Abstract:
In an embodiment, the column decoder of a PCM device is divided into two portions that can be governed independently of one another, and the driving signals of the two portions are configured so as to guarantee comparable capacitive loads at the two inputs of a sense amplifier in both of the operations of single-ended reading and double-ended reading. In particular, during single-ended reading, the sense amplifier has a first input that receives a capacitive load corresponding to the direct memory cell selected, and a second input that receives a capacitive load associated to a non-selected complementary memory cell.
Abstract:
In an embodiment, the column decoder of a PCM device is divided into two portions that can be governed independently of one another, and the driving signals of the two portions are configured so as to guarantee comparable capacitive loads at the two inputs of a sense amplifier in both of the operations of single-ended reading and double-ended reading. In particular, during single-ended reading, the sense amplifier has a first input that receives a capacitive load corresponding to the direct memory cell selected, and a second input that receives a capacitive load associated to a non-selected complementary memory cell.
Abstract:
A level shifter circuit is designed to shift an input signal that switches within a first voltage range to supply an output signal that switches within a second voltage range, higher than the first voltage range. A first inverter stage has an input receiving the input signal and also has an output. A first capacitive element is connected between the output of the first input inverter stage and a first holding node. A latch stage is connected between the first holding node and a second holding node that is coupled to an output terminal, on which the output signal is present. The first input inverter stage is designed to operate in the first voltage range, and the latch stage is designed to operate in the second voltage range.
Abstract:
A phase change memory device includes two portions with local bitlines connected to memory cells. A reading stage is configured to read logic data stored by the first and second memory cells. A first main bitline extends between the reading stage and the first local bitlines and a first main switch is coupled between the first main bitline and reading stage and likewise for the second portion. Local switches are associated with respective ones of the local bitlines. A first reference signal generator is coupled to the reading stage. The phase change memory device is configured to operate in a first reading mode, in which the logic data stored by the first memory cell is read by the reading stage by comparison with the reference signal.
Abstract:
A row decoder circuit for a phase change non-volatile memory device may include memory cells arranged in a wordlines. The device may be configured to receive a first supply voltage and a second supply voltage higher than the first supply voltage. The row decoder may include a global predecoding stage configured to receive address signals and generate high-voltage decoded address signals in a range of the second supply voltage and a biasing signal with a value based upon an operation. The row decoder may include a row decoder stage coupled to the global predecoding stage. The row decoder stage may include a selection driving unit configured to generate block-address signals based upon the high-voltage decoded address signals and a row-driving unit configured to generate a row-driving signal for biasing the wordlines based upon the block-address signals and the biasing signal.
Abstract:
An embodiment voltage generation circuit, for a memory having a memory array with a plurality of memory cells coupled to respective wordlines and local bit-lines, each having a storage element and selector element, a bipolar transistor being coupled to the storage element for selective flow of a cell current during reading or verifying operations, and a base terminal of the selector element being coupled to a respective wordline; associated to each bit-line is a biasing transistor having a control terminal, and the circuit generates a cascode voltage for this control terminal; a driver stage is coupled to one end of each wordline. The circuit generates the cascode voltage based on a reference voltage, which is a function of the emulation of a voltage drop on the driver stage, on the wordline, and on the memory cell as a result of a current associated to the corresponding selector element.
Abstract:
A non-volatile memory device including an array of memory cells coupled to word lines and a row decoder, which includes a first and a second pull-down stage, which are arranged on opposite sides of the array, and include, respectively, for each word line, a corresponding first pull-down switching circuit and a corresponding second pull-down switching circuit, which are coupled to a first point and a second point, respectively, of the first word line. The row decoder moreover comprises a pull-up stage, which includes, for each word line, a corresponding pull-up switching circuit, which can be electronically controlled in order to: couple the first point to a supply node in the step of deselection of the word line; and decouple the first point from the supply node in the step of selection of the word line.
Abstract:
A level shifter circuit configured to shift an input signal switching within a first voltage range to generate a first output signal correspondingly switching within a second voltage range higher than the first voltage range. The level shifter circuit including a latching core having latching input and output terminals and a supply line configured to be supplied by a supply voltage, and a reference line configured to be coupled to a reference voltage. Capacitive coupling elements are coupled to the latching input and output terminals of the latching core. A driving stage is configured to bias the capacitive coupling elements with biasing signals generated based on the input signal. A decoupling stage is configured to be driven by the driving stage through the capacitive coupling elements to decouple the supply line from the supply voltage and the reference line from the reference voltage during switching of the input signal.
Abstract:
A level shifter circuit configured to shift an input signal switching within a first voltage range to generate a first output signal correspondingly switching within a second voltage range higher than the first voltage range. The level shifter circuit including a latching core having latching input and output terminals and a supply line configured to be supplied by a supply voltage, and a reference line configured to be coupled to a reference voltage. Capacitive coupling elements are coupled to the latching input and output terminals of the latching core. A driving stage is configured to bias the capacitive coupling elements with biasing signals generated based on the input signal. A decoupling stage is configured to be driven by the driving stage through the capacitive coupling elements to decouple the supply line from the supply voltage and the reference line from the reference voltage during switching of the input signal.
Abstract:
An address decoder circuit is designed to address and bias memory cells of a memory array of a non-volatile memory device. The address decoder circuit includes a charge-pump stage configured to generate a boosted negative voltage. A control stage is operatively coupled to the charge-pump stage for controlling switching on/off thereof as a function of a configuration signal that determines the value of the boosted negative voltage. A decoding stage is configured so as to decode address signals received at its input and generate biasing signals for addressing and biasing the memory cells. A negative voltage management module has a regulator stage, designed to receive the boosted negative voltage from the charge-pump stage and generate a regulated negative voltage for the decoding stage, having a lower ripple as compared to the boosted negative voltage generated by the charge-pump stage.