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公开(公告)号:US11581263B2
公开(公告)日:2023-02-14
申请号:US17024852
申请日:2020-09-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim , Jungwoo Kim , Jihwang Kim , Jungsoo Byun , Jongbo Shim , Doohwan Lee , Kyoungsei Choi , Junggon Choi , Sungeun Pyo
IPC: H01L23/495 , H01L23/538 , H01L25/10
Abstract: A semiconductor package includes: a redistribution layer including a plurality of redistribution insulating layers, a plurality of redistribution line patterns that constitute lower wiring layers, and a plurality of redistribution vias that are connected to some of the plurality of redistribution line patterns while penetrating at least one of the plurality of redistribution insulating layers; at least one semiconductor chip arranged on the redistribution layer; an expanded layer surrounding the at least one semiconductor chip on the redistribution layer; and a cover wiring layer including at least one base insulating layer, a plurality of wiring patterns that constitute upper wiring layers, and a plurality of conductive vias that are connected to some of the plurality of wiring patterns while penetrating the at least one base insulating layer.
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公开(公告)号:US20240274579A1
公开(公告)日:2024-08-15
申请号:US18417264
申请日:2024-01-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim , Jongkook Kim
IPC: H01L25/065 , H01L23/00 , H01L23/31 , H01L23/48 , H01L23/498 , H01L23/538 , H01L25/10 , H10B80/00
CPC classification number: H01L25/0657 , H01L23/3135 , H01L23/481 , H01L23/49811 , H01L23/5383 , H01L24/08 , H01L24/16 , H01L24/32 , H01L25/105 , H10B80/00 , H01L2224/08145 , H01L2224/16145 , H01L2224/16227 , H01L2224/32225
Abstract: A semiconductor package includes a chip structure including a first stack semiconductor chip, which includes a first sub-chip and a second sub-chip that is bonded to the first sub-chip and is of a different type from the first sub-chip, a first molding layer configured to mold the second sub-chip on the first sub-chip, and a first redistribution structure arranged above the first stack semiconductor chip and the first molding layer, a second redistribution structure arranged under the chip structure and bonded to the chip structure, a bonding wire electrically connecting the second redistribution structure to the first redistribution structure, and a second molding layer configured to seal, on the second redistribution structure, the chip structure and the bonding wire.
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公开(公告)号:US20240153855A1
公开(公告)日:2024-05-09
申请号:US18361530
申请日:2023-07-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Choongbin Yim , Jiyong Park , Jinwoo Park
IPC: H01L23/498 , H01L23/00 , H01L25/065
CPC classification number: H01L23/49822 , H01L23/49816 , H01L24/16 , H01L24/32 , H01L24/48 , H01L25/0652 , H01L2224/16227 , H01L2224/32146 , H01L2224/48091 , H01L2224/48227 , H01L2225/1052 , H01L2225/1058 , H01L2924/1432 , H01L2924/1434 , H01L2924/1811
Abstract: A semiconductor package includes a first redistribution structure; a third redistribution structure electrically connected to the first redistribution structure; a first semiconductor chip disposed between the first redistribution structure and the third redistribution structure; a second semiconductor chip disposed between the first redistribution structure and the third redistribution structure; and a second redistribution structure disposed between the second semiconductor chip and the first redistribution structure, wherein the first semiconductor chip does not overlap the second redistribution structure in a direction in which the first redistribution structure and the third redistribution structure face each other.
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公开(公告)号:US20240088005A1
公开(公告)日:2024-03-14
申请号:US18297249
申请日:2023-04-07
Applicant: SAMSUNG ELECTRONICS CO., LTD
Inventor: Choongbin Yim , Gitae Park
IPC: H01L23/498 , H01L21/48 , H01L21/56 , H01L23/00 , H01L23/31 , H01L23/538 , H10B80/00
CPC classification number: H01L23/49827 , H01L21/4857 , H01L21/56 , H01L23/3128 , H01L23/49816 , H01L23/49822 , H01L23/5383 , H01L23/5385 , H01L24/16 , H01L24/81 , H10B80/00 , H01L24/32 , H01L24/33 , H01L24/48 , H01L24/73 , H01L2224/16227 , H01L2224/32145 , H01L2224/32225 , H01L2224/33181 , H01L2224/48145 , H01L2224/48227 , H01L2224/73204 , H01L2224/73215 , H01L2224/73265 , H01L2224/81
Abstract: A semiconductor package includes a first redistribution wiring layer including a first redistribution wiring, a semiconductor chip disposed on the first redistribution wiring layer, a plurality of interposer connectors disposed on the first redistribution wiring layer, each of the plurality of interposer connectors including a first surface facing the first redistribution wiring layer and a second surface opposite the first surface, a plurality of through electrodes and a plurality of core balls formed on the first surface and including a core and a solder layer, the through electrodes being electrically connected to the first redistribution wiring by the core balls, a molding member on the first redistribution wiring layer that covers the semiconductor chip, and a second redistribution wiring layer disposed on the molding member including a second redistribution wiring electrically connected to the through electrodes.
