Abstract:
A method includes, in a memory controller that controls a memory, receiving from a host a read command that specifies data to be retrieved from the memory and further specifies a target error performance to be achieved in retrieving the data. A data retrieval configuration is selected in the memory controller depending on the target error performance specified in the read command. The data is retrieved from the memory using the selected data retrieval configuration, and the retrieved data is output to the host.
Abstract:
A method includes, in a memory controller that controls a memory, receiving from a host a read command that specifies data to be retrieved from the memory and further specifies a target error performance to be achieved in retrieving the data. A data retrieval configuration is selected in the memory controller depending on the target error performance specified in the read command. The data is retrieved from the memory using the selected data retrieval configuration, and the retrieved data is output to the host.
Abstract:
An apparatus includes a memory and storage circuitry. The storage circuitry is configured to receive at least one request causing execution of a sequence of memory commands in the memory, to identify that, although a first memory command appears in the sequence before a second memory command, the execution of the second memory command would improve a performance of the execution of the first memory command, and to execute the second memory command and then to execute the first memory command with the improved execution performance.
Abstract:
A storage apparatus includes a plurality of memory cells and storage circuitry. The storage circuitry is configured to store a mapping that maps sets of readout bit-flip counts to respective predefined impairment profiles. The impairment profiles specify two or more severity levels of respective impairment types, including read disturb, retention and endurance. Each of the bit-flip counts includes a one-to-zero error count or a zero-to-one error count. The storage circuitry is configured to read data from a group of the memory cells using given readout parameters, to evaluate an actual set of bit-flip counts corresponding to the read data, to classify the group of the memory cells to a respective impairment profile by mapping the actual set of the bit-flip counts using the mapping, and to adapt the readout parameters based on the impairment profile to which the group of the memory cells was classified.
Abstract:
A memory system includes an interface and storage circuitry. The interface is configured to communicate with a plurality of memory cells that store data by setting the memory cells to analog voltages representative of respective storage values. The storage circuitry is configured to receive data for storage, to measure a temperature at a time of programming the received data, and, to program the received data to the memory cells using a first programming scheme when the measured temperature falls within a predefined normal temperature range, and otherwise to program the received data to the memory cells using a second programming scheme having a lower net storage utilization than the first programming scheme.
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract:
A method for data storage includes accepting data for storage in an array of memory cells, which are arranged in rows associated with respective word lines. Data is stored in one or more memory cells of the array using one or more programming levels. In response to a determination that a first memory cell of the one or more memory cells is subject to distortion, a second memory cell may be programmed to a predetermined programming level.
Abstract:
A method for data storage includes receiving in a memory device data for storage in a group of memory cells. The data is stored in the group by performing a Program and Verify (P&V) process, which applies to the memory cells in the group a sequence of programming pulses and compares respective analog values of the memory cells in the group to respective verification thresholds. Immediately following successful completion of the P&V process, a mismatch between the stored data and the received data is detected in the memory device. An error in storage of the data is reported responsively to the mismatch.
Abstract:
A method includes defining a normal voltage configuration for application to word lines (WLs) and Bit lines (BLs) of a memory block, and a an abnormal voltage configuration, different from the normal voltage configuration, for application to the WLs and the BLs of the memory block when a word-line-to-word-line (WL-WL) short-circuit is found between at least two of the WLs in the memory block. If no WL-WL short-circuit is found in the memory block, a data storage operation is performed in the memory block by applying the normal voltage configuration. If a WL-WL short-circuit is found in the memory block, the data storage operation is performed in the memory block by applying the abnormal voltage configuration.
Abstract:
A method in a non-volatile memory, which includes multiple memory cells that store data using a predefined set of programming levels including an erased level, includes receiving a storage operation indicating a group of the memory cells that are to be retained without programming for a long time period. The memory cells in the group are set to a retention programming level that is different from the erased level. Upon preparing to program the group of memory cells with data, the group of memory cells is erased to the erased level and the data is then programmed in the group of memory cells.