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公开(公告)号:US10428271B2
公开(公告)日:2019-10-01
申请号:US14914418
申请日:2014-08-28
Applicant: Entegris, Inc.
Inventor: Emanuel I. Cooper , Li-Min Chen , Steven Lippy , Chia-Jung Hsu , Sheng-hung Tu , Chieh Ju Wang
IPC: C09K13/00 , C09K13/06 , H01L21/311 , H01L21/3213
Abstract: Compositions useful for the selective removal of titanium nitride and/or photoresist etch residue materials relative to insulating materials from a microelectronic device having same thereon. The removal compositions contain at least one oxidant, one etchant, and one activator to enhance the etch rate of titanium nitride.
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公开(公告)号:US10392560B2
公开(公告)日:2019-08-27
申请号:US15407850
申请日:2017-01-17
Applicant: ENTEGRIS, INC.
Inventor: Jeffrey A. Barnes , Emanuel I. Cooper , Li-Min Chen , Steven Lippy , Rekha Rajaram , Sheng-Hung Tu
IPC: C09K13/10 , H01L21/3213 , C09K13/00 , C09K13/06 , C09K13/08 , C23F1/02 , C23F1/30 , C23F1/40 , H01L21/02 , C11D11/00 , C11D7/02 , C11D7/08 , C11D7/32 , H01L21/311
Abstract: Compositions useful for the selective removal of titanium nitride and/or photoresist etch residue materials relative to metal conducting, e.g., tungsten, and insulating materials from a microelectronic device having same thereon. The removal compositions contain at least one oxidant and one etchant, may contain various corrosion inhibitors to ensure selectivity.
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公开(公告)号:US10347504B2
公开(公告)日:2019-07-09
申请号:US15892775
申请日:2018-02-09
Applicant: Entegris, Inc.
Inventor: Steven Bilodeau , Emanuel I. Cooper , Jaeseok Lee , WonLae Kim , Jeffrey A. Barnes
IPC: H01L21/311 , G03F7/42 , H01L21/02 , H01L21/027
Abstract: A method and composition for removing bulk and/or ion-implanted resist material from microelectronic devices have been developed. The compositions effectively remove the ion-implanted resist material while not damaging the silicon-containing or germanium-containing materials.
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公开(公告)号:US20180204764A1
公开(公告)日:2018-07-19
申请号:US15873531
申请日:2018-01-17
Applicant: Entegris, Inc.
Inventor: Emanuel I. Cooper , Makonnen Payne , WonLae Kim , Eric Hong , Sheng-Hung Tu , Chieh Ju Wang , Chia-Jung Hsu
IPC: H01L21/768 , H01L21/02 , B08B7/00
Abstract: The disclosure relates to a cleaning composition that aids in the removal of post-etch residues and aluminum-containing material, e.g., aluminum oxide, in the production of semiconductors that utilize an aluminum-containing etch stop layer. The compositions have a high selectivity for post-etch residue and aluminum-containing materials relative to low-k dielectric materials, cobalt-containing materials and other metals on the microelectronic device.
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公开(公告)号:US09929014B2
公开(公告)日:2018-03-27
申请号:US15037940
申请日:2014-11-22
Applicant: Entegris, Inc.
Inventor: Thomas M. Cameron , Emanuel I. Cooper , Sung Han
IPC: H01L21/22 , H01L21/225 , H01L21/228
CPC classification number: H01L21/2225 , H01L21/2254 , H01L21/228
Abstract: A doping process is described, which includes applying to a substrate a film of dopant material that bonds to the substrate by at least one of hydrogen bonding and covalent bonding; encapsulating the film on the substrate with an encapsulant material, and subjecting the encapsulated film to rapid thermal processing to cause dopant from the dopant material to migrate into the substrate. The film of dopant material is applied from a dopant composition selected from among: (i) dopant compositions comprising an aqueous or glycol solution comprising an inorganic dopant compound; (ii) dopant compositions comprising an arsenic, phosphorus, boron, or antimony compound in which ligands or moieties coordinated to an arsenic, phosphorus, boron, or antimony central atom have coordination bond energies that are lower than those associated with coordinating bonds of said central atom to oxygen or carbon; (iii) dopant compositions comprising a coordinated moiety that selectively and covalently bonds to the substrate; (iv) dopant compositions comprising a compound that undergoes hydrolysis and alcoholysis to covalently bond a dopant functionality to the substrate in said film of dopant material; (v) dopant compositions comprising precursor vapor of an organodopant compound; (vi) dopant compositions interactive with a surface functionality of the substrate to bind the dopant composition to the substrate, wherein the substrate comprises a silicon surface comprising said surface functionality; (vii) dopant compositions interactive with the substrate to covalently bond with a pretreated and/or modified silicon surface thereof; and (viii) dopant compositions interactive with the substrate to bond with the substrate on a silicon surface thereof that has been modified by a treatment comprising at least one of: (A) contacting the silicon surface with a chemical solution; (B) exposing the silicon surface to plasma; and (C) exposing the silicon surface to ultraviolet radiation.
