COMPUTING DEVICE AND METHOD FOR DETECTING LIGHTNESS OF LIGHTING DEVICE
    12.
    发明申请
    COMPUTING DEVICE AND METHOD FOR DETECTING LIGHTNESS OF LIGHTING DEVICE 有权
    用于检测照明装置的光的计算装置和方法

    公开(公告)号:US20160127662A1

    公开(公告)日:2016-05-05

    申请号:US14589628

    申请日:2015-01-05

    CPC classification number: G01J1/44 G01J1/0228 G01J1/4228 G01J2001/4252

    Abstract: A computing device and a method detect a lightness of a lighting device. The computing device captures an image of the lighting device and parses the image to obtain a pixel gray value of each lighting dot of the lighting device. The computing device obtains detection information of the lighting device according to the pixel gray value of each lighting dot of the lighting device. The computing device generates a detection report of the lighting device according to the detection information of the lighting device.

    Abstract translation: 计算装置和方法来检测照明装置的亮度。 计算设备捕获照明设备的图像并解析图像以获得照明设备的每个照明点的像素灰度值。 计算装置根据照明装置的各点的像素灰度值取得照明装置的检测信息。 计算装置根据照明装置的检测信息生成照明装置的检测报告。

    Method and apparatus for testing light-emitting device
    13.
    发明授权
    Method and apparatus for testing light-emitting device 有权
    用于测试发光器件的方法和装置

    公开(公告)号:US09316687B2

    公开(公告)日:2016-04-19

    申请号:US14187194

    申请日:2014-02-21

    Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing a light-emitting device comprising a plurality of light-emitting diodes; driving the plurality of the light-emitting diodes with a current; generating an image of the light-emitting device; and determining a luminous intensity of each of the light-emitting diodes; wherein the magnitude of the current is determined such that the current density driving each of the light-emitting diodes is smaller than or equal to 300 mA/mm2.

    Abstract translation: 公开了一种用于测试发光器件的方法,包括以下步骤:提供包括多个发光二极管的发光器件; 用电流驱动多个发光二极管; 产生发光装置的图像; 以及确定每个所述发光二极管的发光强度; 其中确定电流的大小使得驱动每个发光二极管的电流密度小于或等于300mA / mm2。

    Illumination Device and Method for Calibrating and Controlling an Illumination Device Comprising a Phosphor Converted LED
    14.
    发明申请
    Illumination Device and Method for Calibrating and Controlling an Illumination Device Comprising a Phosphor Converted LED 有权
    用于校准和控制包含磷光体转换LED的照明装置的照明装置和方法

    公开(公告)号:US20150382425A1

    公开(公告)日:2015-12-31

    申请号:US14314556

    申请日:2014-06-25

    Applicant: Ketra, Inc.

    Abstract: An illumination device described herein includes at least a phosphor converted LED, which is configured for emitting illumination for the illumination device, a first photodetector and a second photodetector. A spectrum of the illumination emitted from the phosphor converted LED comprises a first portion having a first peak emission wavelength and a second portion having a second peak emission wavelength, which differs from the first peak emission wavelength. The first photodetector has a detection range, which is configured for detecting only the first portion of the spectrum emitted by the phosphor converted LED. The second photodetector has a detection range, which is configured for detecting only the second portion of the spectrum emitted by the phosphor converted LED. Methods are provided herein for calibrating and controlling each portion of the phosphor converted LED spectrum, as if the phosphor converted LED were two separate LEDs.

    Abstract translation: 本文所述的照明装置至少包括被配置为发射用于照明装置的照明的磷光体转换LED,第一光电检测器和第二光电检测器。 从磷光体转换的LED发射的照明的光谱包括具有第一峰值发射波长的第一部分和具有与第一峰值发射波长不同的第二峰值发射波长的第二部分。 第一光检测器具有检测范围,该检测范围被配置为仅检测由磷光体转换的LED发射的光谱的第一部分。 第二光电检测器具有检测范围,该检测范围被配置为仅检测由磷光体转换的LED发射的光谱的第二部分。 本文提供了用于校准和控制磷光体转换的LED光谱的每个部分的方法,如同磷光体转换的LED是两个分离的LED。

    LED TESTING PROCESS AND CORRECTION METHODS THEREFOR
    15.
    发明申请
    LED TESTING PROCESS AND CORRECTION METHODS THEREFOR 有权
    LED测试过程及其校正方法

    公开(公告)号:US20150198480A1

    公开(公告)日:2015-07-16

    申请号:US14587332

    申请日:2014-12-31

    Abstract: Disclosed is a method of generating a correction function for a light-emitting diode (LED) testing process. The method comprises the steps of: detecting light emitted by a reference LED and reflected from one or more inactive LEDs on a panel within a field of view of a detector, a number of said inactive LEDs within the field of view being varied such that uncorrected values of at least one optical parameter are derivable as a function of the number of inactive LEDs in the field of view; detecting light emitted by the reference LED, or by an active LED having identical optical properties to the reference LED, in the absence of any other LEDs, to determine at least one reference value for the or each said optical parameter; and calculating differences between the uncorrected values and the or each reference value to generate the correction function, the correction function being based on the number of inactive LEDs which are arranged within the field of view of the detector when the detector detects light emitted by an LED under test.

