encapsulant formed on the carrier for encapsulating the interposer while exposing a top surface of the interposer; a redistribution layer formed on the encapsulant and the top surface of the interposer; and at least a semiconductor element disposed on the redistribution layer. The top surface of the interposer is flush with a surface of the encapsulant so as for the redistribution layer to have a planar surface for disposing the semiconductor element, thereby preventing warpage of the interposer and improving the reliability of electrical connection between the redistribution layer and the semiconductor element.
Abstract translation: 提供一种半导体封装,其包括:载体; 至少设置在所述载体上的插入件; 形成在所述载体上的密封剂,用于在暴露所述插入件的顶表面的同时封装所述插入件; 在所述密封剂和所述插入件的顶表面上形成的再分布层; 以及设置在再分布层上的至少一个半导体元件。 插入器的顶表面与密封剂的表面齐平,以使再分布层具有用于设置半导体元件的平坦表面,从而防止插入件的翘曲,并提高再分布层与第二层之间的电连接的可靠性 半导体元件。
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公开(公告)号:US20140084455A1
公开(公告)日:2014-03-27
申请号:US13722138
申请日:2012-12-20
Applicant: SILICONWARE PRECISION INDUSTRIES CO., LTD.
Inventor: Mu-Hsuan Chan , Wan-Ting Chen , Yi-Chian Liao , Chun-Tang Lin , Yi-Chi Lai
IPC: H01L23/498 , H01L21/78
CPC classification number: H01L23/49811 , H01L21/486 , H01L21/78 , H01L23/147 , H01L23/49827 , H01L24/19 , H01L24/96 , H01L2224/04105 , H01L2924/351 , H01L2924/3511 , H01L2924/00
Abstract: A semiconductor package is provided, which includes: a semiconductor substrate having opposite first and second surfaces; an adhesive layer formed on the first surface of the semiconductor substrate; at least a semiconductor chip disposed on the adhesive layer; an encapsulant formed on the adhesive layer for encapsulating the semiconductor chip; and a plurality of conductive posts penetrating the first and second surfaces of the semiconductor substrate and the adhesive layer and electrically connected to the semiconductor chip, thereby effectively reducing the fabrication cost, shortening the fabrication time and improving the product reliability.
Abstract translation: 提供一种半导体封装,其包括:具有相反的第一和第二表面的半导体衬底; 形成在所述半导体衬底的第一表面上的粘合剂层; 至少设置在所述粘合剂层上的半导体芯片; 形成在用于封装半导体芯片的粘合剂层上的密封剂; 以及贯穿半导体衬底的第一和第二表面和粘合剂层并且电连接到半导体芯片的多个导电柱,从而有效地降低了制造成本,缩短了制造时间并提高了产品的可靠性。
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公开(公告)号:US10403567B2
公开(公告)日:2019-09-03
申请号:US15866144
申请日:2018-01-09
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Yan-Heng Chen , Chun-Tang Lin , Mu-Hsuan Chan , Chieh-Yuan Chi
IPC: H01L21/48 , H01L23/498 , H01L23/538 , H01L23/00 , H01L25/10 , H01L25/00 , H01L21/56
Abstract: A method for fabricating an electronic package is provided, which includes the steps of: providing an insulating layer having at least an electronic element embedded therein; forming at least a first via hole on one side of the insulating layer; forming a first conductor in the first via hole of the insulating layer; forming on the insulating layer a first circuit structure electrically connected to the electronic element and the first conductor; and forming a second via hole on the other side of the insulating layer, wherein the second via hole communicates with the first via hole. As such, the second via hole and the first via hole constitute a through hole. Since the through hole is fabricated through two steps, the aspect ratio (depth/width) of the through hole can be adjusted according to the practical need so as to improve the process yield.
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公开(公告)号:US20180130727A1
公开(公告)日:2018-05-10
申请号:US15866144
申请日:2018-01-09
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Yan-Heng Chen , Chun-Tang Lin , Mu-Hsuan Chan , Chieh-Yuan Chi
IPC: H01L23/498 , H01L25/00 , H01L23/538 , H01L23/00 , H01L25/10 , H01L21/48 , H01L21/56
CPC classification number: H01L23/49811 , H01L21/486 , H01L21/568 , H01L23/5389 , H01L24/19 , H01L24/20 , H01L24/96 , H01L25/105 , H01L25/50 , H01L2224/04105 , H01L2224/12105 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/18162
Abstract: A method for fabricating an electronic package is provided, which includes the steps of: providing an insulating layer having at least an electronic element embedded therein; forming at least a first via hole on one side of the insulating layer; forming a first conductor in the first via hole of the insulating layer; forming on the insulating layer a first circuit structure electrically connected to the electronic element and the first conductor; and forming a second via hole on the other side of the insulating layer, wherein the second via hole communicates with the first via hole. As such, the second via hole and the first via hole constitute a through hole. Since the through hole is fabricated through two steps, the aspect ratio (depth/width) of the through hole can be adjusted according to the practical need so as to improve the process yield.