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公开(公告)号:US20230042622A1
公开(公告)日:2023-02-09
申请号:US17742819
申请日:2022-05-12
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim , Jihwang Kim , Jongbo Shim , Jinwoo Park
Abstract: A semiconductor package includes a first package substrate having a lower surface and an upper surface respectively including a plurality of first lower surface pads and a plurality of first upper surface pads, a second package substrate having a lower surface and an upper surface respectively including a plurality of second lower surface pads and a plurality of second upper surface pads, wherein the plurality of second upper surface pads comprise all of the upper surface pads at the upper surface of the second package substrate, a semiconductor chip provided between the first package substrate and the second package substrate and attached onto the first package substrate, and a plurality of metal core structures connecting some of the plurality of first upper surface pads to some of the plurality of second lower surface pads and not vertically overlapping any of the plurality of second upper surface pads, each metal core structure having a metal core.
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公开(公告)号:US20220352110A1
公开(公告)日:2022-11-03
申请号:US17577653
申请日:2022-01-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim , Jihwang Kim , Jongbo Shim
IPC: H01L23/00 , H01L23/498 , H01L25/10
Abstract: A semiconductor package structure includes a package substrate; a semiconductor chip on the package substrate and electrically connected to the package substrate; an interposer substrate above the package substrate and the semiconductor chip, wherein the interposer substrate includes a cavity recessed inward from a lower surface thereof, wherein the semiconductor chip is positioned within the cavity, at least from a plan view; and an adhesive layer positioned inside and outside the cavity, wherein the adhesive layer is formed on all of upper and side surfaces of the semiconductor chip, or on the side surfaces of the semiconductor chip.
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公开(公告)号:US11367688B2
公开(公告)日:2022-06-21
申请号:US17090502
申请日:2020-11-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Choongbin Yim , Jungwoo Kim , Jihwang Kim , Jongbo Shim , Kyoungsei Choi
IPC: H01L23/538 , H01L23/31 , H01L23/14
Abstract: A semiconductor package includes a first package substrate, a first semiconductor chip on the first package substrate, a molding layer covering side walls of the first semiconductor chip and including through holes, an interposer on the first semiconductor chip and the molding layer, conductive connectors in the through holes of the molding layer and connected to the first package substrate and the interposer, and an insulating filler including a first portion that fills the through holes of the molding layer so as to surround side walls of the conductive connectors.
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公开(公告)号:US09035308B2
公开(公告)日:2015-05-19
申请号:US14197203
申请日:2014-03-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim , Hyeongmun Kang , Taesung Park , Eunchul Ahn
IPC: H01L23/58 , G01R31/26 , H01L23/544 , H01L21/3105
CPC classification number: H01L23/544 , H01L21/3105 , H01L23/3114 , H01L23/3128 , H01L24/16 , H01L24/29 , H01L24/32 , H01L24/48 , H01L24/73 , H01L2223/54406 , H01L2223/54433 , H01L2223/54486 , H01L2224/12105 , H01L2224/16145 , H01L2224/16225 , H01L2224/2919 , H01L2224/32225 , H01L2224/48095 , H01L2224/48145 , H01L2224/48227 , H01L2224/73265 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2924/00014 , H01L2924/12042 , H01L2924/1434 , H01L2924/15311 , H01L2924/181 , H01L2924/00012 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: A semiconductor package, comprising: a semiconductor substrate; a mold layer on the semiconductor substrate; and a marking formed on a surface of the mold layer, the marking comprising dot markings substantially discontinuously arranged in vertical and horizontal directions of a display region. An effective area of the dot markings within a unit display region of the marking is smaller than about half a total area of the unit display region.
Abstract translation: 一种半导体封装,包括:半导体衬底; 半导体衬底上的模具层; 以及形成在所述模具层的表面上的标记,所述标记包括基本上不连续地布置在显示区域的垂直和水平方向上的点标记。 标记的单位显示区域内的点标记的有效面积小于单位显示区域的总面积的约一半。
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公开(公告)号:US20250087634A1
公开(公告)日:2025-03-13
申请号:US18630149
申请日:2024-04-09
Applicant: Samsung Electronics Co., Ltd.
Inventor: Choongbin Yim
Abstract: A semiconductor package may include a substrate, a semiconductor stacked structure on the substrate, with the semiconductor stacked structure including a logic die and a high-bandwidth memory on the logic die, one or more semiconductor dies on the substrate and arranged side by side with the semiconductor stacked structure, and one or more surface mount devices (SMD) on the semiconductor stacked structure.
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公开(公告)号:US20240404921A1
公开(公告)日:2024-12-05
申请号:US18439461
申请日:2024-02-12
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Choongbin Yim , Chengtar Wu
IPC: H01L23/482 , H01L23/00 , H01L23/498 , H01L25/065
Abstract: A semiconductor package includes: a redistribution layer structure; first semiconductor and second dies on the redistribution, the second semiconductor die positioned next to the first semiconductor die; core balls positioned on the redistribution structure and next to the first semiconductor chip die; a bridge die configured to electrically connect the first and second semiconductor dies to each other on the first and second semiconductor dies; a substrate including an upper plate portion and a sidewall portion, the upper plate portion and the sidewall portion defining a cavity, the upper plate portion positioned on the bridge die, the side wall portion positioned on the core balls, the bridge die positioned within the cavity; and a molding material configured to mold the first semiconductor die, the second semiconductor die, the core balls, and the bridge die between the redistribution layer structure and the substrate.
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