MRAM WITH HIGH-ASPECT RATIO BOTTOM ELECTRODE
    21.
    发明申请

    公开(公告)号:US20200220068A1

    公开(公告)日:2020-07-09

    申请号:US16240317

    申请日:2019-01-04

    IPC分类号: H01L43/02 H01L43/12 H01L27/22

    摘要: An ultra-small diameter and a tall bottom electrode for use in magnetic random access memory (MRAM) devices containing a multilayered MTJ pillar is provided. The bottom electrode is formed by depositing a thick bottom electrode layer on a surface of a metallic etch stop layer. The bottom electrode layer is then patterned by lithography and etching to provide a bottom electrode structure. An angled ion beam etch is thereafter used to trim the bottom electrode structure into a bottom electrode having a high aspect ratio (on the order of 10:1 or greater).