    Abstract translation: 公开了一种产生用于发光二极管(LED)测试过程的校正功能的方法。 该方法包括以下步骤:检测由参考LED发射并由检测器的视野内的面板上的一个或多个不活动的LED反射的光,视场内的所述非活动LED的数量是变化的,使得未校正 至少一个光学参数的值可以作为视野中的非活动LED的数量的函数导出; 在没有任何其他LED的情况下,检测由参考LED发射的光,或者通过与参考LED具有相同光学特性的有源LED,以确定所述光学参数或每个所述光学参数的至少一个参考值; 以及计算所述未校正值和所述或每个参考值之间的差异以产生所述校正功能,所述校正功能基于当所述检测器检测到由所述LED发射的光时,所述校正功能基于被布置在所述检测器的视场内的非活动LED的数量 被测试。

    Light Collection Optics for Measuring Flux and Spectrum from Light-Emitting Devices
    16.
    发明申请
    Light Collection Optics for Measuring Flux and Spectrum from Light-Emitting Devices 有权
    用于测量发光器件的通量和光谱的光收集光学

    公开(公告)号:US20150124253A1

    公开(公告)日:2015-05-07

    申请号:US14527034

    申请日:2014-10-29

    Abstract: Systems and methods for accurately measuring the luminous flux and color (spectra) from light-emitting devices are disclosed. An integrating sphere may be utilized to directly receive a first portion of light emitted by a light-emitting device through an opening defined on the integrating sphere. A light collector may be utilized to collect a second portion of light emitted by the light-emitting device and direct the second portion of light into the integrating sphere through the opening defined on the integrating sphere. A spectrometer may be utilized to measure at least one property of the first portion and the second portion of light received by the integrating sphere.

    Abstract translation: 公开了用于准确测量发光器件的光通量和颜色(光谱)的系统和方法。 可以使用积分球直接接收由发光装置通过限定在积分球上的开口发射的光的第一部分。 可以利用光收集器来收集由发光装置发射的光的第二部分,并将第二部分的光通过限定在积分球上的开口引导到积分球。 可以使用光谱仪来测量由积分球接收的第一部分和第二部分光的至少一个性质。

    STANDARD LIGHT SOURCE AND MEASUREMENT METHOD
    19.
    发明申请
    STANDARD LIGHT SOURCE AND MEASUREMENT METHOD 有权
    标准光源和测量方法

    公开(公告)号:US20140224970A1

    公开(公告)日:2014-08-14

    申请号:US14161690

    申请日:2014-01-23

    Inventor: Kazuaki OHKUBO

    CPC classification number: G01J1/08 G01J1/42 G01J2001/061 G01J2001/4252

    Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.

    Abstract translation: 具有更简化结构的新型标准光源,其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量,以及使用该标准光源的测量方法 提供。 标准光源包括发光部分,电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分,用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。

    Method and apparatus for testing light-emitting device
    20.
    发明授权
    Method and apparatus for testing light-emitting device 有权
    用于测试发光器件的方法和装置

    公开(公告)号:US08687181B2

    公开(公告)日:2014-04-01

    申请号:US13365820

    申请日:2012-02-03

    Abstract: Disclosed is a method for testing a light-emitting device comprising the steps of: providing a light-emitting device comprising a plurality of light-emitting diodes; driving the plurality of the light-emitting diodes with current; generating an image of the light-emitting device; and determining a luminous intensity of each of the light-emitting diodes with the image. An apparatus for testing a light-emitting device comprising a plurality of light-emitting diodes is also disclosed. The apparatus comprises: a current source to provide a current to drive the plurality of the light-emitting diodes; an image receiving device for receiving an image of the light-emitting device in the driven state; and a processing unit for determining a luminous intensity of each of the light-emitting diodes with the image.

    Abstract translation: 公开了一种用于测试发光器件的方法,包括以下步骤:提供包括多个发光二极管的发光器件; 用电流驱动多个发光二极管; 产生发光装置的图像; 以及用图像确定每个发光二极管的发光强度。 还公开了一种用于测试包括多个发光二极管的发光器件的装置。 该装置包括:电流源,用于提供驱动多个发光二极管的电流; 图像接收装置,用于接收驱动状态下的发光装置的图像; 以及处理单元,用于利用图像确定每个发光二极管的发光强度。

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