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公开(公告)号:US20230030323A1
公开(公告)日:2023-02-02
申请号:US17949956
申请日:2022-09-21
Applicant: ENTEGRIS, INC.
Inventor: Atanu K. Das , Daniela White , Emanuel I. Cooper , Eric Hong , JeongYeol Yang , Juhee Yeo , Michael L. White , SeongJin Hong , SeungHyun Chae , Steven A. Lippy , WonLae Kim
IPC: C23F1/38 , H01L21/3213
Abstract: An etchant composition and method for etching molybdenum from a microelectronic device at an etch rate are described. A microelectronic device is contacted with an etchant composition for a time sufficient to at least partially remove the molybdenum. The etchant composition comprises at least one oxidizing agent, at least one oxidizing agent stabilizer, and at least one base and has a pH of from 7.5 to 13. The etchant composition selectively removes molybdenum at an etch rate of 5-200 Å/min.
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公开(公告)号:US11492709B2
公开(公告)日:2022-11-08
申请号:US17230633
申请日:2021-04-14
Applicant: ENTEGRIS, INC.
Inventor: Atanu K. Das , Daniela White , Emanuel I. Cooper , Eric Hong , JeongYeol Yang , Juhee Yeo , Michael L. White , SeongJin Hong , SeungHyun Chae , Steven A. Lippy , WonLae Kim
IPC: C23F1/38 , H01L21/3213
Abstract: An etchant composition and method for etching molybdenum from a microelectronic device at an etch rate are described. A microelectronic device is contacted with an etchant composition for a time sufficient to at least partially remove the molybdenum. The etchant composition comprises at least one oxidizing agent, at least one oxidizing agent stabilizer, and at least one base and has a pH of from 7.5 to 13. The etchant composition selectively removes molybdenum at an etch rate of 5-200 Å/min.
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公开(公告)号:US20220275276A1
公开(公告)日:2022-09-01
申请号:US17747731
申请日:2022-05-18
Applicant: ENTEGRIS, INC.
Inventor: YoungMin Kim , Michael White , Daniela White , Emanuel I. Cooper , Steven M. Bilodeau
IPC: C09K13/06 , H01L21/311 , H01J37/32
Abstract: The invention provides a composition and method for improving the selectivity of nitride etching versus oxide etching and can be used with conventional phosphoric acid wet etch compositions. The invention describes additives that serve to inhibit silicon, oxides, and related compounds regrowth (i.e., redeposition) on the silicon oxide surface. In certain embodiments, the invention provides certain amino-substituted aryl compounds which are bound to a tri-alkoxy silane.
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公开(公告)号:US11346008B2
公开(公告)日:2022-05-31
申请号:US16692834
申请日:2019-11-22
Applicant: ENTEGRIS, INC.
Inventor: Steven Lippy , Emanuel I. Cooper
Abstract: The invention provides compositions useful for selectively etching ruthenium and/or copper. The compositions comprise certain periodate compounds, alkylammonium or alkylphosphonium hydroxides, carbonate or bicarbonate buffers, and water, wherein the pH of the composition is about 9 to about 12.5. The compositions of the invention are effectively utilized in the method of the invention and have been found to be capable of etching Cu and Ru at similar rates, i.e., >20 Å/min, while minimizing etch rates of dielectrics (
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公开(公告)号:US11053440B2
公开(公告)日:2021-07-06
申请号:US16681449
申请日:2019-11-12
Applicant: ENTEGRIS, INC.
Inventor: Steven M. Bilodeau , SeongJin Hong , Hsing-Chen Wu , Min-Chieh Yang , Emanuel I. Cooper
IPC: C09K13/06 , H01L21/311
Abstract: Compositions useful for the selective removal of silicon nitride materials relative to polysilicon, silicon oxide materials and/or silicide materials from a microelectronic device having same thereon are provided. The compositions of the invention are particularly useful in the etching of 3D NAND structures.
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