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公开(公告)号:US09768140B2
公开(公告)日:2017-09-19
申请号:US14515922
申请日:2014-10-16
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Yan-Heng Chen , Mu-Hsuan Chan , Chieh-Yuan Chi
IPC: H01L21/00 , H01L23/00 , H01L21/56 , H01L21/311 , H01L23/31
CPC classification number: H01L24/19 , H01L21/31144 , H01L21/561 , H01L21/568 , H01L23/3128 , H01L24/20 , H01L2224/04105 , H01L2224/12105 , H01L2225/1035 , H01L2924/37001
Abstract: A method for fabricating a package structure is provided, which includes the steps of: providing an encapsulant encapsulating at least an electronic element; forming a shaping layer on a surface of the encapsulant, wherein the shaping layer has at least an opening exposing a portion of the surface of the encapsulant; forming at least a through hole corresponding in position to the opening and penetrating the encapsulant; and forming a conductor in the through hole. The shaping layer facilitates to prevent deformation of the through hole.
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公开(公告)号:US09754898B2
公开(公告)日:2017-09-05
申请号:US13922828
申请日:2013-06-20
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Mu-Hsuan Chan , Wan-Ting Chen , Chun-Tang Lin , Yi-Che Lai
CPC classification number: H01L23/562 , H01L21/563 , H01L21/565 , H01L23/3114 , H01L24/97 , H01L2224/16225 , H01L2924/351 , H01L2924/00
Abstract: A semiconductor package is provided, which includes: a carrier; at least an interposer disposed on the carrier; an encapsulant formed on the carrier for encapsulating the interposer while exposing a top surface of the interposer; a redistribution layer formed on the encapsulant and the top surface of the interposer; and at least a semiconductor element disposed on the redistribution layer. The top surface of the interposer is flush with a surface of the encapsulant so as for the redistribution layer to have a planar surface for disposing the semiconductor element, thereby preventing warpage of the interposer and improving the reliability of electrical connection between the redistribution layer and the semiconductor element.
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公开(公告)号:US09337061B2
公开(公告)日:2016-05-10
申请号:US14151153
申请日:2014-01-09
Applicant: Siliconware Precision Industries Co., Ltd
Inventor: Yan-Heng Chen , Chun-Tang Lin , Mu-Hsuan Chan , Chieh-Yuan Chi , Yan-Yi Liao
CPC classification number: H01L21/52 , H01L21/561 , H01L21/568 , H01L21/78 , H01L24/19 , H01L24/96 , H01L2224/12105 , H01L2924/181 , H01L2924/3511 , H01L2924/00
Abstract: A fabrication method of a semiconductor package is disclosed, which includes the steps of: providing a carrier; disposing at least a semiconductor element on the carrier; forming an encapsulant on the carrier and the semiconductor element for encapsulating the semiconductor element; removing the carrier; disposing a pressure member on the encapsulant; and forming an RDL structure on the semiconductor element and the encapsulant, thereby suppressing internal stresses through the pressure member so as to mitigate warpage on edges of the encapsulant.
Abstract translation: 公开了一种半导体封装的制造方法,其包括以下步骤:提供载体; 在载体上设置至少一个半导体元件; 在所述载体和所述半导体元件上形成用于封装所述半导体元件的密封剂; 移除载体; 将压力构件设置在密封剂上; 以及在半导体元件和密封剂上形成RDL结构,由此抑制通过压力构件的内部应力,从而减轻密封剂边缘的翘曲。
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公开(公告)号:US20160049376A1
公开(公告)日:2016-02-18
申请号:US14515922
申请日:2014-10-16
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Yan-Heng Chen , Mu-Hsuan Chan , Chieh-Yuan Chi
IPC: H01L23/00 , H01L21/311 , H01L21/3205 , H01L21/768
CPC classification number: H01L24/19 , H01L21/31144 , H01L21/561 , H01L21/568 , H01L23/3128 , H01L24/20 , H01L2224/04105 , H01L2224/12105 , H01L2225/1035 , H01L2924/37001
Abstract: A method for fabricating a package structure is provided, which includes the steps of: providing an encapsulant encapsulating at least an electronic element; forming a shaping layer on a surface of the encapsulant, wherein the shaping layer has at least an opening exposing a portion of the surface of the encapsulant; forming at least a through hole corresponding in position to the opening and penetrating the encapsulant; and forming a conductor in the through hole. The shaping layer facilitates to prevent deformation of the through hole.
Abstract translation: 提供一种制造封装结构的方法,其包括以下步骤:提供封装至少一个电子元件的密封剂; 在所述密封剂的表面上形成成形层,其中所述成形层具有暴露所述密封剂表面的一部分的至少一个开口; 至少形成对应于所述开口的位置并穿透所述密封剂的通孔; 并在通孔中形成导体。 成形层有助于防止通孔的变形。
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