Impedance calibration circuit and semiconductor apparatus including the same

    公开(公告)号:US10164634B2

    公开(公告)日:2018-12-25

    申请号:US15920149

    申请日:2018-03-13

    Applicant: SK hynix Inc.

    Inventor: Yo Han Jeong

    Abstract: An impedance calibration circuit includes a first detection unit configured to generate a first pull-up impedance detection signal according to a resistance value of an internal reference resistor, a second detection unit configured to generate a second pull-up impedance detection signal according to a resistance value of an external reference resistor coupled to an external reference resistor pad, a switching unit configured to select the first pull-up impedance detection signal or the second pull-up impedance detection signal according to the internal impedance calibration enable signal and output the selected pull-up impedance detection signal, and an impedance calibration signal generation unit configured to generate a plurality of impedance calibration signals according to an output of the switching unit.

    Duty cycle detection circuit and duty cycle correction circuit including the same

    公开(公告)号:US11671076B2

    公开(公告)日:2023-06-06

    申请号:US17979583

    申请日:2022-11-02

    Applicant: SK hynix Inc.

    CPC classification number: H03K3/017 G11C7/222

    Abstract: Devices and methods for detecting and correcting duty cycles are described. An input switching unit is configured to perform at least one of an operation of outputting differential input signals as a first combination of first and second output signals and an operation of outputting the differential input signals as a second combination of the first and second output signals, according to one of a plurality of control signals. A comparator is configured to receive the first output signal through a first input terminal thereof, to receive the second output signal through a second input terminal thereof, to generate duty detection signals by comparing the signal of the first input terminal and the signal of the second input terminal according to at least another one of the plurality of control signals, and to adjust an offset of at least one of the first input terminal and the second input terminal.

    Impedance calibration circuit and semiconductor apparatus including the same

    公开(公告)号:US11190185B2

    公开(公告)日:2021-11-30

    申请号:US16900537

    申请日:2020-06-12

    Applicant: SK hynix Inc.

    Abstract: An impedance calibration circuit may include: a first driver having an impedance calibrated according to a first impedance control code, and configured to drive an output terminal according to first data; a second driver having an impedance calibrated according to a second impedance control code, and configured to drive the output terminal according to second data; and an impedance calibration circuit configured to calibrate the first impedance control code to a first target value set to a resistance value of an external resistor, and calibrate the second impedance control code to a second target value different from the resistance value of the external resistor.

    Semiconductor device and semiconductor system including the same

    公开(公告)号:US10964364B2

    公开(公告)日:2021-03-30

    申请号:US16806822

    申请日:2020-03-02

    Applicant: SK hynix Inc.

    Abstract: A semiconductor device includes a plurality of stacked dies electrically connected with each other. Each of the stacked dies includes a data path, a strobe path, a stack information generation circuit, and a delay control circuit. The data path transmits a data signal. The strobe path transmits a data strobe signal. The stack information generation circuit generates stack information representing a number of the dies. The delay control circuit controls a delay time of at least one of the data path and the strobe path based on the stack information.

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