Apparatus and method for controlling power

    公开(公告)号:US10651668B2

    公开(公告)日:2020-05-12

    申请号:US15056296

    申请日:2016-02-29

    摘要: A power control method and an electronic device and/or connecting unit to implement the power control method is provided. The electronic device includes a first interface unit configured to be connected to an external device that can receive and provide power to the electronic device, a second interface unit configured to be connected to an external charger that can provide power for the external device and the electronic device, and a main controller configured to detect whether or not the external charger is connected, and receive and direct power from the external device or the external charger according to whether or not the external charger is connected.

    Display device and method of manufacturing light emitting device

    公开(公告)号:US12087879B2

    公开(公告)日:2024-09-10

    申请号:US18303423

    申请日:2023-04-19

    摘要: Disclosed are a display device and a manufacturing method thereof. The display device includes a plurality of pixels, a light emitting device provided in each of the plurality of pixels, the light emitting device having a first surface and a second surface, which are opposite to each other, a first electrode electrically connected to the first surface of the light emitting device, a second electrode electrically connected to the second surface of the light emitting device, and a metal oxide pattern interposed between the second surface of the light emitting device and the second electrode. The metal oxide pattern is provided to cover a portion of the second surface and to expose a remaining portion of the second surface. The second electrode is electrically connected to the exposed remaining portion of the second surface, and the metal oxide pattern includes single-crystalline or polycrystalline alumina.

    SEMICONDUCTOR MEMORY DEVICES AND METHOD OF MANUFACTURING THE SAME

    公开(公告)号:US20240147692A1

    公开(公告)日:2024-05-02

    申请号:US18496211

    申请日:2023-10-27

    发明人: Seungmin Lee

    IPC分类号: H10B12/00

    CPC分类号: H10B12/20 H10B12/01 H10B12/50

    摘要: A semiconductor memory device of the present invention is capable of high performance and high integration, and has an effect of configuring a semiconductor die including a vertical volatile memory structure and a vertical nonvolatile memory structure on one peripheral circuit structure. A semiconductor memory device provided includes a semiconductor substrate, a back gate structure having a cylindrical shape and extending in a vertical direction on the semiconductor substrate and including a back gate electrode layer and a back gate insulating layer surrounding the back gate electrode layer, a plurality of semiconductor patterns, each having a ring-shaped horizontal section surrounding the back gate structure, and spaced apart from each other in the vertical direction, and first to third conductive lines surrounding one of the plurality of semiconductor patterns and spaced apart from each other in the vertical direction.

    SEMICONDUCTOR DEVICE
    27.
    发明公开

    公开(公告)号:US20230363157A1

    公开(公告)日:2023-11-09

    申请号:US18352182

    申请日:2023-07-13

    IPC分类号: H10B43/40 H10B43/20 H10B43/30

    CPC分类号: H10B43/20 H10B43/30 H10B43/40

    摘要: A semiconductor device includes a lower structure; a first upper structure including lower gate layers on the lower structure; a second upper structure including upper gate layers on the first upper structure; separation structures penetrating the first and second upper structures on the lower structure; a memory vertical structure penetrating the lower and upper gate layers between the separation structures; and a first contact plug penetrating the first and second upper structures and spaced apart from the lower and upper gate layers. Each of the first contact plug and the memory vertical structure includes a lateral surface having a bent portion. The bent portion of the lateral surface is disposed between a first height level on which an uppermost gate layer of the lower gate layers is disposed and a second height level on which a lowermost gate layer of the upper gate layers is disposed.